Abstract: A measuring arrangement (20) for x-ray radiation, comprising—a sample position (3), which can be illuminated by xray radiation (2) and—an x-ray detector (13) for detecting x-ray radiation emitted from the sample position (3), comprising at least one detector module (21-24), wherein the detector module (21-24) has a plurality of sensor elements (14; 14a-14e) arranged successively in a measuring direction (MR), each sensor element having a centroid (18), wherein the sensor elements (14; 14a-14e) are arranged in a common sensor plane (16) of the detector module (21-24), is characterized in that at least a majority of the sensor elements (14; 14a-14e) of the detector module (21-24), preferably all the sensor elements (14; 14a-14e) of the detector module (21-24), are designed as uniformly spaced sensor elements (14; 14a-14e), wherein the centroids (18) of the sensor elements (14; 14a-14e) have an equal distance R0 from the sample position (3).

Abstract: A measuring arrangement (20) for x-ray radiation, comprising—a sample position (3), which can be illuminated by xray radiation (2) and—an x-ray detector (13) for detecting x-ray radiation emitted from the sample position (3), comprising at least one detector module (21-24), wherein the detector module (21-24) has a plurality of sensor elements (14; 14a-14e) arranged successively in a measuring direction (MR), each sensor element having a centroid (18), wherein the sensor elements (14; 14a-14e) are arranged in a common sensor plane (16) of the detector module (21-24), is characterized in that at least a majority of the sensor elements (14;14a-14e) of the detector module (21-24), preferably all the sensor elements (14; 14a-14e) of the detector module (21-24), are designed as uniformly spaced sensor elements (14; 14a-14e), wherein the centroids (18) of the sensor elements (14; 14a-14e) have an equal distance R0 from the sample position (3).

Abstract: In summary, the present invention proposes embodying an X-ray detector (21) with a plurality of detector modules (1, 1a-1g), each comprising dead zones (6) without X-ray sensitivity and active zones (3, 3a-3c) with X-ray sensitivity that is spatially resolved in a measurement direction (MR), wherein the detector modules (1, 1a-1g) are embodied successively and in an overlapping fashion along the measurement direction (MR), such that in overlap regions (23a-23e) the dead zone (6) of one detector module (1, 1a-1g) is bridged by an active zone (3, 3a-3c) of another detector module (1, 1a-1g). The overlapping detector modules (1, 1a-1g) are arranged next to one another in the transverse direction (QR) in the overlap regions (23a-23e), wherein the transverse direction (QR) runs transversely with respect to the local measurement direction (MR) and transversely with respect to a local connection direction (VR) with respect to a sample position (91).

Abstract: An X-ray optical configuration for irradiation of a sample (1) with an X-ray beam having a line-shaped cross-section, wherein the configuration contains an X-ray source (2) and a beam-conditioning X-ray optics, is characterized in that the X-ray source (2) comprises a brilliant point source (4) and the X-ray optics comprises an X-ray optical element (3) which conditions X-ray light emitted by the point source in such a fashion that the X-ray beam is rendered parallel in one direction perpendicular to the beam propagation direction and remains divergent in a direction which is perpendicular thereto and also to the beam propagation direction. An X-ray optical element of this type enables use of both point-shaped and line-shaped beam geometries without complicated and time-consuming conversion work.

Abstract: An X-ray optical configuration for irradiation of a sample (1) with an X-ray beam having a line-shaped cross-section, wherein the configuration contains an X-ray source (2) and a beam-conditioning X-ray optics, is characterized in that the X-ray source (2) comprises a brilliant point source (4) and the X-ray optics comprises an X-ray optical element (3) which conditions X-ray light emitted by the point source in such a fashion that the X-ray beam is rendered parallel in one direction perpendicular to the beam propagation direction and remains divergent in a direction which is perpendicular thereto and also to the beam propagation direction. An X-ray optical element of this type enables use of both point-shaped and line-shaped beam geometries without complicated and time-consuming conversion work.

Abstract: An X-ray reflectometry apparatus comprises an X-ray source (1) configured to emit an incident X-ray beam directed onto a sample measuring position and an X-ray detector (2) configured to detect an X-ray beam (3) reflected from a surface of a selected sample (4) located in said sample measuring position and with a multiple sample holder (5) comprising an essentially horizontal one- or two-dimensional array of sample resting positions into which solid samples can be placed from above. A drive mechanism (6) moves the sample holder in one or two directions within a horizontal plane underneath the sample measuring position in order to place a selected sample (4) directly beneath the measuring position and a sample lift mechanism (7) has a vertically movable piston (8) located below the multiple sample holder (5) beneath the sample measuring position.

Abstract: An X-ray reflectometry apparatus comprises an X-ray source (1) configured to emit an incident X-ray beam directed onto a sample measuring position and an X-ray detector (2) configured to detect an X-ray beam (3) reflected from a surface of a selected sample (4) located in said sample measuring position and with a multiple sample holder (5) comprising an essentially horizontal one- or two-dimensional array of sample resting positions into which solid samples can be placed from above. A drive mechanism (6) moves the sample holder in one or two directions within a horizontal plane underneath the sample measuring position in order to place a selected sample (4) directly beneath the measuring position and a sample lift mechanism (7) has a vertically movable piston (8) located below the multiple sample holder (5) beneath the sample measuring position.

Abstract: An X-ray or neutron-optical analysis device comprising means for directing radiation from a source (1) onto a sample (2), and a detector (7) with n substantially identical detector elements (Di) which are disposed parallel, next to each other in a first direction x and which extend in strips in a second direction y, wherein i=1, . . .

Abstract: An X-ray or neutron-optical analysis device comprising means for directing radiation from a source (1) onto a sample (2), and a detector (7) with n substantially identical detector elements (Di) which are disposed parallel, next to each other in a first direction x and which extend in strips in a second direction y, wherein i=1, . . .

Abstract: An X-ray optical system comprising an X-ray source (1), from which X-ray radiation (2) is guided to a sample (4) under investigation, and an X-ray detector (7) for receiving radiation (5) diffracted or scattered from the sample (4), wherein a beam-guiding X-ray optical element (3, 6), such as e.g. a collimator, a mono- or polycapillary, an X-ray mirror or a monochromator, is disposed between the source (1) and the sample (4) and/or between the sample (4) and the detector (7), is characterized in that a wobble means is provided for moving the X-ray optical element (3, 6) in an oscillating fashion during the measurement. The inventive X-ray optical system obtains averaged X-ray analysis information from objects under investigation having large mass which consist of macrocrystalline material without destroying or accelerating the object under investigation.

Abstract: A detector arrangement for detecting X-ray or neutron radiation redirected from a sample makes use of a one-dimensional particle or photon counting detector. The detector is oriented along a direction that is disposed substantially perpendicularly to a straight line extending between the sample and the detector. The detector may be rotated within the detection plane to allow inexpensive acquisition of two-dimensional diffraction patterns without the use of a two-dimensional detector.

Abstract: A transmission mode x-ray diffraction screening system has a sample support that holds a sample tray with multiple samples to be tested. The sample support is connected to a translation stage that is movable in three dimensions, and that it offset from the location of the sample support. An x-ray source is located to one side of the sample support, and a detector is located to the other side, thereby allowing the detection of x-rays that are diffracted by the sample in a transmission mode. A retractable beamstop may be located between the sample and the detector to block at least part of the non-diffracted x-rays from the source. A video camera may also be provided for imaging the sample location, which may be illuminated by a laser. The entire system may be automated such that each sample in the sample tray may be sequentially analyzed.