Patents by Inventor Malvin C. Teich

Malvin C. Teich has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6982822
    Abstract: An apparatus for generating a strong source of doubly or multiply entangled photons emitted non-collinearly or collinearly with respect to the pump light that is at frequency 2f includes a laser medium producing classical laser light at fundamental frequency f. A medium for second harmonic generation transforms the light at fundamental frequency f to its second-harmonic frequency 2f and emitting entangled photons non-colinearly with respect to the light at the second harmonic frequency. An optical cavity element around the laser medium and the medium for second harmonic generation includes of at least two mirrors that are highly reflective at the light frequencies f and 2f.
    Type: Grant
    Filed: May 22, 2003
    Date of Patent: January 3, 2006
    Assignees: Trustees of Boston University, The Trustees of Boston College, Carl Zeiss Jena GmbH
    Inventors: Malvin C. Teich, Bahaa E. A. Saleh, Alexander V. Sergienko, John T. Fourkas, Ralf Wolleschensky, Michael Kempe, Mark C. Booth
  • Patent number: 6882431
    Abstract: The disclosed Quantum Optical Coherence Tomography apparatus and method includes a source of quantum entangled photons and a quantum interference device. The pair of entangled photons is divided into two beams, one of which illuminates a semi-reflective object and the second of which is reflected from a variable optical time-delay element (VTE). The VTE is scanned and the quantum interference in the QID is recorded to build up a reflectance profile of the object. A real scanning produces a full tomographic reflectance image. A method of processing the data to eliminate the effects of optical dispersion is disclosed.
    Type: Grant
    Filed: November 26, 2002
    Date of Patent: April 19, 2005
    Inventors: Malvin C. Teich, Bahaa E A. Saleh, Alexander V. Sergienko, Ayman F. Abouraddy, Magued B. Nasr
  • Patent number: 6822739
    Abstract: A system for obtaining ellipsometric data from a sample. The system includes a source for providing a monochromatic light beam. The system also includes a nonlinear crystal for converting the monochromatic light beam into photon pairs by disintegrating photons from the monochromatic light beam, such that each of the photon pairs exhibits entanglement properties, wherein one of the photons of the pair is directed to the sample and the other of the photons of the pair is not directed to the sample. The system further includes a circuit for calculating the coincidence of one of the photons of the photon pair reflected from the sample and the other of the photons of the photon pair, wherein the measurements of the sample are obtained by analyzing the coincidence and the entanglement properties between one of the photons of the photon pair reflected from the sample and the other of the photons of the photon pair.
    Type: Grant
    Filed: May 20, 2003
    Date of Patent: November 23, 2004
    Assignee: Trustees of Boston University
    Inventors: Alexander V. Sergienko, Bahaa E. A. Saleh, Malvin C. Teich, Kimani C. Toussaint, Jr., Ayman F. Abouraddy
  • Publication number: 20040100637
    Abstract: The disclosed Quantum Optical Coherence Tomography apparatus and method includes a source of quantum entangled photons and a quantum interference device. The pair of entangled photons is divided into two beams, one of which illuminates a semi-reflective object and the second of which is reflected from a variable optical time-delay element (VTE). The VTE is scanned and the quantum interference in the QID is recorded to build up a reflectance profile of the object. Areal scanning produces a full tomographic reflectance image. A method of processing the data to eliminate the effects of optical dispersion is disclosed.
    Type: Application
    Filed: November 26, 2002
    Publication date: May 27, 2004
    Applicant: Twin Photon, Inc.
    Inventors: Malvin C. Teich, Bahaa E. A. Saleh, Alexander V. Sergienko, Ayman F. Abouraddy, Magued B. Nasr
  • Publication number: 20040042513
    Abstract: The present invention relates to a novel and useful way of generating a strong source of doubly or multiply entangled photons. To generate a high flux of such photons we propose the use of a parametric process, or a set of simultaneous parametric processes, in conjunction with laser-type action and nonlinear optical processes in an optical cavity. This can be achieved via an optical-system configuration in which two, three or more processes take place simultaneously: the generation of light by stimulated emission or other means from an active medium in a cavity; the nonlinear-optical production of higher optical harmonics in the same or in an auxiliary cavity; and the generation of spontaneous parametric downconversion in the same or in an auxiliary cavity.
    Type: Application
    Filed: May 22, 2003
    Publication date: March 4, 2004
    Inventors: Malvin C. Teich, Bahaa E.A. Saleh, Alexander V. Sergienko, John T. Fourkas, Ralf Wolleschensky, Michael Kempe, Mark C. Booth
  • Publication number: 20040036877
    Abstract: A system for obtaining ellipsometric data from a sample. The system includes a source for providing a monochromatic light beam. The system also includes a nonlinear crystal for converting the monochromatic light beam into photon pairs by disintegrating photons from the monochromatic light beam, such that each of the photon pairs exhibits entanglement properties, wherein one of the photons of the pair is directed to the sample and the other of the photons of the pair is not directed to the sample. The system further includes a circuit for calculating the coincidence of one of the photons of the photon pair reflected from the sample and the other of the photons of the photon pair, wherein the measurements of the sample are obtained by analyzing the coincidence and the entanglement properties between one of the photons of the photon pair reflected from the sample and the other of the photons of the photon pair.
    Type: Application
    Filed: May 20, 2003
    Publication date: February 26, 2004
    Inventors: Alexander V. Sergienko, Bahaa E.A. Saleh, Malvin C. Teich, Kimani C. Toussaint, Ayman F. Abouraddy
  • Patent number: 6646727
    Abstract: The invention relates to an entangled-photon apparatus capable of measuring particular characteristics of an optical element, device or channel. Specifically, the apparatus and a method of using said apparatus to measure polarization mode dispersion in an optical communications fiber is disclosed. The apparatus includes a source of entangled photons, which are injected into the device under test, and a quantum interference device for determining the state of entanglement of said photons after they pass through the device. The quantum interference device includes a variable, polarization-specific delay element that is incremented to null out polarization mode dispersion in the device under test, and a wavelength demultiplexer/array detector that permits simultaneous measurements across a wide wavelength band. A second preferred embodiment of the invention and method is suitable for characterizing PMD in-situ that is, PMD measurements can be made while an optical fiber is in use for optical communications.
    Type: Grant
    Filed: May 16, 2002
    Date of Patent: November 11, 2003
    Inventors: Bahaa E. A. Saleh, Malvin C. Teich, Alexander Sergienko, Steven J. Bielagus, Milan J. Merhar
  • Publication number: 20020191176
    Abstract: The invention relates to an entangled-photon apparatus capable of measuring particular characteristics of an optical element, device or channel. Specifically, the apparatus and a method of using said apparatus to measure polarization mode dispersion in an optical communications fiber is disclosed. The apparatus includes a source of entangled photons, which are injected into the device under test, and a quantum interference device for determining the state of entanglement of said photons after they pass through the device. The quantum interference device includes a variable, polarization-specific delay element that is incremented to null out polarization mode dispersion in the device under test, and a wavelength demultiplexer/array detector that permits simultaneous measurements across a wide wavelength band.
    Type: Application
    Filed: May 16, 2002
    Publication date: December 19, 2002
    Applicant: Twin Photon, Inc.
    Inventors: Bahaa E.A. Saleh, Malvin C. Teich, Alexander Sergienko, Steven J. Bielagus, Milan J. Merhar
  • Publication number: 20020093632
    Abstract: The present invention relates to novel three-dimensional fabrication using entangled-photon lithography. The systems include a source of light that produces twin or multiply entangled photons. The systems also include optical components that direct the twin or multiply entangled photons towards an interaction region. The interaction region includes absorption means responsive to a particular range of energies, which approximately equals the sum of the energies of the entangled photons. The systems may further include fabrication means in the interaction region that are responsive to physical and/or chemical changes of material or materials in this region, including the deposition or addition of one or more species, the removal of one or more species, the combination of two or more species, and/or the conversion of one species to another.
    Type: Application
    Filed: August 25, 2001
    Publication date: July 18, 2002
    Inventors: Malvin C. Teich, Bahaa E.A. Saleh, Alexander V. Sergienko, John Fourkas