Abstract: A fiber-reinforced composite laminate for use in electromagnetic welding of molded parts of said laminates. The laminate has a plurality of structural layers, each formed of electrically conductive fibers embedded in a thermoplastic matrix. Eddy currents may be induced in the electrically conductive fibers by an electrical conductor that generates an electromagnetic field. The structural layers include a first, a second and, optionally, a third pair of two adjacently positioned structural layers. The first pair has an intermediate layer which allows eddy currents to flow between the two structural layers of the first pair. The second pair has an intermediate layer which prevents eddy currents from flowing between the two structural layers of the second pair. The optional third pair does not have an intermediate layer. The laminate shows efficient heating by an electromagnetic field.

Abstract: An optical interferometer (100) includes a first optical interferometer (200) disposed on a front surface side of a workpiece (W) and a second optical interferometer (300) disposed on a rear surface side of the workpiece (W). The first optical interferometer (200) and the second optical interferometer (300) each include a light emitting section (210, 310), a wire grid (220, 320) and an interference fringe sensor (230, 330). Wire alignment directions of the wire grid (220) of the first optical interferometer (200) and the wire grid (320) of the second optical interferometer (300) are orthogonal to each other. When no workpiece (W) is set, the wire grid (220) of the first optical interferometer (200) reflects light from the second optical interferometer (300) to generate object light and the wire grid (320) of the second optical interferometer (300) reflects light from the first optical interferometer (200) to generate object light.

Abstract: A phase shift interferometer (100) has an illuminating optical system (200) that emits a P-wave and an S-wave, a collimator lens (110), a reference half mirror (120), a pinhole plate (130) having a pinhole (131), and a phase shift interference fringe acquiring section (300) that allows an object light and a reference light contained in the light beam passed through the pinhole (131) interfere with each other in four different phases to acquire interference fringes with different phases. In the S-wave, only the reference light (SR) reflected by the reference half mirror (120) is passed through the pinhole (131), and the object light (SM) reflected by a surface-to-be-measured is blocked by the pinhole plate (130). In the P-wave, only the object light (PM) reflected by the surface-to-be-measured is passed through the pinhole (131), and the reference light (PR) reflected by the reference half mirror (120) is blocked by the pinhole plate (130).

Abstract: An optical interferometer (100) includes a first optical interferometer (200) disposed on a front surface side of a workpiece (W) and a second optical interferometer (300) disposed on a rear surface side of the workpiece (W). The first optical interferometer (200) and the second optical interferometer (300) each include a light emitting section (210, 310), a wire grid (220, 320) and an interference fringe sensor (230, 330). Wire alignment directions of the wire grid (220) of the first optical interferometer (200) and the wire grid (320) of the second optical interferometer (300) are orthogonal to each other. When no workpiece (W) is set, the wire grid (220) of the first optical interferometer (200) reflects light from the second optical interferometer (300) to generate object light and the wire grid (320) of the second optical interferometer (300) reflects light from the first optical interferometer (200) to generate object light.

Abstract: A phase shift interferometer (100) has an illuminating optical system (200) that emits a P-wave and an S-wave, a collimator lens (110), a reference half mirror (120), a pinhole plate (130) having a pinhole (131), and a phase shift interference fringe acquiring section (300) that allows an object light and a reference light contained in the light beam passed through the pinhole (131) interfere with each other in four different phases to acquire interference fringes with different phases. In the S-wave, only the reference light (SR) reflected by the reference half mirror (120) is passed through the pinhole (131), and the object light (SM) reflected by a surface-to-be-measured is blocked by the pinhole plate (130). In the P-wave, only the object light (PM) reflected by the surface-to-be-measured is passed through the pinhole (131), and the reference light (PR) reflected by the reference half mirror (120) is blocked by the pinhole plate (130).