Patents by Inventor Luqiang SHI

Luqiang SHI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11280826
    Abstract: An analog-circuit fault diagnosis method based on continuous wavelet analysis and an ELM network comprises: data acquisition: performing data sampling on output responses of an analog circuit respectively through Multisim simulation to obtain an output response data set; feature extraction: performing continuous wavelet analysis by taking the output response data set of the circuit as training and testing data sets respectively to obtain a wavelet time-frequency coefficient matrix, dividing the coefficient matrix into eight sub-matrixes of the same size, and performing singular value decomposition on the sub-matrixes to calculate a Tsallis entropy for each sub-matrix to form feature vectors of corresponding faults; and fault classification: submitting the feature vector of each sample to the ELM network to implement accurate and quick fault classification.
    Type: Grant
    Filed: January 6, 2017
    Date of Patent: March 22, 2022
    Assignee: HEFEI UNIVERSITY OF TECHNOLOGY
    Inventors: Yigang He, Wei He, Qiwu Luo, Zhigang Li, Tiancheng Shi, Tao Wang, Zhijie Yuan, Deqin Zhao, Luqiang Shi, Liulu He
  • Patent number: 11095378
    Abstract: A wireless channel monitoring and simulation device with multi-input multi-output (MIMO) is provided, which includes: a wireless channel monitor, configured to collect characteristic parameters of wireless channels in typical environments, and establish models based on the characteristic parameters; a model database, configured to store the characteristic parameter models and parameterize; an original signal, configured to input N different original signals; a wireless channel simulator, configured to simulate a typical channel environment according to the model database configuration, so that the original signal is the same as that in a real typical channel environment, and adopts a N-path output; an N-channel oscilloscope, configured to observe specific waveforms of N-path simulated signals; and a master computer software, configured to process, analyze, and store N-path output signals.
    Type: Grant
    Filed: October 28, 2020
    Date of Patent: August 17, 2021
    Assignee: WUHAN UNIVERSITY
    Inventors: Yigang He, Luqiang Shi, Guolong Shi, Shuiqing Xu, Liulu He, Yuting Wu
  • Publication number: 20210175986
    Abstract: A wireless channel monitoring and simulation device with multi-input multi-output (MIMO) is provided, which includes: a wireless channel monitor, configured to collect characteristic parameters of wireless channels in typical environments, and establish models based on the characteristic parameters; a model database, configured to store the characteristic parameter models and parameterize; an original signal, configured to input N different original signals; a wireless channel simulator, configured to simulate a typical channel environment according to the model database configuration, so that the original signal is the same as that in a real typical channel environment, and adopts a N-path output; an N-channel oscilloscope, configured to observe specific waveforms of N-path simulated signals; and a master computer software, configured to process, analyze, and store N-path output signals.
    Type: Application
    Filed: October 28, 2020
    Publication date: June 10, 2021
    Applicant: WUHAN UNIVERSITY
    Inventors: Yigang HE, Luqiang Shi, Guolong SHI, Shuiqing Xu, Liulu HE, Yuting Wu
  • Publication number: 20200300907
    Abstract: An analog-circuit fault diagnosis method based on continuous wavelet analysis and an ELM network comprises: data acquisition: performing data sampling on output responses of an analog circuit respectively through Multisim simulation to obtain an output response data set; feature extraction: performing continuous wavelet analysis by taking the output response data set of the circuit as training and testing data sets respectively to obtain a wavelet time-frequency coefficient matrix, dividing the coefficient matrix into eight sub-matrixes of the same size, and performing singular value decomposition on the sub-matrixes to calculate a Tsallis entropy for each sub-matrix to form feature vectors of corresponding faults; and fault classification: submitting the feature vector of each sample to the ELM network to implement accurate and quick fault classification.
    Type: Application
    Filed: January 6, 2017
    Publication date: September 24, 2020
    Applicant: HEFEI UNIVERSITY OF TECHNOLOGY
    Inventors: Yigang HE, Wei HE, Qiwu LUO, Zhigang LI, Tiancheng SHI, Tao WANG, Zhijie YUAN, Deqin ZHAO, Luqiang SHI, Liulu HE