Patents by Inventor Makiko Nagashima

Makiko Nagashima has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9805461
    Abstract: A reference density profile is generated in an outer circumference direction of a pipe having a reference welded portion on the basis of a reference fluoroscopic image generated from a radiation detection medium when a radiation source is disposed on a central axis of the pipe. A weld inspection density profile is generated in an outer circumference direction of a pipe having an inspection target welded portion on the basis of a weld inspection fluoroscopic image. On the basis of the reference density profile and the weld inspection density profile, density correction information is calculated. The density correction information is for correcting density irregularities in the weld inspection fluoroscopic image in the outer circumference direction of the pipe. On the basis of the density correction information, the density irregularities in the weld inspection fluoroscopic image arc corrected.
    Type: Grant
    Filed: November 10, 2016
    Date of Patent: October 31, 2017
    Assignee: FUJIFILM Corporation
    Inventors: Makiko Nagashima, Yasunori Narukawa
  • Publication number: 20170061598
    Abstract: A reference density profile is generated in an outer circumference direction of a pipe having a reference welded portion on the basis of a reference fluoroscopic image generated from a radiation detection medium when a radiation source is disposed on a central axis of the pipe. A weld inspection density profile is generated in an outer circumference direction of a pipe having an inspection target welded portion on the basis of a weld inspection fluoroscopic image. On the basis of the reference density profile and the weld inspection density profile, density correction information is calculated. The density correction information is for correcting density irregularities in the weld inspection fluoroscopic image in the outer circumference direction of the pipe. On the basis of the density correction information, the density irregularities in the weld inspection fluoroscopic image arc corrected.
    Type: Application
    Filed: November 10, 2016
    Publication date: March 2, 2017
    Applicant: FUJIFILM Corporation
    Inventors: MAKIKO NAGASHIMA, YASUNORI NARUKAWA
  • Patent number: 9524546
    Abstract: A reference density profile is generated in an outer circumference direction of a pipe having a reference welded portion on the basis of a reference fluoroscopic image generated from a radiation detection medium when a radiation source is disposed on a central axis of the pipe. A weld inspection density profile is generated in an outer circumference direction of a pipe having an inspection target welded portion on the basis of a weld inspection fluoroscopic image. On the basis of the reference density profile and the weld inspection density profile, density correction information is calculated. The density correction information is for correcting density irregularities in the weld inspection fluoroscopic image in the outer circumference direction of the pipe. On the basis of the density correction information, the density irregularities in the weld inspection fluoroscopic image are corrected.
    Type: Grant
    Filed: May 6, 2015
    Date of Patent: December 20, 2016
    Assignee: FUJIFILM Corporation
    Inventors: Makiko Nagashima, Yasunori Narukawa
  • Publication number: 20150235357
    Abstract: A reference density profile is generated in an outer circumference direction of a pipe having a reference welded portion on the basis of a reference fluoroscopic image generated from a radiation detection medium when a radiation source is disposed on a central axis of the pipe. A weld inspection density profile is generated in an outer circumference direction of a pipe having an inspection target welded portion on the basis of a weld inspection fluoroscopic image. On the basis of the reference density profile and the weld inspection density profile, density correction information is calculated. The density correction information is for correcting density irregularities in the weld inspection fluoroscopic image in the outer circumference direction of the pipe. On the basis of the density correction information, the density irregularities in the weld inspection fluoroscopic image are corrected.
    Type: Application
    Filed: May 6, 2015
    Publication date: August 20, 2015
    Inventors: MAKIKO NAGASHIMA, YASUNORI NARUKAWA
  • Patent number: 8737682
    Abstract: A pipe thickness measuring device 10 is provided, including a luminance profile obtaining unit obtaining luminance profiles of radiographic images of a pipe to be measured in a direction crossing the pipe, an outer diameter point detecting unit detecting outer diameter points of the pipe based on the obtained luminance profiles, a region setting unit setting a predetermined region inside two of the outer diameter points of the pipe detected by the outer diameter point detecting unit, and an inner diameter point detecting unit detecting inner diameter points of the pipe based on a luminance profile corresponding to the set predetermined region from among the luminance profiles obtained by the luminance profile obtaining unit.
    Type: Grant
    Filed: February 21, 2013
    Date of Patent: May 27, 2014
    Assignee: FUJIFILM Corporation
    Inventors: Yoshikazu Matsumoto, Makiko Nagashima, Kouji Yamaguchi
  • Publication number: 20020045267
    Abstract: A protein dyeing and detecting method includes steps of fixing a protein electrophoresed on a gel on the gel using a fixing solution, dyeing the fixed protein with fluorescent dye for dyeing a protein which has a property of mainly acting on sodium dodecyl sulfide (SDS)-protein complex to dye a protein, irradiating the dyed protein with a stimulating ray and detecting fluorescent light emitted from the protein upon being irradiated to produce a fluorescent image of a protein, the fluorescent dye for dyeing a protein being most effectively stimulated with a stimulating ray having a wavelength between 440 nm to 500 nm or a wavelength between 510 nm to 580 nm and emitting fluorescent light whose peak wavelength ranges from 560 nm to 620 nm or from 600 nm to 660 nm. According to the thus constituted protein dyeing and detecting method, it is possible to produce a fluorescent image of a protein having high sharpness and low background noise.
    Type: Application
    Filed: October 22, 2001
    Publication date: April 18, 2002
    Inventors: Tohru Tsuchiya, Makiko Nagashima
  • Patent number: 5736745
    Abstract: A sample placement portion is fixed to a frame. A stage and a cylindrical piezoelectric element are attached to the sample placement portion, and on this piezoelectric element, a sample (i.e., a semiconductor wafer) is positioned. A light collecting portion and a light receiving portion integrated together are attached slidably to frame for detecting the number and locations of contaminants. In addition, an analyzing portion for analyzing the types of the contaminants is slidably attached to the frame. Accordingly, it is made possible to reduce the size of the apparatus and to perform a highly reliable evaluation of the contamination.
    Type: Grant
    Filed: April 4, 1996
    Date of Patent: April 7, 1998
    Assignees: Mitsubishi Denki Kabushiki Kaisha, Ryoden Semiconductor System Engineering Corporation
    Inventors: Makiko Nagashima, Tadashi Nishioka