Abstract: A method for compensating spectrum drift in a spectrometer having a radiation source, optical apparatus to split up a spectrum into spectral lines according to wavelengths of radiation from the radiation source, a number of detectors to receive partial spectra, and which are provided with respective pluralities of pixels to measure radiation intensity, and a catalog of spectral lines of different chemical elements that may be used as correction lines. The method may include generating and recording an emission spectrum of a sample; determining pixels receiving the maximum of the peaks for respective partial spectra and identifying respective peak positions for the peak maxima; for the respective peak positions, determining if there is a correction line within a predetermined maximum distance from the peak position, and if so, calculating a distance between the peak position and the correction line; and calculating a correction function for assignment of peak positions.

Abstract: A method for compensating spectrum drift in a spectrometer having a radiation source, optical apparatus to split up a spectrum into spectral lines according to wavelengths of radiation from the radiation source, a number of detectors to receive partial spectra, and which are provided with respective pluralities of pixels to measure radiation intensity, and a catalogue of spectral lines of different chemical elements that may be used as correction lines. The method may include generating and recording an emission spectrum of a sample; determining pixels receiving the maximum of the peaks for respective partial spectra and identifying respective peak positions for the peak maxima; for the respective peak positions, determining if there is a correction line within a predetermined maximum distance from the peak position, and if so, calculating a distance between the peak position and the correction line; and calculating a correction function for assignment of peak positions.

Abstract: The present invention relates to a method for correcting spectral interference in a spectrum which is determined using an inductively coupled plasma spectrometer (ICP) for analysing element contents of a liquid or gaseous sample, comprising the following steps: recording the spectrum of a matrix solution containing all spectrally interfering components, which are also contained in the sample, in a first concentration; recording the spectrum of the matrix solution in at least one dilution of the first concentration; regressing the signal intensities obtained in steps a. and b. against the concentration for a number of wavelength positions; calibrating the spectrometer, background correction using the values determined from the regression in step c. and determining the calibration function c=f(I); recording the sample spectrum using at least one analyte which is contained therein; determining the concentration of the spectrally interfering components in the sample using the results obtained in step c.

Abstract: The present invention relates to a method for correcting spectral interference in a spectrum which is determined using an inductively coupled plasma spectrometer (ICP) for analysing element contents of a liquid or gaseous sample, comprising the following steps: recording the spectrum of a matrix solution containing all spectrally interfering components, which are also contained in the sample, in a first concentration; recording the spectrum of the matrix solution in at least one dilution of the first concentration; regressing the signal intensities obtained in steps a. and b. against the concentration for a number of wavelength positions; calibrating the spectrometer, background correction using the values determined from the regression in step c. and determining the calibration function c=f(I); recording the sample spectrum using at least one analyte which is contained therein; determining the concentration of the spectrally interfering components in the sample using the results obtained in step c.