Abstract: An optical sensing device includes a substrate; a first dielectric layer extending thereon; a plurality of pairs of opposite antennas patterned on the first layer; and a second dielectric layer that covers all of the antennas. Opposite antennas are, in each of the pairs, separated by a gap g, which, on average, is between 1 nm and 50 nm, as measured in a direction x parallel to a main plane of the substrate. The pairs of antennas have different geometries. The second layer covers all the antennas and defines an electro-magnetic field enhancement volume between the opposite antennas of each of the pairs, thanks to the gap. Electro-magnetic radiation can be concentrated in each volume, making it possible to optically sense an analyte via opposite antennas of each of the pairs. Such a device allows analytes to be funneled and guided into the field-enhanced volumes for deterministic sensing.

Abstract: An optical sensing device includes a substrate; a first dielectric layer extending thereon; a plurality of pairs of opposite antennas patterned on the first layer; and a second dielectric layer that covers all of the antennas. Opposite antennas are, in each of the pairs, separated by a gap g, which, on average, is between 1 nm and 50 nm, as measured in a direction x parallel to a main plane of the substrate. The pairs of antennas have different geometries. The second layer covers all the antennas and defines an electro-magnetic field enhancement volume between the opposite antennas of each of the pairs, thanks to the gap. Electro-magnetic radiation can be concentrated in each volume, making it possible to optically sense an analyte via opposite antennas of each of the pairs. Such a device allows analytes to be funneled and guided into the field-enhanced volumes for deterministic sensing.

Abstract: Methods for template-stripping a single metallic nano-tip structure from a template containing a plurality of ready-to-be-template-stripped inverted metallic nano-tip structures include attaching the metallic nano-tip structure to a wire handle or a cantilever. A metallic nano-tip assembly includes a single metallic nano-tip structure attached to a handle or mounted on a cantilever structure. The metallic nano-tip assembly may be conductive.

Abstract: Methods for template-stripping a single metallic nano-tip structure from a template containing a plurality of ready-to-be-template-stripped inverted metallic nano-tip structures include attaching the metallic nano-tip structure to a wire handle or a cantilever. A metallic nano-tip assembly includes a single metallic nano-tip structure attached to a handle or mounted on a cantilever structure. The metallic nano-tip assembly may be conductive.

Abstract: An embodiment includes an integrated microscope including scanning probe microscopy (SPM) hardware integrated with optical microscopy hardware, and other embodiments include related methods and devices.

Abstract: An embodiment includes an integrated microscope including scanning probe microscopy (SPM) hardware integrated with optical microscopy hardware, and other embodiments include related methods and devices.

Abstract: A stacked optical antenna structure includes a stacked structure including: (1) a first antenna arm located over a substrate; (2) an interstitial gap layer located over at least a portion of the first antenna arm; and (3) a second antenna arm located over at least a portion of the interstitial gap layer located over the first antenna arm, and typically incompletely overlapping the first antenna arm. Thus, a gap width of the stacked optical antenna structure is determined by a thickness of the interstitial gap layer rather than a separation distance of antenna arms that may be formed using a photolithographic method. Embodiments also contemplate a method for fabricating the stacked optical antenna that uses the interstitial gap layer as an etch stop layer. The interstitial gap layer may provide any of several functions within the stacked optical antenna structure.

Abstract: A beam of coherent laser light with linear polarization oriented at 45 degrees to vertical is expanded, and passes through a quarter-wave plate with the fast axis oriented vertically, creating circularly polarized light. The light then passes through a non-polarizing 50/50 beamsplitter. A partial reflector then collinearly reflects a portion of the beam, which is used as the reference beam. The transmitted light passes through a linear polarizer oriented at 45 degrees to vertical, and is focused via a lens onto the sample of interest. Light scattered from this region is re-collimated by the lens and the directed through the linear 45 degree polarizer and through the partial reflector, where it recombines with the reference beam. One use of the invention is to detect microparticles in water.

Abstract: A nanoparticle sensor is capable of detecting and recognizing single nanoparticles in an aqueous environment. Such sensor may find applications in broad areas of science and technology, from the analysis of diesel engine emissions to the detection of biological warfare agents. Particle detection is based on interferometric detection of multi-color light, scattered by the particle. On the fundamental level, the detected signal has a weaker dependence on particle size (ÿ R3), compared to standard detection methods (ÿ R6). This leads to a significantly larger signal-to-noise ratio for smaller particles. By using a multi-color or white excitation light, particle dielectric properties are probed at different frequencies. This scheme samples the frequency dependence of the particle's polarizability thereby making it possible to predict the composition of the particle material.

Abstract: A beam of coherent laser light with linear polarization oriented at 45 degrees to vertical is expanded, and passes through a quarter-wave plate with the fast axis oriented vertically, creating circularly polarized light. The light then passes through a non-polarizing 50/50 beamsplitter. A partial reflector then collinearly reflects a portion of the beam, which is used as the reference beam. The transmitted light passes through a linear polarizer oriented at 45 degrees to vertical, and is focused via a lens onto the sample of interest. Light scattered from this region is re-collimated by the lens and the directed through the linear 45 degree polarizer and through the partial reflector, where it recombines with the reference beam. One use of the invention is to detect microparticles in water.

Abstract: Light from a laser source is split into a reference arm and a detection arm. The light in the detection arm is focused into a channel containing particles to be detected and is backscattered by the particles. The light in the reference arm is attenuated. The attenuated and backscattered light are caused to interfere and detected by a split detector so that the effects of background light can be subtracted out, while the backscattered light is detected to detect the particles.

Abstract: A system for applications, such as imaging, lithography, data storage, and inspection, includes an optical element, at least one structure, and a source of light. The structure is at least partially in and at least adjacent a surface of the optical element. The source of light has a mode profile that provides an electric field which has a vector component substantially perpendicular to a surface of the optical element. The source of light is positioned to propagate at least a portion of the light through the optical element onto the object. The structure enhances the electric field of the light which optically interacts with the object.

Abstract: Light from a laser source is split into a reference arm and a detection arm. The light in the detection arm is focused into a channel containing particles to be detected and is backscattered by the particles. The light in the reference arm is attenuated. The attenuated and backscattered light are caused to interfere and detected by a split detector so that the effects of background light can be subtracted out, while the backscattered light is detected to detect the particles.

Abstract: Light from a laser source is split into a reference arm and a detection arm. The light in the detection arm is focused into a channel containing particles to be detected and is backscattered by the particles. The light in the reference arm is attenuated. The attenuated and backscattered light are caused to interfere and detected by a split detector so that the effects of background light can be subtracted out, while the backscattered light is detected to detect the particles.

Abstract: A system for applications, such as imaging, lithography, data storage, and inspection, includes an optical element, at least one structure, and a source of light. The structure is at least partially in and at least adjacent a surface of the optical element. The source of light has a mode profile that provides an electric field which has a vector component substantially perpendicular to a surface of the optical element. The source of light is positioned to propagate at least a portion of the light through the optical element onto the object. The structure enhances the electric field of the light which optically interacts with the object.

Abstract: The invention relates to a near-field optical microscope, in particular to a scanning near-field optical microscope (SNOM), comprising means for determining the intensity of light emerging from the near-field at a direction differing from the direction perpendicular to the surface of the sample to be examined, preferably emerging at an angle .theta. larger than the critical angle. The invention allows an accurate control of the distance between the probing tip of the SNOM and the sample by using the measured intensity in a feedback loop.