Abstract: Die configuration types are provided that may be used together with other instances of the design to create multi die modules.

Abstract: An electronic device includes first and second external conductive pads coupled to route a first signal and third and fourth external conductive pads. The third and the fourth external conductive pads are between the first and the second external conductive pads on a surface of the electronic device.

Abstract: An integrated circuit includes first external conductive pads, second external conductive pads, and third external conductive pads. The second external conductive pads are between the first external conductive pads and the third external conductive pads. Repair group circuitry is configurable to shift signal transmission away from one of the first external conductive pads to one of the third external conductive pads if the one of the first external conductive pads has a defect.

Abstract: An active interconnection device has a repeater circuit that includes a storage circuit. The storage circuit is coupled to store a configuration bit for configuring the repeater circuit to transmit a signal between a first integrated circuit die and a second integrated circuit die. The storage circuit is coupled to receive the configuration bit through a conductor during a configuration mode. A buffer circuit in the repeater circuit is configurable to transmit the signal through the conductor during a transmission mode in response to the configuration bit.

Abstract: A circuit system includes a support device having an interconnection conductor. The circuit system also includes first, second, and third integrated circuits that are mounted on the support device. The interconnection conductor couples the first integrated circuit to the third integrated circuit. The second integrated circuit is between the first integrated circuit and the third integrated circuit.

Abstract: A circuit system includes a support device that has first and second conductors. The circuit system also includes first, second, and third integrated circuits that are coupled to the support device. The second integrated circuit includes a peripheral region. The peripheral region includes a third conductor coupled between the first and the second conductors. The circuit system is configured to transmit a signal from the first integrated circuit through the first conductor, the third conductor, and the second conductor to the third integrated circuit.

Abstract: An integrated circuit package includes a support device, first and second integrated circuits mounted on the support device, and a power jumper circuit selectable to couple a decoupling capacitor to one of a first power supply input of the first integrated circuit or a second power supply input of the second integrated circuit.

Abstract: A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

Abstract: Described is an low overhead method and apparatus to reconfigure a pair of buffered interconnect links to operate in one of these three modes—first mode (e.g., bandwidth mode), second mode (e.g., latency mode), and third mode (e.g., energy mode). In bandwidth mode, each link in the pair buffered interconnect links carries a unique signal from source to destination. In latency mode, both links in the pair carry the same signal from source to destination, where one link in the pair is “primary” and other is called the “assist”. Temporal alignment of transitions in this pair of buffered interconnects reduces the effective capacitance of primary, thereby reducing delay or latency. In energy mode, one link in the pair, the primary, alone carries a signal, while the other link in the pair is idle. An idle neighbor on one side reduces energy consumption of the primary.

Abstract: A circuit system includes a first integrated circuit and a second integrated circuit that includes a boot management controller circuit. The boot management controller circuit provides boot code to the first integrated circuit in response to the circuit system powering up. The first integrated circuit performs a boot operation using the boot code received from the boot management controller circuit.

Abstract: A processing integrated circuit includes a processing core comprising hard logic circuits and a programmable interface circuit configurable to exchange signals between an external terminal of the processing integrated circuit and the hard logic circuits in the processing core.

Abstract: An embodiment of an apparatus comprises one or more fractional width fused multiply-accumulate (FMA) circuits configured as a shared Wallace tree, and circuitry coupled to the one or more fractional width FMA circuits to provide one or more fractional width FMA operations through the one or more fractional width FMA circuits. Other embodiments are disclosed and claimed.

Abstract: A circuit system includes an accelerator circuit and a compute circuit. The accelerator circuit generates a request in response to receiving packets of data. The accelerator circuit generates an indication of a low power state based on a reduced number of the packets of data being received. The compute circuit performs a processing operation for the accelerator circuit using the packets of data in response to receiving the request. The compute circuit comprises a power management circuit that decreases a supply voltage in the compute circuit and decreases a frequency of a clock signal in the compute circuit in response to the indication of the low power state from the accelerator circuit.

Abstract: An integrated circuit includes logic circuits, first buffer circuits coupled to external ports of the integrated circuit, second buffer circuits that are each coupled to one of the logic circuits, and a crossbar circuit coupled to the first and the second buffer circuits. The crossbar circuit is configurable to provide data transfer between the logic circuits and the external ports of the integrated circuit through the first buffer circuits and the second buffer circuits.

Abstract: A circuit system includes a processing integrated circuit die comprising a first die-to-die interface circuit and a memory interface circuit. The circuit system also includes a second integrated circuit die comprising a second die-to-die interface circuit and a compute circuit that performs computations for the processing integrated circuit die. The first and the second die-to-die interface circuits are coupled together. The compute circuit is coupled to exchange information with the memory interface circuit through the first and the second die-to-die interface circuits.

Abstract: A circuit system includes a processing circuit, an accelerator circuit, and a buffer circuit that stores packets of data and that is coupled to the processing circuit and to the accelerator circuit. The buffer circuit functions as a crossbar circuit by allowing each of the accelerator circuit and the processing circuit to access at least one of the packets of data stored in the buffer circuit during access to another one of the packets of data stored in the buffer circuit.

Abstract: A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.

Abstract: A processor package module comprises a substrate, one or more compute die mounted to the substrate, and one or more photonic die mounted to the substrate. The photonic die have N optical I/O links to transmit and receive optical I/O signals using a plurality of virtual optical channels, the N optical I/O links corresponding to different types of I/O interfaces excluding power and ground I/O. The substrate is mounted into a socket that support the power and ground I/O and electrical connections between the one or more compute die and the one or more photonic die.

Abstract: A processor having a system on a chip (SOC) architecture comprises one or more central processing units (CPUs) comprising multiple cores. An optical Compute Express Link (CXL) communication path incorporating a logical optical CXL protocol stack path transmits and receives an optical bit stream directly after the link layer, bypassing multiple levels of the CXL protocol stack. A CXL interface controller is connected to the one or more CPUs to enable communication between the CPUs and one or more CXL devices over the optical CXL communication path.

Abstract: A fast Mux-D scan flip-flop is provided, which bypasses a scan multiplexer to a master keeper side path, removing delay overhead of a traditional Mux-D scan topology. The design is compatible with simple scan methodology of Mux-D scan, while preserving smaller area and small number of inputs/outputs. Since scan Mux is not in the forward critical path, circuit topology has similar high performance as level-sensitive scan flip-flop and can be easily converted into bare pass-gate version. The new fast Mux-D scan flip-flop combines the advantages of the conventional LSSD and Mux-D scan flip-flop, without the disadvantages of each.