Patents by Inventor Makiko Masutomi

Makiko Masutomi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Optical measuring device and method, and nanoparticle measuring method and device
    Patent number: 7760356
    Abstract: The invention provides an optical measuring device capable of performing measuring using a transient diffraction grating by only adjusting probe light, and a nanoparticle measuring device using the same principle as the optical measuring device.
    Type: Grant
    Filed: July 15, 2005
    Date of Patent: July 20, 2010
    Assignee: Shimadzu Corporation
    Inventors: Naoji Moriya, Shinichro Totoki, Yuzo Nagumo, Yukihisa Wada, Naofumi Sakauchi, Fujio Inoue, Masahiro Takebe, Makiko Masutomi
  • Optical Measuring Device and Method, and Nanoparticle Measuring Method and Device
    Publication number: 20080192252
    Abstract: The invention provides an optical measuring device capable of performing measuring using a transient diffraction grating by only adjusting probe light, and a nanoparticle measuring device using the same principle as the optical measuring device.
    Type: Application
    Filed: July 15, 2005
    Publication date: August 14, 2008
    Applicant: SHIMADZU CORPORATION
    Inventors: Naoji Moriya, Shinichiro Totoki, Yuzo Nagumo, Yukihisa Wada, Naofumi Sakauchi, Fujio Inoue, Masahiro Takebe, Makiko Masutomi