Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.

Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.

Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.

Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.

Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.

Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.

Abstract: A modular Atomic Force Microscope that allows ultra-high resolution imaging and measurements in a wide variety of environmental conditions is described. The instrument permits such imaging and measurements in environments ranging from ambient to liquid or gas or extremely high or extremely low temperatures.

Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.

Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.

Abstract: An apparatus and technique for measuring the electrical capacitance between a conducting tip of a scanning probe microscope and a sample surface is described. A high frequency digital vector network analyzer is connected to the probe tip of the cantilever of an atomic force microscope, and data collection is coordinated by a digital computer using digital trigger signals between the AFM controller and the vector network analyzer. Methods for imaging tip-sample capacitance and spectroscopic measurements at a single point on the sample are described. A method for system calibration is described.

Abstract: A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument.

Abstract: An apparatus and technique for measuring the electrical capacitance between a conducting tip of a scanning probe microscope and a sample surface is described. A high frequency digital vector network analyzer is connected to the probe tip of the cantilever of an atomic force microscope, and data collection is coordinated by a digital computer using digital trigger signals between the AFM controller and the vector network analyzer. Methods for imaging tip-sample capacitance and spectroscopic measurements at a single point on the sample are described. A method for system calibration is described.

Abstract: Methods, systems and circuits for analyzing the performance of a vehicle having an electrical system are provided which determine a shift point while the vehicle is being driven. The shift point is determined using acceleration data and RPM data generated from the electrical system.

Abstract: Methods, systems and circuits for analyzing the performance of a vehicle having an electrical system are provided which determine a shift point while the vehicle is being driven. The shift point is determined using acceleration data and RPM data generated from the electrical system.

Abstract: Methods, systems and circuits for analyzing the performance of a vehicle having an electrical system are provided which determine a shift point while the vehicle is being driven. The shift point is determined using acceleration data and RPM data generated from the electrical system.

Abstract: Methods, systems and circuits for analyzing the performance of a vehicle having an electrical system are provided which determine a shift point while the vehicle is being driven. The shift point is determined using acceleration data and RPM data generated from the electrical system.

Abstract: A color television system for transmitting a color television signal, specifically for recording on and subsequently reproducing from a record carrier. The color television signal to be transmitted contains a first carrier which is frequency-modulated with the luminance information and a second carrier which is modulated with the chrominance information, whose frequency lies between zero and the first-order lower side band of the modulated first carrier which corresponds to the highest modulation frequency. Said second carrier does not have a fixed frequency, but is locked to the instantaneous frequency of the modulated first carrier by a constant integral ratio. Depending on the characteristics of the transmission medium and the signal processing equipment said ratio is preferably two or three.

Abstract: A color television system for transmitting a color television signal, specifically for recording on and subsequently reproducing from a record carrier. The color television signal to be transmitted contains a first carrier which is frequency-modulated with the luminance information and a second carrier which is modulated with the chrominance information, whose frequency lies between zero and the first-order lower side band of the modulated first carrier which corresponds to the highest modulation frequency. Said second carrier does not have a fixed frequency, but is locked to the instantaneous frequency of the modulated first carrier by a constant integral ratio. Depending on the characteristics of the transmission medium and the signal processing equipment said ratio is preferably two or three.

Abstract: A color television system for the combined transmission of a luminance signal and a chrominance signal. The chrominance signal is added to a carrier as a frequency modulation, after which the modulated carrier is amplitude-modulated by the luminance signal. The system is extremely suited for use with a disc-shaped record carrier. The color television signal is then recorded as a trackwidth variation of a spiral track provided on the record carrier.

Abstract: An apparatus for reading a disc-shaped record carrier on which signals are recorded in parallel tracks in optically coded form. The signal is read with the aid of a beam of radiation, which after interaction with the record carrier impinges on two detectors offset with respect to each other in a direction parallel to the image of the track direction of the record carrier. A first combination circuit supplies the difference of the output signals of said read detectors to a first signal processing channel, which processes the part of comparatively high frequency of the frequency spectrum of the recorded signal. A second combination signal supplies the sum of the output signals of said read detectors to a second processing channel, which processes the part of comparatively low frequency of the frequency spectrum of the recorded signal.