Abstract: Provided is a heater including: a substrate that has electrical conductivity; a first insulation portion that is provided on a first surface of the substrate, has an insulation property; at least one heat generation body that is provided on the first insulation portion; a second insulation portion that is provided on a second surface of the substrate which is opposite to the first surface, has an insulation property; at least one detection unit that is provided on at least one of the first insulation portion and the second insulation portion; and a first wiring which is provided on at least one of the first insulation portion and the second insulation portion, and in which one end is electrically connected to one terminal of the detection unit and the other end is electrically connected to the substrate having the electrical conductivity.

Abstract: An exclusion module (21) is configured to calculate a coating amount of each component whose measurement element is not contained in the base layers, for each of corresponding measurement lines, on an assumption that that component solely makes up the thin film and to adopt a maximum coating amount as an initial value of the coating amount of that component; and to calculate a coating amount of each component whose measurement element is contained in the base layers, for each of corresponding measurement lines, on the basis of initial values of coating amounts of individual components whose measurement elements are not contained in the base layers, if calculation results for all the corresponding measurement lines give errors, to exclude that component from analysis targets as an unquantifiable component, and in other cases, to adopt a maximum coating amount as an initial value of the coating amount of that component.

Abstract: A rotor 10 rotatable around a predetermined centerline direction includes: a columnar magnet 12; and a first rotating shaft 70 with a first columnar part 71 and a cylinder-shaped first cylindrical part 72 covering a part of a first outer circumferential surface 913 of the magnet 12, wherein the first outer circumferential surface 913 of the magnet 12 and a first inner circumferential surface 721 of the first cylindrical part 72 of the first rotating shaft 70 are joined, and a first end surface 912 of the magnet 12 and a first end surface 731 of the first rotating shaft 70 are not joined.

Abstract: An exclusion module (21) is configured to calculate a coating amount of each component whose measurement element is not contained in the base layers, for each of corresponding measurement lines, on an assumption that that component solely makes up the thin film and to adopt a maximum coating amount as an initial value of the coating amount of that component; and to calculate a coating amount of each component whose measurement element is contained in the base layers, for each of corresponding measurement lines, on the basis of initial values of coating amounts of individual components whose measurement elements are not contained in the base layers, if calculation results for all the corresponding measurement lines give errors, to exclude that component from analysis targets as an unquantifiable component, and in other cases, to adopt a maximum coating amount as an initial value of the coating amount of that component.

Abstract: Provided are a total reflection X-ray fluorescence spectrometer and an estimation method which are capable of easily and quickly estimating whether contamination exists on a substrate through use of a machine learning device. The total reflection X-ray fluorescence spectrometer includes: a spectrum acquisition unit configured to acquire a spectrum; and a learning unit which includes an estimation unit configured to generate estimation data on an element contained in contamination on a surface of a substrate in response to input of the spectrum, and for which learning by the estimation unit has been executed based on teacher data including the spectrum for learning and data on the element contained in the contamination on the surface of the substrate which has been used to acquire the spectrum for learning and the estimation data generated when the spectrum for learning is input to the estimation unit.

Abstract: Provided are a total reflection X-ray fluorescence spectrometer and an estimation method which are capable of easily and quickly estimating whether contamination exists on a substrate through use of a machine learning device. The total reflection X-ray fluorescence spectrometer includes: a spectrum acquisition unit configured to acquire a spectrum; and a learning unit which includes an estimation unit configured to generate estimation data on an element contained in contamination on a surface of a substrate in response to input of the spectrum, and for which learning by the estimation unit has been executed based on teacher data including the spectrum for learning and data on the element contained in the contamination on the surface of the substrate which has been used to acquire the spectrum for learning and the estimation data generated when the spectrum for learning is input to the estimation unit.

Abstract: A measurement line evaluation unit (23): calculates, for all of specified measurement lines, estimated measured intensities by theoretical calculation on the basis of a composition and/or a thickness specified for a thin film; changes, by a predetermined amount, only an estimated measured intensity of one measurement line, and obtains quantitative values of the composition and/or the thickness of the thin film after change of the estimated measured intensity, for each changed measurement line, by a fundamental parameter method; and estimates a quantitative error and/or determines possibility of analysis, on the basis of the obtained quantitative values and the specified composition and/or the specified thickness.

Abstract: A measurement line evaluation unit (23): calculates, for all of specified measurement lines, estimated measured intensities by theoretical calculation on the basis of a composition and/or a thickness specified for a thin film; changes, by a predetermined amount, only an estimated measured intensity of one measurement line, and obtains quantitative values of the composition and/or the thickness of the thin film after change of the estimated measured intensity, for each changed measurement line, by a fundamental parameter method; and estimates a quantitative error and/or determines possibility of analysis, on the basis of the obtained quantitative values and the specified composition and/or the specified thickness.

Abstract: A method for forming an electrode of a solar battery on an electrode forming face of a semiconductor substrate, comprises: applying a resin containing a conductor material to be the electrode onto an electrode forming region of the electrode forming face; causing a pattern transfer member, on which a reverse pattern obtained by reversing a pattern of the electrode is formed, to face the electrode forming face, and registering the pattern transfer member on a position in which the electrode is to be formed in the electrode forming face; pressing the pattern transfer member against the electrode forming face to transfer the electrode pattern to the resin containing the conductor material; separating the pattern transfer member from the resin containing the conductor material; and baking the electrode pattern transferred to the resin containing the conductor material to form the electrode on the electrode forming face of the substrate.

Abstract: A method for forming an electrode of a solar battery on an electrode forming face of a semiconductor substrate, comprises: applying a resin containing a conductor material to be the electrode onto an electrode forming region of the electrode forming face; causing a pattern transfer member, on which a reverse pattern obtained by reversing a pattern of the electrode is formed, to face the electrode forming face, and registering the pattern transfer member on a position in which the electrode is to be formed in the electrode forming face; pressing the pattern transfer member against the electrode forming face to transfer the electrode pattern to the resin containing the conductor material; separating the pattern transfer member from the resin containing the conductor material; and baking the electrode pattern transferred to the resin containing the conductor material to form the electrode on the electrode forming face of the substrate.

Abstract: Provided is a portable wireless device wherein deterioration of antenna performance is eliminated, in the case where the portable wireless device is provided with a sliding mechanism wherein a metal member is used. A sliding unit (150) includes a first sliding member (103) and a second sliding member (104), and the first case (101) and the second case (102) are slidably connected. The first sliding member (103) is in a state of metal plate, and slides with the first case (103). The second sliding member (104) is in a state of metal plate and insulated from the first sliding member (103), and slides with the second case (102) on the first sliding member (103).

Abstract: It is an object of the present invention to provide an opening/closing hinge device which can be produced simple in construction and inexpensive in production by reducing the number of the parts forming part of the mobile device and to provide a mobile device small in size, reduced in cost and sufficiently reliable in the hinged members. The second member is rotated with respect to the first member toward the opening operation direction through the movable cam (150) by the urging force of the urging means (170) when the operation cam (130) is displaced in the predetermined operation direction by the external operation force. The fixed guide member (110) has inclined guide portions (115) each inclined at an advance angle in a predetermined inclination direction with respect to the surface perpendicular to the guide center axis to have the second rotation cam (140) rotated around the guide center axis in response to the displacement of the second rotation cam (140) along the guide center axis.

Abstract: An X-ray fluorescence spectrometer for measuring the concentration of sulfur contained in a sample (S), by irradiating the sample (S) with primary X-rays from an X-ray tube (11), monochromating fluorescent X-rays emitted from the sample (S) with a spectroscopic device, and detecting monochromated fluorescent X-rays with an X-ray detector. The spectrometer includes the X-ray tube (11) having a target with an element including chromium, an X-ray filter (13) disposed on a path of travel of X-rays between the X-ray tube (11) and the sample (S) and having a predetermined transmittance for Cr—K? line from the X-ray tube (11) and made of a material which is an element of which absorption edges do not exist between energies of S—K? line and Cr—K? line, and a proportional counter (18) having a detector gas containing a neon gas or a helium gas.

Abstract: It is an object of the present invention to provide an opening/closing device which can be produced simple in construction and reduce the surface pressure of its cam portions, and a mobile phone which can be reduced in cost and sufficiently reliable in the hinged members by using the opening/closing device.

Abstract: It is an object of the present invention to provide an opening/closing hinge device which can be produced simple in construction and inexpensive in production by reducing the number of the parts forming part of the mobile device and to provide a mobile device small in size, reduced in cost and sufficiently reliable in the hinged members. The second member is rotated with respect to the first member toward the opening operation direction through the movable cam (150) by the urging force of the urging means (170) when the operation cam (130) is displaced in the predetermined operation direction by the external operation force. The fixed guide member (110) has inclined guide portions (115) each inclined at an advance angle in a predetermined inclination direction with respect to the surface perpendicular to the guide center axis to have the second rotation cam (140) rotated around the guide center axis in response to the displacement of the second rotation cam (140) along the guide center axis.

Abstract: The present invention is to provide a method for forming a multi-layer coating film, which can combine a pre-treating step conducted for a metal substrate, before electrodeposition coating, and an electrodeposition coating step. The method comprises: a step of dipping a material to be coated in an aqueous coating composition comprising (A) a rare earth metal compound, (B) a base resin having a cationic group, and (C) a curing agent, wherein a content of the rare earth metal compound (A) in the aqueous coating composition is limited to specific range; a pre-treating step of applying a voltage of less than 50 V in the aqueous coating composition, wherein the material to be coated is used as a cathode; and an electrodeposition coating of applying a voltage of 50 to 450 V in the aqueous coating composition, wherein the material to be coated is used as a cathode.

Abstract: The present invention relates to a composite chemical conversion coating film containing a crystalline continuous coating film that is formed on a metal substrate. The present invention also relates to a process for forming a multiple layered coating film including (A) the first step of immersing an untreated metal substrate in an aqueous solution containing nitrate of a rare earth metal and forming a crystalline continuous coating film containing a rare earth metal compound with a deposition amount of 1 mg/m2 at lower limit and 110 mg/m2 at upper limit by cathode electrolysis and (B) the second step of coating an electrodeposition coating composition containing an organic acid or inorganic acid salt of a rare earth metal by cathode electrodeposition.

Abstract: An X-ray fluorescence spectrometer for measuring the concentration of sulfur contained in a sample (S), by irradiating the sample (S) with primary X-rays from an X-ray tube (11), monochromating fluorescent X-rays emitted from the sample (S) with a spectroscopic device, and detecting monochromated fluorescent X-rays with an X-ray detector. The spectrometer includes the X-ray tube (11) having a target with an element including chromium, an X-ray filter (13) disposed on a path of travel of X-rays between the X-ray tube (11) and the sample (S) and having a predetermined transmittance for Cr—K? line from the X-ray tube (11) and made of a material which is an element of which absorption edges do not exist between energies of S—K? line and Cr—K? line, and a proportional counter (18) having a detector gas containing a neon gas or a helium gas.

Abstract: A calculating device 10 for calculating the concentration of elements contained in a sample 13 based on the FP method is provided. The calculating device 10 is operable to assume a concentration of unmeasured elements as far as unmeasured elements, of which fluorescent X-rays are not measured, are concerned, and, also, to utilize, in place of the secondary X-rays emanating from the unmeasured elements contained in the sample, scattered X-rays of the primary X-rays at least equal in number to the number of the unmeasured elements, of which concentrations are assumed, and including scattered X-rays of different wavelengths before they are scattered from the sample.

Abstract: A calculating device 10 for calculating the concentration of elements contained in a sample 13 based on the FP method is provided. The calculating device 10 is operable to assume a concentration of unmeasured elements as far as unmeasured elements, of which fluorescent X-rays are not measured, are concerned, and, also, to utilize, in place of the secondary X-rays emanating from the unmeasured elements contained in the sample, scattered X-rays of the primary X-rays at least equal in number to the number of the unmeasured elements, of which concentrations are assumed, and including scattered X-rays of different wavelengths before they are scattered from the sample.