Abstract: A spectrometer with a Schmidt reflector is described. The spectrometer may include a Schmidt corrector and a dispersive element as separate components. Alternatively, the Schmidt corrector and dispersive element may be combined into a single optical component. The spectrometer may further include a field-flattener lens.

Abstract: Certain configurations are described herein of an optical spectrometer and instruments including an optical spectrometer. In some instances, the optical spectrometer is configured to spatially separate provided wavelengths of light to permit detection or imaging of each provided wavelength of light. Improved sensitivities and detection limits may be achieved using the optical spectrometers described herein.

Abstract: A spectrometer with a Schmidt reflector is described. The spectrometer may include a Schmidt corrector and a dispersive element as separate components. Alternatively, the Schmidt corrector and dispersive element may be combined into a single optical component. The spectrometer may further include a field-flattener lens.

Abstract: An echelle spectrometer includes a slit opening for incoming light, a collimator which collimates a diverging beam of light generated through the slit, a reflective echelle grating which disperses the collimated light along a first dimension; a cross-disperser which disperses at least a portion of the collimated light in a second dimension orthogonal to the first dimension to create a two-dimensional spectral field-of-view; and an imaging system which images the two-dimensional spectral field-of-view onto a detector; wherein the imaging system comprises primary, secondary, and tertiary tilted mirrors, where each of the tilted mirrors comprises a freeform, rotationally non-symmetric surface shape.

Abstract: A spectrometer with an unobstructed, Schmidt reflector is described. The spectrometer may include a Schmidt corrector and a dispersive element as separate components. Alternatively, the Schmidt corrector and dispersive element may be combined into a single optical component. The spectrometer may further include a field-flattener lens.

Abstract: An echelle spectrometer includes a slit opening for incoming light, a collimator which collimates a diverging beam of light generated through the slit, a reflective echelle grating which disperses the collimated light along a first dimension; a cross-disperser which disperses at least a portion of the collimated light in a second dimension orthogonal to the first dimension to create a two-dimensional spectral field-of-view; and an imaging system which images the two- dimensional spectral field-of-view onto a detector; wherein the imaging system comprises primary, secondary, and tertiary tilted mirrors, where each of the tilted mirrors comprises a freeform, rotationally non-symmetric surface shape.

Abstract: Certain configurations are described herein of an optical spectrometer and instruments including an optical spectrometer. In some instances, the optical spectrometer is configured to spatially separate provided wavelengths of light to permit detection or imaging of each provided wavelength of light. Improved sensitivities and detection limits may be achieved using the optical spectrometers described herein.

Abstract: Certain aspects, configurations, embodiments, and examples of a spectrometer with a compact design are described. In some implementations, the spectrometers according to the present disclosure may be used for optical emission spectroscopy (OES). The spectrometer architecture and imager described herein allows a single detector, compact, and high-throughput spectrometer. One or more aspects include an Echelle grating in a spectrometer that reuses optical surfaces to separate wavelengths of light. For example, in one or more aspects, a reflective triplet telescope acts as both a collimator and imager. By reusing optical components, the relative size of the spectrometer may be reduced.

Abstract: Certain configurations are described herein of an optical spectrometer and instruments including an optical spectrometer. In some instances, the optical spectrometer is configured to spatially separate provided wavelengths of light to permit detection or imaging of each provided wavelength of light. Improved sensitivities and detection limits may be achieved using the optical spectrometers described herein.

Abstract: Certain aspects, configurations, embodiments, and examples of a spectrometer with a compact design are described. In some implementations, the spectrometers according to the present disclosure may be used for optical emission spectroscopy (OES). The spectrometer architecture and imager described herein allows a single detector, compact, and high-throughput spectrometer. One or more aspects include an Echelle grating in a spectrometer that reuses optical surfaces to separate wavelengths of light. For example, in one or more aspects, a reflective triplet telescope acts as both a collimator and imager. By reusing optical components, the relative size of the spectrometer may be reduced.

Abstract: A spectrometer with an unobstructed, Schmidt reflector is described. The spectrometer may include a Schmidt corrector and a dispersive element as separate components. Alternatively, the Schmidt corrector and dispersive element may be combined into a single optical component. The spectrometer may further include a field-flattener lens.

Abstract: Certain configurations are described herein of an optical spectrometer and instruments including an optical spectrometer. In some instances, the optical spectrometer is configured to spatially separate provided wavelengths of light to permit detection or imaging of each provided wavelength of light. Improved sensitivities and detection limits may be achieved using the optical spectrometers described herein.