Abstract: A lumber inspection and optimization system is disclosed combining the speed of electro-optic scanning for flaw detection with electronic data manipulation and computation for optimizing the utilization of the lumber in accordance with an order entry list specifying the dimensions, grade and priority of products desired to be cut from each board inspected by the system. The system receives input data from an order entry device and an electro-optical scanner. Digital scan data from the electro-optical scanner is electronically processed to form a flaw data buffer containing the edge location of all the detected flaws enlarged to compensate for defective material usually surrounding each flaw. Optimization of the material is accomplished by electronically comparing the order entry data with the location of the flaws in the flaw buffer to generate cut line data indicative of where the board is to be cut.

Abstract: A lumber inspection and optimization system is disclosed combining the speed of electro-optic scanning for flaw detection with electronic data manipulation and computation for optimizing the utilization of the lumber in accordance with an order entry list specifying the dimensions, grade and priority of boards desired to cut from each piece of lumber inspected by the system. The system receives input data from an order entry device and an electro-optical scanner. The digital scan data from the electro-optical scanner is electronically processed to form a flaw data buffer containing the edge location of all the detected flaws enlarged to compensate for defective material usually surrounding each flaw. Optimization of the material is accomplished by electronically comparing the order entry data with the location of the flaws in the flaw buffer to generate cut line data indicative of where the board is to be cut.

Abstract: An electro-optical scanner system for generating digital flaw data for a lumber inspection and optimization system is disclosed. The electro-optical scanner system includes an optical scanner generating analog scan data having frequency components indicative of the surface characteristics of the material being scanned. A dual quantizer separates the high frequency components of the scan data indicative of cracks, checks or splits from the low frequency components and converts both the high and low frequency components to a digital format. A digital filter removes extraneous noise from the digital high frequency scan data and a scanner interface encodes the digital high frequency and digital low frequency data in a predetermined multi-bit data byte format which simplifies data manipulation for subsequent flaw analysis by a computer.