Abstract: A microscope is described, having an illumination light path for illuminating a sample or object and a viewing light path for viewing the sample. The microscope comprises an illumination light path focusing arrangement in the illumination light path, which comprises a scanning module for generating a substantially two-dimensional sample or object illumination region extending along an illumination direction of the illumination light path and a direction transverse thereto. The microscope further comprises an illumination region-confining device in the illumination light path for selectively illuminating a portion of the substantially two-dimensional object illumination region, wherein the portion of the substantially two-dimensional object illumination region is confined at least in the illumination direction and/or in the direction transversely thereto.

Abstract: A microscope is described, having an illumination light path for illuminating a sample or object and a viewing light path for viewing the sample. The microscope includes an illumination light path focussing arrangement in the illumination light path, defining a substantially two-dimensional sample or object illumination region extending along an illumination direction of the illumination light path and transversely thereto. The microscope further includes an illumination region-confining device in the illumination light path for selectively illuminating a portion of the substantially two-dimensional object illumination region, wherein the portion of the substantially two-dimensional object illumination region is confined at least in the illumination direction and/or in the direction transversely thereto.

Abstract: A microscope is described, having an illumination light path for illuminating a sample or object and a viewing light path for viewing the sample. The microscope includes an illumination light path focussing arrangement in the illumination light path, defining a substantially two-dimensional sample or object illumination region extending along an illumination direction of the illumination light path and transversely thereto. The microscope further includes an illumination region-confining device in the illumination light path for selectively illuminating a portion of the substantially two-dimensional object illumination region, wherein the portion of the substantially two-dimensional object illumination region is confined at least in the illumination direction and/or in the direction transversely thereto.

Abstract: Many points on a sample are tested simultaneously in parallel in an FCS method with multifocal illumination and/or detection.

Abstract: An apparatus for determining directional transport processes with a scanning microscope (100) is disclosed. A deflection means (5) for coupling in an illuminating light beam (3), and a scanning module (7) for graphical display of a specimen (15) on a peripheral device (27) and for positioning the illuminating light beam (3) for a specific time period on a location of the specimen (15), are provided. Provided between the deflection means (5) and the scanning module (7) is a device (65) that generates, from the illuminating light beam (3), at least two illuminating light beams (3a , 3b) that merge at a rotation point (70) of the scanning module (7). Each of the several illuminating light beams (3a, 3b) generates a respective focus (72) in the specimen (15), all the foci (72) being arranged in one plane (75).

Abstract: A method for measuring fluorescence correlations in the presence of slow signal fluctuations using a scanning microscope is disclosed. An illuminating light beam is positioned, with the scanning module, for a specific time period on a location of the specimen. Either a direct filtering is performed on the acquired data, or a Fourier analysis is performed. A suitable filter is then used to perform a filtering of the data subjected to the Fourier analysis. Lastly, a correlation function is calculated exclusively on the filtered data.

Abstract: Many points on a sample are tested simultaneously in parallel in an FCS method with multifocal illumination and/or detection.

Abstract: An apparatus for determining directional transport processes with a scanning microscope (100) is disclosed. A deflection means (5) for coupling in an illuminating light beam (3), and a scanning module (7) for graphical display of a specimen (15) on a peripheral device (27) and for positioning the illuminating light beam (3) for a specific time period on a location of the specimen (15), are provided. Provided between the deflection means (5) and the scanning module (7) is a device (65) that generates, from the illuminating light beam (3), at least two illuminating light beams (3a, 3b) that merge at a rotation point (70) of the scanning module (7). Each of the several illuminating light beams (3a, 3b) generates a respective focus (72) in the specimen (15), all the foci (72) being arranged in one plane (75).

Abstract: A method for measuring fluorescence correlations in the presence of slow signal fluctuations using a scanning microscope is disclosed. An illuminating light beam is positioned, with the scanning module, for a specific time period on a location of the specimen. Either a direct filtering is performed on the acquired data, or a Fourier analysis is performed. A suitable filter is then used to perform a filtering of the data subjected to the Fourier analysis. Lastly, a correlation function is calculated exclusively on the filtered data.

Abstract: A fluorescence fluctuation microscope, in which excitation light and detection light are coupled into or out of a microscope by means of a common beam path, comprises a closed loop scanning unit (22, 23).