Abstract: Techniques for facilitating image setting determination and associated machine learning in infrared imaging systems and methods are provided. In one example, an infrared imaging system includes an infrared imager, a logic device, and an output/feedback device. The infrared imager is configured to capture image data associated with a scene. The logic device is configured to determine, using a machine learning model, an image setting based on the image data. The output/feedback device is configured to provide an indication of the image setting. The output/feedback device is further configured to receive user input associated with the image setting. The output/feedback device is further configured to determine, for use in training the machine learning model, a training dataset based on the user input and the image setting. Related devices and methods are also provided.

Abstract: Various techniques are provided performing temperature inspections of assets, such as temperature-sensitive industrial equipment. In one example, a method includes receiving, at a portable device, inspection instructions associated with an asset at a location in an environment. The method also includes displaying, at the portable device, the asset in an augmented reality format to guide a user of the portable device to the location. The method also includes capturing, by a thermal imager associated with the portable device, a thermal image of the asset when the thermal imager is aligned with the asset. The method also includes extracting, from the thermal image, at least one temperature measurement associated with the asset. Additional methods and systems are also provided.