Patents by Inventor Lynn Yieh

Lynn Yieh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and algorithms for performing quality control during gene expression profiling on DNA microarray technology
    Publication number: 20040229245
    Abstract: Methods and algorithms for quality control in gene expression profiling on DNA microarray technology are disclosed including methods and algorithms for assessing quality control of the printing of a DNA microarray, the preparation of an RNA sample, the labeling of probes, the hybridization between a DNA microarray and probes, the result of washing procedures, the result of scanning procedures, and for quantifying the gene expression data produced by imaging the hybridized DNA microarray.
    Type: Application
    Filed: January 6, 2004
    Publication date: November 18, 2004
    Inventors: Anton Bittner, Andrew A. Carmen, Albert Leung, Xuejun Liu, Simon Smith, Li Sun, Jackson Wan, Huinian Xiao, Xiang Yao, Lynn Yieh