Abstract: In examples, a package comprises a semiconductor die having a device side and a bond pad on the device side, a conductive terminal exposed to an exterior of the package, and an electrical fuse. The electrical fuse comprises a conductive ball coupled to the bond pad, and a bond wire coupled to the conductive terminal. The bond wire is stitch-bonded to the conductive ball.

Abstract: In examples, a package comprises a semiconductor die having a device side and a bond pad on the device side, a conductive terminal exposed to an exterior of the package, and an electrical fuse. The electrical fuse comprises a conductive ball coupled to the bond pad, and a bond wire coupled to the conductive terminal. The bond wire is stitch-bonded to the conductive ball.

Abstract: In one aspect of the disclosure, an integrated circuit is disclosed. The integrated circuit includes a first FET device formed on a substrate having a first source, a first gate, and a first channel. The first channel is formed in the substrate, connecting the first source to a common drain. The integrated circuit also includes a second FET device formed on the substrate having a second source, a second gate, and a second channel. The second channel is formed in the substrate, connecting the second source to the common drain. A trench is formed in the substrate between the first channel and the second channel.