Abstract: An apparatus and method for using a single bank of electric fuses (eFuses) to successively store test data derived from multiple stages of testing are provided. To encode and store array redundancy data from each subsequent test in the same bank of eFuses, a latch on a scan chain is used that holds the programming information for each eFuse. This latch allows for programming only a portion of eFuses during each stage of testing. Moreover, the data programmed in the eFuses can be sensed and read as part of a scan chain. Thus, it can be easily determined what portions of the bank of eFuses have already been programmed by a previous stage of testing and where to start programming the next set of data into the bank of eFuses. As a result, the single bank of eFuses stores multiple sets of data from a plurality of test stages.

Abstract: A method, an apparatus and a computer program product are provided for the compression of array redundancy data. Array redundancy data can be lengthy and take up a lot of space on a processor. This invention provides an algorithm that can compress array redundancy data for storage, and decompress and reload the array redundancy data at power-on of the processor. This compression algorithm saves a lot of space on the processor, which enables the processor to save power during operation, and function more efficiently. This algorithm also skips defective array redundancy data, which can be detrimental to the processor.

Abstract: A system and method for testing functional boundary logic at an asynchronous clock boundary of an integrated circuit device. With the system and method, each clock domain has its own scan paths that do not cross domain boundaries. By eliminating the scanning across the boundaries, the requirement to have two clock grids in the asynchronously clocked domains may be eliminated. As a result, circuit area and design time with regard to the clock distribution design are reduced. In addition, removing the second clock grid, i.e. the high speed core or system clock, in the asynchronously clocked domains removes the requirement to have a multiplexing scheme for selection of clocking signals in the asynchronous domain. In addition to the above, the system and method provide boundary built-in-self-test logic for testing the functional crossing logic of boundaries between the clock domains in a functional mode of operation.

Abstract: A method and apparatus are disclosed for injecting errors in the functional units of a processor system, and for observing non-injected errors that occur in those functional units. A local error handler layer provides error injection for the various functional units at a local level. A global fault isolation register (FIR) layer couples to the local error handler layer to coordinate the handling of local errors in the multiple functional units of the processor system. A software debugger application or system software communicates with the global FIR layer to control error handling.

Abstract: Systems and methods for performing logic built-in self-tests (LBISTs) in which an LBIST controller provides control signals to multiple LBIST satellites that are co-located with different functional blocks of the device under test, such as processor cores in a multiprocessor integrated circuit. Because the data paths for each satellite are shorter than data paths in conventional LBIST architectures, fewer latches are needed to synchronize the delivery of data to scan chains in the satellites. In one embodiment, each satellite includes a pseudorandom bit pattern generator (PRPG,) scan chains and a multiple-input signature register (MISR). In one embodiment, the LBIST circuitry also includes a control scan chain that is coupled to each of the LBIST satellites and configured to scan data into and out of the LBIST satellites.

Abstract: A clock control hierarchy is provided that is comprised of synchronous and asynchronous hold request signals that are used to start and stop functional units of a chip. Pervasive logic is provided that uses a synchronous “chip hold” signal and asynchronous latch/functional unit hold signals to individually target functional units and latches that are to remain in a held state once the “chip hold” state is released. With the present invention, a chip hold request is first activated followed by scannable latch and non-scannable latch hold requests being activated to identify which latches will be clocked or not clocked when the chip hold is released. Functional unit hold signals are activated to place certain ones of the functional units of the chip in a hold state. The chip hold request is deactivated and the chip operates with the selected functional units and latches being maintained in a held state.

Abstract: Systems and methods for performing logic built-in self-tests (LBISTs) in digital circuits, where boundary scan chains in functional blocks of the circuits can be selectively coupled/decoupled to isolate the functional blocks during LBIST testing. In one embodiment, processor cores of a multiprocessor chip are isolated and LBIST testing is performed to determine whether any of the processor cores is malfunctioning. If none of the processor cores malfunctions, the processor cores are tested in conjunction with the supporting functional blocks of the device to determine whether the multiprocessor is fully functional. If one or more processor cores malfunctions, these processor cores are isolated and the remaining processor cores are tested in conjunction with the supporting functional blocks of the device to determine whether the multiprocessor operates properly with reduced functionality.

Abstract: An eFuse data alignment verification apparatus and method are provided. Alignment latches are provided in a series of latch units of a write scan chain and a logic unit is coupled to the alignment latches. A sequence of data that is scanned-into the series of latch units of the write scan chain preferably includes alignment data values. These alignment data values are placed in positions within the sequence of data that, if the sequence of data is properly scanned-into the series of latch units, cause the data values to be stored in the alignment latches. The logic unit receives data signals from the alignment latches and determines if the proper pattern of data values is stored in the alignment latches. If the proper pattern of data values is present in the alignment latches, then the data is aligned and a program enable signal is sent to the bank of eFuses.

Abstract: The present invention provides a data processing system, a method, and a computer program product for stopping at least two clock signals that oscillate at different frequencies and restarting the at least two clock signals at their correct phase. A RUNN counter stops the at least two clock signals. The RUNN counter stops the faster clock signal and restarts the faster clock signal at the correct phase. A phase status circuit determines the phase where the slower clock signal stopped and produces a phase status signal. A second circuit utilizes the phase status signal to start the slower clock signal at the correct phase. Therefore, the present invention insures that the faster clock signal and the slower clock signal are restarted at the correct phase. In another embodiment, the second circuit enables the present invention to start the slower clock signal at a desired phase.

Abstract: An apparatus and method for controlling asynchronous clock domains to perform synchronous operations are provided. With the system and method, when a synchronous operation is to be performed on a chip, the latches of the functional elements of the chip are controlled by a synchronous clock so that the latches are controlled synchronously even across asynchronous boundaries of the chip. The synchronous operation may then be performed and the chip's functional elements returned to being controlled by a local clock in an asynchronous manner after completion of the synchronous operation. This synchronous operation may be, for example, a power on reset (POR) operation, a manufacturing test sequence, debug operation, or the like.

Abstract: A system and method for verifying configuration data for configuring a microprocessor or system-on-a-chip (SoC) are provided. With the system and method, during initialization, configuration data is shifted into the microprocessor or SoC through a configuration input. The configuration data is shifted to all of the on-chip processor units to provide initial settings for configuration latches in the design. While the configuration data is being shifted to the on-chip processor units, a copy of the configuration data is also stored in a local storage of a test control unit. A private interface is provided between the test control unit and the processor units. Via the private interface, a processor unit receives the current configuration data for the processor units. The current configuration data is compared against the original configuration data stored in the test control unit to verify the current configuration of the processor units.

Abstract: An apparatus and method for using electrical fuses (eFuses) to store phase-locked loop (PLL) configuration data are provided. With the apparatus and method, a portion of the eFuses present in the integrated circuit are reserved for the PLL configuration data. Upon power up, a power up controller and eFuse controller direct the sensing and serial transfer of the data in the portion of eFuses to the PLL under the reference clock. When the transfer is complete, the power up controller directs the PLL logic to load the configuration data and start. The mechanism of the present invention allows manufacturing to tailor the PLL configuration on a given device based on the characteristics of that device and its intended usage. Thus, the same PLL may be used in the same or different architectures to perform different operations based on the configuration data passed into the PLL from the eFuses.

Abstract: A system and method for a multi-use eFuse macro is presented. A device includes multiplexers and selection logic that allow eFuse latches to store auxiliary data in addition to programming electronic fuses. The multiplexers and selection logic are coupled to the inputs and outputs of the eFuse latches, and are controlled by a processing unit or an external tester. When a tester wishes to program or update an eFuse element (electronic fuses), the multiplexers and selection logic are configured for “eFuse” mode, which allows an eFuse controller to provide program data and control data to the eFuse latches which, in turn, program the eFuse element. When the device requires additional storage, the multiplexers and selection logic are configured for “auxiliary data” mode, which allows a processing unit to store and retrieve data in the eFuse latches.

Abstract: A converter apparatus and method are provided that transforms an external low speed industry standard interface into an on-chip high speed serial link (HSSL). The converter of the present invention is preferably placed in close vicinity of the external interface. The HSSL operates at the system clock speed and, as a result, the HSSL interface signals can be readily treated like any other timed signal facilitating the physical design process. Because synchronization is performed once in the converter near the external interface and the signals along the HSSL of the present invention may be treated like any other timed signal, the need for interface units in each processing element of the chip to perform synchronization is eliminated. Thus, the complexity and silicon area used by the present invention is reduced. The converter enables the maximum speed for the serial interface, which is crucial in power-on-reset, manufacturing testing, and chip debugging.

Abstract: A frequency synthesizer lock detection system is disclosed that distributes a frequency synthesizer output signal across a distribution network to one or more receptor circuits. The distribution network may exhibit delay and other distortion that may cause the downstream signal arriving at the receptor circuit to lose frequency lock with both the frequency synthesizer output signal and a reference clock signal that controls the frequency of the synthesizer output signal. The lock detection system tests the downstream signal to determine if the downstream signal exhibits a lock with respect to the reference clock that determines the operating frequency of the frequency synthesizer. In this manner, lock of the downstream signal to the reference clock signal may be accurately assessed in one embodiment.

Abstract: An information handling system including a frequency synthesizer lock detection system is disclosed that distributes a frequency synthesizer output signal across a distribution network to one or more receptor circuits. The distribution network may exhibit delay and other distortion that may cause the downstream signal arriving at the receptor circuit to lose frequency lock with both the frequency synthesizer output signal and a reference clock signal that controls the frequency of the synthesizer output signal. The lock detection system tests the downstream signal to determine if the downstream signal exhibits a lock with respect to the reference clock that determines the operating frequency of the frequency synthesizer. In this manner, lock of the downstream signal to the reference clock signal may be accurately assessed in one embodiment.

Abstract: An apparatus and method for using a single bank of electric fuses (eFuses) to successively store test data derived from multiple stages of testing are provided. To encode and store array redundancy data from each subsequent test in the same bank of eFuses, a latch on a scan chain is used that holds the programming information for each eFuse. This latch allows for programming only a portion of eFuses during each stage of testing. Moreover, the data programmed in the eFuses can be sensed and read as part of a scan chain. Thus, it can be easily determined what portions of the bank of eFuses have already been programmed by a previous stage of testing and where to start programming the next set of data into the bank of eFuses. As a result, the single bank of eFuses stores multiple sets of data from a plurality of test stages.

Abstract: An apparatus, a method, and a computer program are provided to disable clock distribution. In microprocessors, the clock distribution system can account for a substantial amount of power consumption. Disabling the clock distribution system, however, has been difficult because of the usual requirement for a separate clock for control logic. Therefore, combinational logic can be employed to disrupt the clock distribution and allow a processor to be awakened without a need for a separate clock.

Abstract: An apparatus, a method, and a computer program are provided to gate a Phased Locked Loop (PLL). In microprocessors, the clock distribution system can account for a substantial amount of power consumption. Gating the PLLs, however, has been difficult because of the usual requirement for a separate clock for control logic and because the PLL requires timed to reacquire phase/frequency lock. Therefore, lock detection logic can be employed to allow the PLL to reacquire phase/frequency lock. Additionally, signals from external devices and the processor can be employed to gate the PLL and allow the processor to be awakened without a need for a separate clock.

Abstract: A method, an apparatus and a computer program product are provided for the compression of array redundancy data. Array redundancy data can be lengthy and take up a lot of space on a processor. This invention provides an algorithm that can compress array redundancy data for storage, and decompress and reload the array redundancy data at power-on of the processor. This compression algorithm saves a lot of space on the processor, which enables the processor to save power during operation, and function more efficiently. This algorithm also skips defective array redundancy data, which can be detrimental to the processor.