Patents by Inventor Lukas OHNOUTEK

Lukas OHNOUTEK has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Devices and methods for determining chiral optical properties from third harmonic Mie scattering of semiconductor nanohelices
    Patent number: 12216043
    Abstract: Methods and devices for detecting chiral properties from a sample are provided. Light may be directed towards a sample in contact with a chiral nanoparticle. Third harmonic Mie scattering (THMS) optical activity generated by the chiral nanoparticle in contact with the sample can then be detected. A device for detecting chiral properties of a sample is also contemplated that includes Nat least one microwell having a volume of ?about 1 microliter configured to hold a chiral nanoparticle capable of generating third harmonic Mie scattering (THMS) optical activity and a sample to be analyzed. The device includes a source of light configured to generate and direct light toward the at least one microwell containing the chiral nanoparticle and the sample and at least one detector configured to detect third harmonic Mie scattering (THMS) generated by the chiral nanoparticle in the microwell.
    Type: Grant
    Filed: December 1, 2022
    Date of Patent: February 4, 2025
    Assignees: The Regents of The University of Michigan, University of Bath
    Inventors: Nicholas A. Kotov, Ventsislav Valev, Lukas Ohnoutek, Ji-Young Kim
  • DEVICES AND METHODS FOR DETERMINING CHIRAL OPTICAL PROPERTIES FROM THIRD HARMONIC MIE SCATTERING OF SEMICONDUCTOR NANOHELICES
    Publication number: 20240418632
    Abstract: Methods and devices for detecting chiral properties from a sample are provided. Light may be directed towards a sample in contact with a chiral nanoparticle. Third harmonic Mie scattering (THMS) optical activity generated by the chiral nanoparticle in contact with the sample can then be detected. A device for detecting chiral properties of a sample is also contemplated that includes at least one microwell having a volume of ?about 1 microliter configured to hold a chiral nanoparticle capable of generating third harmonic Mie scattering (THMS) optical activity and a sample to be analyzed. The device includes a source of light configured to generate and direct light toward the at least one microwell containing the chiral nanoparticle and the sample and at least one detector configured to detect third harmonic Mie scattering (THMS) generated by the chiral nanoparticle in the microwell.
    Type: Application
    Filed: December 1, 2022
    Publication date: December 19, 2024
    Applicants: The Regents of The University of Michigan, University of Bath
    Inventors: Nicholas A. KOTOV, Ventsislav VALEV, Lukas OHNOUTEK, Ji-Young KIM