Patents by Inventor Maggie Le

Maggie Le has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8444661
    Abstract: Devices, systems and methods for removing foreign bodies within a body lumen are disclosed. An unfolding balloon catheter may include an elongated shaft having an intussuscepting balloon that can be actuated within a body lumen to capture and retrieve an intravascular device. The balloon may be configured to radially and/or axially expand when inflated, enveloping the intravascular device. In certain embodiments, the balloon may be formed by folding the ends of a distensible member inwardly, and then bonding the ends of the distensible member to the elongated shaft to form an expandable sleeve. An adhesive layer located along a portion of the elongated shaft may be used to temporarily secure the balloon to the elongated shaft.
    Type: Grant
    Filed: June 28, 2007
    Date of Patent: May 21, 2013
    Assignees: Stryker Corporation, Stryker NV Operations Limited
    Inventors: Ajitkumar B. Nair, Kamal Ramzipoor, Tra Huong Ngo, Hieu T. Nguyen, Maggie Le
  • Publication number: 20120276301
    Abstract: Embodiments described herein provide a method of processing a substrate. The method includes depositing an interface adhesion layer between a conductive material and a dielectric material such that the interface adhesion layer provides increased adhesion between the conductive material and the dielectric material. In one embodiment a method for processing a substrate is provided. The method comprises depositing an interface adhesion layer on a substrate comprising a conductive material, exposing the interface adhesion layer to a nitrogen containing plasma, and depositing a dielectric layer on the interface adhesion layer after exposing the interface adhesion layer to the nitrogen containing plasma.
    Type: Application
    Filed: July 10, 2012
    Publication date: November 1, 2012
    Inventors: Yong-Won Lee, Sang M. Lee, Meiyee (Maggie Le) Shek, Weifeng Ye, Li-Qun Xia, Derek R. Witty, Thomas Nowak, Juan Carlos Rocha-Alvarez, Jigang Li
  • Publication number: 20110104891
    Abstract: A method and apparatus for generating air gaps in a dielectric material of an interconnect structure. One embodiment provides a method for forming a semiconductor structure comprising depositing a first dielectric layer on a substrate, forming trenches in the first dielectric layer, filling the trenches with a conductive material, planarizing the conductive material to expose the first dielectric layer, depositing a dielectric barrier film on the conductive material and exposed first dielectric layer, depositing a hard mask layer over the dielectric barrier film, forming a pattern in the dielectric barrier film and the hard mask layer to expose selected regions of the substrate, oxidizing at least a portion of the first dielectric layer in the selected region of the substrate, removing oxidized portion of the first dielectric layer to form reversed trenches around the conductive material, and forming air gaps in the reversed trenches while depositing a second dielectric material in the reversed trenches.
    Type: Application
    Filed: January 7, 2011
    Publication date: May 5, 2011
    Inventors: AMIR AL-BAYATI, Alexandros T. Demos, Kang Sub Yim, Mehul Naik, Zhenjiang David Cui, Mihaela Balseanu, Meiyee Maggie Le Shek, Li-Qun Xia
  • Patent number: 7879683
    Abstract: A method and apparatus for generating air gaps in a dielectric material of an interconnect structure. One embodiment provides a method for forming a semiconductor structure comprising depositing a first dielectric layer on a substrate, forming trenches in the first dielectric layer, filling the trenches with a conductive material, planarizing the conductive material to expose the first dielectric layer, depositing a dielectric barrier film on the conductive material and exposed first dielectric layer, depositing a hard mask layer over the dielectric barrier film, forming a pattern in the dielectric barrier film and the hard mask layer to expose selected regions of the substrate, oxidizing at least a portion of the first dielectric layer in the selected region of the substrate, removing oxidized portion of the first dielectric layer to form reversed trenches around the conductive material, and forming air gaps in the reversed trenches while depositing a second dielectric material in the reversed trenches.
    Type: Grant
    Filed: October 9, 2007
    Date of Patent: February 1, 2011
    Assignee: Applied Materials, Inc.
    Inventors: Amir Al-Bayati, Alexandros T. Demos, Kang Sub Yim, Mehul Naik, Zhenjiang “David” Cui, Mihaela Balseanu, Meiyee (Maggie Le) Shek, Li-Qun Xia
  • Patent number: 7851385
    Abstract: The present invention generally provides apparatus and method for processing a semiconductor substrate. Particularly, embodiments of the present invention relate to a method and apparatus for forming semiconductor devices having a conformal silicon oxide layer formed at low temperature. One embodiment of the present invention provides a method for forming a semiconductor gate structure. The method comprises forming a gate stack on a semiconductor substrate, forming a conformal silicon oxide layer on the semiconductor substrate using a low temperature cyclic method, and forming a spacer layer on the conformal silicon oxide layer.
    Type: Grant
    Filed: September 30, 2008
    Date of Patent: December 14, 2010
    Assignee: Applied Materials, Inc.
    Inventors: Matthew Spuller, Melody Agustin, Meiyee (Maggie Le) Shek, Li-Qun Xia, Reza Arghavani
  • Publication number: 20090107626
    Abstract: Embodiments described herein provide a method of processing a substrate. The method includes depositing an interface adhesion layer between a conductive material and a dielectric material such that the interface adhesion layer provides increased adhesion between the conductive material and the dielectric material. In one embodiment a method for processing a substrate is provided. The method comprises depositing an interface adhesion layer on a substrate comprising a conductive material, exposing the interface adhesion layer to a nitrogen containing plasma, and depositing a dielectric layer on the interface adhesion layer after exposing the interface adhesion layer to the nitrogen containing plasma.
    Type: Application
    Filed: October 24, 2008
    Publication date: April 30, 2009
    Inventors: Yong-Won Lee, Sang M. Lee, Meiyee(Maggie Le) Shek, Weifeng Ye, Li-Qun Xia, Derek R. Witty, Thomas Nowak, Juan Carlos Rocha-Alvarez, Jigang Li
  • Publication number: 20090093112
    Abstract: A method and apparatus for generating air gaps in a dielectric material of an interconnect structure. One embodiment provides a method for forming a semiconductor structure comprising depositing a first dielectric layer on a substrate, forming trenches in the first dielectric layer, filling the trenches with a conductive material, planarizing the conductive material to expose the first dielectric layer, depositing a dielectric barrier film on the conductive material and exposed first dielectric layer, depositing a hard mask layer over the dielectric barrier film, forming a pattern in the dielectric barrier film and the hard mask layer to expose selected regions of the substrate, oxidizing at least a portion of the first dielectric layer in the selected region of the substrate, removing oxidized portion of the first dielectric layer to form reversed trenches around the conductive material, and forming air gaps in the reversed trenches while depositing a second dielectric material in the reversed trenches.
    Type: Application
    Filed: October 9, 2007
    Publication date: April 9, 2009
    Inventors: AMIR AL-BAYATI, Alexandros T. Demos, Kang Sub Yim, Mehul Naik, Zhenjiang 'David' Cui, Mihaela Balseanu, Meiyee (Maggie Le) Shek, Li-Qun Xia
  • Publication number: 20090093100
    Abstract: The present invention generally provides a method for forming multilevel interconnect structures, including multilevel interconnect structures that include an air gap. One embodiment provides a method for forming conductive lines in a semiconductor structure comprising forming trenches in a first dielectric layer, wherein air gaps are to be formed in the first dielectric layer, depositing a conformal dielectric barrier film in the trenches, wherein the conformal dielectric barrier film comprises a low k dielectric material configured to serve as a barrier against a wet etching chemistry used in forming the air gaps in the first dielectric layer, depositing a metallic diffusion barrier film over the conformal low k dielectric layer, and depositing a conductive material to fill the trenches.
    Type: Application
    Filed: October 9, 2007
    Publication date: April 9, 2009
    Inventors: Li-Qun Xia, Huiwen Xu, Mihaela Balseanu, Meiyee (Maggie Le) Shek, Derek R. Witty, Hichem M'Saad
  • Publication number: 20090087977
    Abstract: The present invention generally provides apparatus and method for processing a semiconductor substrate. Particularly, embodiments of the present invention relate to a method and apparatus for forming semiconductor devices having a conformal silicon oxide layer formed at low temperature. One embodiment of the present invention provides a method for forming a semiconductor gate structure. The method comprises forming a gate stack on a semiconductor substrate, forming a conformal silicon oxide layer on the semiconductor substrate using a low temperature cyclic method, and forming a spacer layer on the conformal silicon oxide layer.
    Type: Application
    Filed: September 30, 2008
    Publication date: April 2, 2009
    Inventors: MATTHEW SPULLER, Melody Agustin, Meiyee (Maggie Le) Shek, Li-Qun Xia, Reza Arghavani
  • Publication number: 20070249998
    Abstract: Devices, systems and methods for removing foreign bodies within a body lumen are disclosed. An unfolding balloon catheter may include an elongated shaft having an intussuscepting balloon that can be actuated within a body lumen to capture and retrieve an intravascular device. The balloon may be configured to radially and/or axially expand when inflated, enveloping the intravascular device. In certain embodiments, the balloon may be formed by folding the ends of a distensible member inwardly, and then bonding the ends of the distensible member to the elongated shaft to form an expandable sleeve. An adhesive layer located along a portion of the elongated shaft may be used to temporarily secure the balloon to the elongated shaft.
    Type: Application
    Filed: June 28, 2007
    Publication date: October 25, 2007
    Applicant: BOSTON SCIENTIFIC SCIMED, INC.
    Inventors: Ajitkumar Nair, Kamal Ramzipoor, Tra Ngo, Hieu Nguyen, Maggie Le
  • Publication number: 20050085826
    Abstract: Devices, systems and methods for removing foreign bodies within a body lumen are disclosed. An unfolding balloon catheter may include an elongated shaft having an intussuscepting balloon that can be actuated within a body lumen to capture and retrieve an intravascular device. The balloon may be configured to radially and/or axially expand when inflated, enveloping the intravascular device. In certain embodiments, the balloon may be formed by folding the ends of a distensible member inwardly, and then bonding the ends of the distensible member to the elongated shaft to form an expandable sleeve. An adhesive layer located along a portion of the elongated shaft may be used to temporarily secure the balloon to the elongated shaft.
    Type: Application
    Filed: October 21, 2003
    Publication date: April 21, 2005
    Inventors: Ajitkumar Nair, Kamal Ramzipoor, Tra Ngo, Hieu Nguyen, Maggie Le
  • Patent number: 6656840
    Abstract: A method for forming a microelectronics device is disclosed. In one embodiment, the method includes depositing a conductive structure on a substrate. A first layer comprising silicon and nitrogen is formed on the substrate. A second layer comprising silicon and nitrogen is then formed on the first layer. The nitrogen to silicon ratio in the first layer is greater than the nitrogen to silicon ratio in the second layer.
    Type: Grant
    Filed: April 29, 2002
    Date of Patent: December 2, 2003
    Assignee: Applied Materials Inc.
    Inventors: Nagarajan Rajagopalan, Joe Feng, Christopher S Ngai, Meiyee (Maggie Le) Shek, Suketu A Parikh, Linh H Thanh