Patents by Inventor Luis M. Casas

Luis M. Casas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for measuring thin film thickness
    Patent number: 5443684
    Abstract: To provide a method of measuring thin film thicknesses that is a simple, ck method for determining the thickness of layers as thin as 1-2 nm which, although destructive, consumes very little material.
    Type: Grant
    Filed: February 28, 1994
    Date of Patent: August 22, 1995
    Assignee: The United States of America as represented by the Secretary of the Army
    Inventors: Donald W. Eckart, Luis M. Casas, Richard T. Lareau