Patents by Inventor Magnus Aslund

Magnus Aslund has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9757082
    Abstract: An x-ray imaging system includes an x-ray source, an x-ray detector including a plurality of detector strips arranged in a first direction of the x-ray detector. Each detector strip includes a plurality of detector pixels arranged in a second direction of the x-ray detector. A phase grating and a plurality of analyzer gratings including grating slits are disposed between the x-ray source and detectors. The x-ray source and the x-ray detector are adapted to perform a scanning movement in relation to an object in the first direction, in order to scan the object. Each of the plurality of analyzer gratings is arranged in association with a respective detector strip with the grating slits arranged in the second direction. The grating slits of the analyzer gratings of the detector strips are offset relative to each other in the second direction.
    Type: Grant
    Filed: July 15, 2016
    Date of Patent: September 12, 2017
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Erik Fredenberg, Magnus Aslund
  • Publication number: 20160324496
    Abstract: An x-ray imaging system includes an x-ray source, an x-ray detector including a plurality of detector strips arranged in a first direction of the x-ray detector. Each detector strip includes a plurality of detector pixels arranged in a second direction of the x-ray detector. A phase grating and a plurality of analyzer gratings including grating slits are disposed between the x-ray source and detectors. The x-ray source and the x-ray detector are adapted to perform a scanning movement in relation to an object in the first direction, in order to scan the object. Each of the plurality of analyzer gratings is arranged in association with a respective detector strip with the grating slits arranged in the second direction. The grating slits of the analyzer gratings of the detector strips are offset relative to each other in the second direction.
    Type: Application
    Filed: July 15, 2016
    Publication date: November 10, 2016
    Inventors: Erik FREDENBERG, Magnus ASLUND
  • Patent number: 9486175
    Abstract: An x-ray imaging system includes an x-ray source, an x-ray detector including a plurality of detector strips arranged in a first direction of the x-ray detector. Each detector strip includes a plurality of detector pixels arranged in a second direction of the x-ray detector. A phase grating and a plurality of analyzer gratings including grating slits are disposed between the x-ray source and detectors. The x-ray source and the x-ray detector are adapted to perform a scanning movement in relation to an object in the first direction, in order to scan the object. Each of the plurality of analyzer gratings (162) is arranged in association with a respective detector strip with the grating slits arranged in the second direction. The grating slits of the analyzer gratings of the detector strips are offset relative to each other in the second direction.
    Type: Grant
    Filed: June 27, 2012
    Date of Patent: November 8, 2016
    Assignee: KONINKLIJKE PHILIPS N.V.
    Inventors: Erik Fredenberg, Magnus Aslund
  • Publication number: 20140146945
    Abstract: An x-ray imaging system comprising an x-ray source, an x-ray detector comprising a plurality of detector strips arranged in a first direction of the x-ray detector, each detector strip further comprising a plurality of detector pixels arranged in a second direction of the x-ray detector; a phase grating; a plurality of analyzer gratings comprising grating slits; a phase grating, and a plurality of analyzer gratings comprising grating slits, wherein the x-ray source and the x-ray detector are adapted to perform a scanning movement in relation to an object in the first direction, in order to scan the object, wherein the analyzer gratings are arranged between the x-ray source and the x-ray detector, wherein each of the plurality of analyzer gratings (162) is arranged in association with a respective detector strip with the grating slits arranged in the second direction and wherein the grating slits of the analyzer gratings of the detector strips are displaced relative to each other in the second direction.
    Type: Application
    Filed: June 27, 2012
    Publication date: May 29, 2014
    Applicant: KONINKLIJKE PHILIPS N.V.
    Inventors: Erik Fredenberg, Magnus Aslund
  • Patent number: 7496176
    Abstract: The present invention relates to a method and arrangement for controlling exposure in an e-ray apparatus, for depicting an object. The apparatus comprises an x-ray source and a displaceable detector being arranged to move with a controllable speed across an image exposure area. The method comprises the step of: acquiring a signal relating to photons incident on at least a part of the detector, comparing said acquired signal with a target value, and controlling the speed of detector, displacement with respect to the result of the comparison.
    Type: Grant
    Filed: February 14, 2005
    Date of Patent: February 24, 2009
    Assignee: Sectra Mamea
    Inventor: Magnus Aslund
  • Publication number: 20070165781
    Abstract: The present invention relates to a method and arrangement for controlling exposure in an e-ray apparatus, for depicting an object. The apparatus comprises an x-ray source and a displaceable detector being arranged to move with a controllable speed across an image exposure area. The method comprises the step of: acquiring a signal relating to photons incident on at least a part of the detector, comparing said acquired signal with a target value, and controlling the speed of detector, displacement with respect to the result of the comparison.
    Type: Application
    Filed: February 14, 2005
    Publication date: July 19, 2007
    Applicant: SECTRA MAMEA AB
    Inventor: Magnus Aslund