Patents by Inventor Mahesh RAMACHANDRA

Mahesh RAMACHANDRA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • TEST SYSTEM FOR AN INTELLIGENT ELECTRONIC DEVICE IN AN ELECTRIC SUB-STATION
    Publication number: 20230393175
    Abstract: Test system for an intelligent electronic device in an electric sub-station. Examples of a test switch unit are described. Each test switch unit may be utilized for opening of the trip circuit, the shorting of the CT and subsequently isolation of the VT circuits, respectively. Once the trip circuits have been opened, and the CT/VT circuits have been shorted and isolated, respectively, the IED may be tested by providing the appropriate test signals.
    Type: Application
    Filed: August 21, 2023
    Publication date: December 7, 2023
    Inventors: Loganadhan V, Mahesh RAMACHANDRA, Manjunath AJ, Shambhulingappa S
  • Test system for an intelligent electronic device in an electric sub-station
    Patent number: 11761995
    Abstract: Test system for an intelligent electronic device in an electric sub-station. Examples of a test switch unit are described. Each test switch unit may be utilized for opening of the trip circuit, the shorting of the CT and subsequently isolation of the VT circuits, respectively. Once the trip circuits have been opened, and the CT/VT circuits have been shorted and isolated, respectively, the IED may be tested by providing the appropriate test signals.
    Type: Grant
    Filed: April 29, 2020
    Date of Patent: September 19, 2023
    Assignee: Hitachi Energy Switzerland AG
    Inventors: Loganadhan V, Mahesh Ramachandra, Manjunath Aj, Shambhulingappa S
  • TEST SYSTEM FOR AN INTELLIGENT ELECTRONIC DEVICE IN AN ELECTRIC SUB-STATION
    Publication number: 20220221495
    Abstract: Test system for an intelligent electronic device in an electric sub-station. Examples of a test switch unit are described. Each test switch unit may be utilized for opening of the trip circuit, the shorting of the CT and subsequently isolation of the VT circuits, respectively. Once the trip circuits have been opened, and the CT/VT circuits have been shorted and isolated, respectively, the IED may be tested by providing the appropriate test signals.
    Type: Application
    Filed: April 29, 2020
    Publication date: July 14, 2022
    Inventors: Loganadhan V, Mahesh RAMACHANDRA, Manjunath AJ, Shambhulingappa S