Patents by Inventor Mahamud Khandokar

Mahamud Khandokar has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7249337
    Abstract: A method for enhancing the high frequency signal integrity performance of a printed circuit board (PCB) or backplane is provided. According to one embodiment of the present invention, the method involves the use of S-parameters as the primary cost factors associated with an iterative process to optimize the physical dimensions and shape of a single or a collection of vias within the PCB or backplane. In certain embodiments, the process involves the representation of the via components as equivalent lumped series admittances and impedances, as well as, RLGC sub-circuits upon which basic circuit analysis is performed to optimize secondary characteristics, for example, the maximization of the sub-circuit's resistance and/or the minimization of the sub-circuit's capacitance. The iterative process involves the alteration of physical dimensions and the shape of the via components such that the secondary characteristics are optimized.
    Type: Grant
    Filed: March 6, 2003
    Date of Patent: July 24, 2007
    Assignee: Sanmina-SCI Corporation
    Inventors: Franz Gisin, William Panos, Mahamud Khandokar
  • Publication number: 20040176938
    Abstract: A method for enhancing the high frequency signal integrity performance of a printed circuit board (PCB) or backplane is provided. The method may involve the use of the S-parameters as the primary cost factors associated with an iterative process to optimize the physical dimensions and shape of a single or a collection of vias within the PCB or backplane. Such process involves the representation of the via components as equivalent lumped series admittances and impedances, as well as, RLGC sub-circuits upon which basic circuit analysis may be performed to optimize secondary characteristics, for example, the maximization of the sub-circuit's resistance and/or the minimization of the subcircuit's capacitance. The iterative process involves the alteration of physical dimensions and the shape of the via components such that the secondary characteristics are optimized.
    Type: Application
    Filed: March 6, 2003
    Publication date: September 9, 2004
    Applicant: Sanmina-SCI Corporation
    Inventors: Franz Gisin, William Panos, Mahamud Khandokar