Patents by Inventor Machiko Kitayama

Machiko Kitayama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Offset measuring method
    Patent number: 7035175
    Abstract: An offset measuring method is for measuring an offset based on an optical beam reflected by an information medium, in a recording and reproduction apparatus including an optical pickup placed on transportation means so as to be driven along a radial direction of the information medium. The method includes the steps of directing an optical beam toward a first measuring position, thereby measuring a first offset amount based on the optical beam reflected at the first measuring position; moving the transportation means by a first distance in a first direction along the radial direction; driving the optical pickup by a second distance, which is equal to the first distance, in a second direction; and directing an optical beam toward a second measuring position, thereby measuring a second offset amount based on the optical beam reflected at the second measuring position.
    Type: Grant
    Filed: March 25, 2002
    Date of Patent: April 25, 2006
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Machiko Kitayama, Masaya Kuwahara, Yasuhiro Tai
  • Offset measuring method
    Publication number: 20030137907
    Abstract: An offset measuring method is for measuring an offset based on an optical beam reflected by an information medium, in a recording and reproduction apparatus including an optical pickup placed on transportation means so as to be driven along a radial direction of the information medium. The method includes the steps of directing an optical beam toward a first measuring position, thereby measuring a first offset amount based on the optical beam reflected at the first measuring position; moving the transportation means by a first distance in a first direction along the radial direction; driving the optical pickup by a second distance, which is equal to the first distance, in a second direction; and directing an optical beam toward a second measuring position, thereby measuring a second offset amount based on the optical beam reflected at the second measuring position.
    Type: Application
    Filed: September 16, 2002
    Publication date: July 24, 2003
    Inventors: Machiko Kitayama, Masaya Kuwahara, Yasuhiro Tai