Abstract: A circuit includes: first analog-to-digital converters (ADCs) configured to be coupled to respective ones of first sensors; a first multiplexer (MUX) coupled to output terminals of the first ADCs; a second MUX configured to be coupled to second sensors which are redundant sensors for the first sensors; a second ADC coupled to an output terminal of the second MUX, the first MUX and the second MUX being controlled by a selection signal; a first checker circuit configured to compare a first data at an output terminal of the first MUX with a second data at an output terminal of the second ADC; and a plurality of switches coupled between respective ones of the input terminals of the second MUX and a reference voltage node.