Abstract: Disclosed, is a sample preparation apparatus which is configured to prepare a material sample suitable for X-ray diffraction. The apparatus comprises a dished sample holder bottom configured to fit within an annular sample holder. The dished sample holder bottom has a concave dished surface which is adapted to distribute sample material under pressing forces. A method of preparing a material sample suitable for X-ray diffraction is also disclosed. The method comprises dosing a dished sample holder bottom which is configured to fit within an annular sample holder with sample material, wherein the dished sample holder bottom preferably has a concave dished surface which is adapted to distribute sample material under pressing forces.

Abstract: Disclosed, is a sample preparation apparatus (6B) which is configured to prepare a material sample (900?) suitable for X-ray diffraction. The apparatus (6B) comprises a dished sample holder bottom (500) configured to fit within an annular sample holder (400). The dished sample holder bottom (500) has a concave dished surface (501) which is adapted to distribute sample material (900) under pressing forces. A method of preparing a material sample (900?) suitable for X-ray diffraction is also disclosed. The method comprises dosing a dished sample holder bottom (500) which is configured to fit within an annular sample holder (400) with sample material (900), wherein the dished sample holder bottom (500) preferably has a concave dished surface (501) which is adapted to distribute sample material (900) under pressing forces. A new leveling device design tool (FIG. 12) is also disclosed.