Patents by Inventor Malik Karman Sadiq

Malik Karman Sadiq has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240053280
    Abstract: Methods and systems for compensating systematic errors across a fleet of metrology systems based on a trained error evaluation model to improve matching of measurement results across the fleet are described herein. In one aspect, the error evaluation model is a machine learning based model trained based on a set of composite measurement matching signals. Composite measurement matching signals are generated based on measurement signals generated by each target measurement system and corresponding model-based measurement signals associated with each target measurement system and reference measurement system. The training data set also includes an indication of whether each target system is operating within specification, an indication of the values of system model parameter of each target system, or both.
    Type: Application
    Filed: August 2, 2023
    Publication date: February 15, 2024
    Inventors: Ming Di, Yih-Chung Chang, Xi Chen, Dawei Hu, Ce Xu, Bowei Huang, Igor Baskin, Mark Allen Neil, Tianhao Zhang, Malik Karman Sadiq, Shankar Krishnan, Jenching Tsai, Carlos L. Ygartua, Yao-Chung Tsao, Qiang Zhao