Patents by Inventor Maciej Kraszewski

Maciej Kraszewski has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10922836
    Abstract: A specimen of an artificial marker is arranged on an object, the position of which is to be determined. The artificial marker defines a nominal marker pattern with nominal characteristics. The specimen embodies the nominal marker pattern with individual characteristics. One or more images of the specimen are captured while the specimen is arranged on the object. An image representation of the specimen is analyzed using a data set. The data set comprises measured data values representing the individual characteristics as individually measured on the first specimen. Position values representing a 3D position of the specimen relative to a coordinate system are determined. A 3D position of the object is determined based on the position values of the specimen.
    Type: Grant
    Filed: November 14, 2017
    Date of Patent: February 16, 2021
    Assignee: CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH
    Inventors: Maciej Kraszewski, Nils Haverkamp, Andrzej Grzesiak
  • Publication number: 20180137646
    Abstract: A specimen of an artificial marker is arranged on an object, the position of which is to be determined. The artificial marker defines a nominal marker pattern with nominal characteristics. The specimen embodies the nominal marker pattern with individual characteristics. One or more images of the specimen are captured while the specimen is arranged on the object. An image representation of the specimen is analyzed using a data set. The data set comprises measured data values representing the individual characteristics as individually measured on the first specimen. Position values representing a 3D position of the specimen relative to a coordinate system are determined. A 3D position of the object is determined based on the position values of the specimen.
    Type: Application
    Filed: November 14, 2017
    Publication date: May 17, 2018
    Inventors: Maciej KRASZEWSKI, Nils HAVERKAMP, Andrzej GRZESIAK
  • Patent number: 9934592
    Abstract: A method and a system for determining a 6-DOF-pose of an object in space use an optical-tracking marker attached to the object. The marker comprises an inner marker area having a circular contour with a known radius and a marker pattern defining at least one characteristic marker feature. A camera image of the marker typically shows an elliptical representation of the circular contour and the marker pattern. Based on the image, parameters describing the elliptical representation are determined and the 6-DOF-pose of the marker in space is derived using the parameters.
    Type: Grant
    Filed: November 15, 2016
    Date of Patent: April 3, 2018
    Assignee: CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH
    Inventors: Mariusz Bodjanski, Maciej Kraszewski, Arkadiusz Smigielski