Abstract: There is a need for high-order frequency measurement without greatly increasing consumption currents and chip die sizes. A semiconductor device includes: an electric power measuring portion that performs electric power measurement; a high-order frequency measuring portion that performs high-order frequency measurement; and a clock controller that supplies an electric power measuring portion with a first clock signal at a first sampling frequency and supplies a high-order frequency measuring portion with a second clock signal at a second sampling frequency. The second sampling frequency is higher than the first sampling frequency.

Abstract: There is a need for high-order frequency measurement without greatly increasing consumption currents and chip die sizes. A semiconductor device includes: an electric power measuring portion that performs electric power measurement; a high-order frequency measuring portion that performs high-order frequency measurement; and a clock controller that supplies an electric power measuring portion with a first clock signal at a first sampling frequency and supplies a high-order frequency measuring portion with a second clock signal at a second sampling frequency. The second sampling frequency is higher than the first sampling frequency.

Abstract: Disclosed is a technology of generating an instruction set architecture (hereinafter, referred to as ‘ISA’) and a series of logic circuit configuration information of a processor for executing an application program from an application program described in a high-level language. The present invention also relates to a custom LSI development platform technology which can design, develop, and manufacture the application specific custom LSI in a short time by applying the generated ISA and logic circuit configuration information to a dynamic logic circuit reconfigurable processor. Furthermore, disclosed is a dynamically reconfigurable processor, which is reconfigurable using the generated logic circuit configuration information. Associated methods are also disclosed.