Abstract: A time synchronization system includes a first wireless device and a second wireless device. A wireless unit of the first wireless device wirelessly transmits timing information and time information separately, the time information being acquired from a first clock and relating to a transmission time when the timing information was transmitted. A wireless unit of the second wireless device receives the wirelessly transmitted timing information and time information separately. A correction unit of the second wireless device corrects s a second clock on the basis of a reference time indicated by the second clock at a time when the wireless unit received the timing information, and a transmission time obtained from the time information.

Abstract: The present invention aims at providing a defect inspection technique capable of setting parameters used for detecting a defect with a less burden to a user. A defect inspection device according to the present invention receives multiple reference values input by the user and calculates a defect extraction condition so as to optimize an evaluation value calculated with the use of the reference values, the number of actual reports, and the number of false reports.

Abstract: The present invention aims at providing a defect inspection technique capable of setting parameters used for detecting a defect with a less burden to a user. A defect inspection device according to the present invention receives multiple reference values input by the user and calculates a defect extraction condition so as to optimize an evaluation value calculated with the use of the reference values, the number of actual reports, and the number of false reports (refer to FIG. 8).

Abstract: The present invention aims at providing a defect inspection technique capable of setting parameters used for detecting a defect with a less burden to a user. A defect inspection device according to the present invention receives multiple reference values input by the user and calculates a defect extraction condition so as to optimize an evaluation value calculated with the use of the reference values, the number of actual reports, and the number of false reports (refer to FIG. 8).

Abstract: A time synchronization system includes a first wireless device and a second wireless device. A wireless unit of the first wireless device wirelessly transmits timing information and time information separately, the time information being acquired from a first clock and relating to a transmission time when the timing information was transmitted. A wireless unit of the second wireless device receives the wirelessly transmitted timing information and time information separately. A correction unit of the second wireless device corrects s a second clock on the basis of a reference time indicated by the second clock at a time when the wireless unit received the timing information, and a transmission time obtained from the time information.

Abstract: The present invention aims at providing a defect inspection technique capable of setting parameters used for detecting a defect with a less burden to a user. A defect inspection device according to the present invention receives multiple reference values input by the user and calculates a defect extraction condition so as to optimize an evaluation value calculated with the use of the reference values, the number of actual reports, and the number of false reports (refer to FIG. 8).

Abstract: A defect inspection device is provided with an illumination optical system that irradiates light or an electron beam onto a sample, a detector that detects a signal obtained from the sample through the irradiation of the light or electron beam, a defect detection unit that detects a defect candidate on the sample through the comparison of a signal output by the detector and a prescribed threshold, and a display unit that displays a setting screen for setting the threshold. The setting screen is a two-dimensional distribution map that represents the distribution of the defect candidates in a three dimensional feature space having three features as the axes thereof and includes the axes of the three features and the threshold, which is represented in one dimension.

Abstract: A defect inspection device is provided with an illumination optical system that irradiates light or an electron beam onto a sample, a detector that detects a signal obtained from the sample through the irradiation of the light or electron beam, a defect detection unit that detects a defect candidate on the sample through the comparison of a signal output by the detector and a prescribed threshold, and a display unit that displays a setting screen for setting the threshold. The setting screen is a two-dimensional distribution map that represents the distribution of the defect candidates in a three dimensional feature space having three features as the axes thereof and includes the axes of the three features and the threshold, which is represented in one dimension.

Abstract: According to one embodiment, a histogram generator configured to generate a histogram based on luminance levels of pixels represented by video signals; and a determination module configured to determine whether the video signals represent a stereoscopic video based on the histogram.

Abstract: A reflective screen apparatus according to an embodiment of the invention, which is advantageous in that a reflection surface is readily formed, projection light outputted from a projector is efficiently reflected, and the convenience of a user is improved, includes a reflective screen having a reflection surface (reflection area) that reflects projection light off reflection films as reflectors selectively formed on a screen substrate in accordance with the angle of incidence of the projection light and a pair of winders that support respective ends (upper and lower ends) of the reflective screen and rotate in forward and backward directions to wind and release the reflective screen, and the winders drive each other and operate in opposite ways to move the reflection surface between the winders.

Abstract: In a foreign matter inspection apparatus comprising: irradiating unit for irradiating inspection light to an inspection area of an article to be inspected; intensity detecting unit for detecting intensity of either reflected light or scattered light, which is generated from the inspection area by irradiating thereto the inspection light; position detecting unit for detecting a position of either the reflected light or the scattered light within the inspection area; and deciding unit for deciding whether or not a foreign matter is present within the inspection area; the foreign matter inspection apparatus is comprised of: display unit capable of displaying thereon both a threshold image in which the threshold value is indicated over an entire area of the inspection area, and a detection sensitivity image indicated by being converted from the threshold image.

Abstract: According to one embodiment, a histogram generator configured to generate a histogram based on luminance levels of pixels represented by video signals; and a determination module configured to determine whether the video signals represent a stereoscopic video based on the histogram

Abstract: According to one embodiment, a video processing apparatus includes a histogram generator, a determination module and a sharpening processor. The histogram generator generates a histogram based on a luminance level of pixels of a video signal. The determination module determines whether the video signal is a captured video based on the histogram. The sharpening processor sharpens the video signal based on an imaging model function in which a blur due to imaging is not considered, if the video signal is not the captured video.

Abstract: In a foreign matter inspection apparatus comprising: irradiating unit for irradiating inspection light to an inspection area of an article to be inspected; intensity detecting unit for detecting intensity of either reflected light or scattered light, which is generated from the inspection area by irradiating thereto the inspection light; position detecting unit for detecting a position of either the reflected light or the scattered light within the inspection area; and deciding unit for deciding whether or not a foreign matter is present within the inspection area; the foreign matter inspection apparatus is comprised of: display unit capable of displaying thereon both a threshold image in which the threshold value is indicated over an entire area of the inspection area, and a detection sensitivity image indicated by being converted from the threshold image.

Abstract: The present invention provides pharmaceutical compositions useful for relieving pain caused by ureteral calculi, facilitating exclusion of ureteral calculi or the like. That is, the present invention provides a pharmaceutical composition for the treatment of ureteral lithiasis, which comprises as an active ingredient an indoline derivative represented by the following general formula (I) or a salt thereof. In the formula, R represents saturated or unsaturated aliphatic acyl which may have a substituent; hydroxyalkyl; aliphatic acyloxyalkyl; lower alkyl which has as a substituent lower alkoxy, carboxy, lower alkoxycarbonyl, aryl-substituted lower alkoxycarbonyl, carbamoyl, mono or di (lower alkyl)-substituted carbamoyl or cyano; optionally substituted aromatic acyl; furoyl or pyridylcarbonyl; R1 represents cyano or carbamoyl; and R2 represents lower alkyl which may have as a substituent halogen, cyano or aryl.

Abstract: The present invention provides a resin composition containing a reactive monomer and/or oligomer having allyl ester groups, a film of the resin composition which is excellent in transparency and heat resistance and has a high thickness precision, and a process for producing such a film. The resin composition includes (A) a reactive oligomer having allyl ester groups and represented by the general formula (1): wherein R1 represents an alkanediyl or alkenediyl group having 1 to 4 carbon atoms with the proviso that a plurality of R1 groups may be the same or different, R2 represents a cycloalkanediyl, cycloalkenediyl or arenediyl group with the proviso that a plurality of R2 groups may be the same or different, and n represents an average degree of polymerization and is a number of 1 to 30; (B) a polyfunctional (meth)acrylic monomer and/or oligomer; and (C) a thermal polymerization initiator.

Abstract: In a foreign matter inspection apparatus comprising: irradiating unit for irradiating inspection light to an inspection area of an article to be inspected; intensity detecting unit for detecting intensity of either reflected light or scattered light, which is generated from the inspection area by irradiating thereto the inspection light; position detecting unit for detecting a position of either the reflected light or the scattered light within the inspection area; and deciding unit for deciding whether or not a foreign matter is present within the inspection area; the foreign matter inspection apparatus is comprised of: display unit capable of displaying thereon both a threshold image in which the threshold value is indicated over an entire area of the inspection area, and a detection sensitivity image indicated by being converted from the threshold image.

Abstract: The present invention provides pharmaceutical compositions for the prevention or treatment of diseases associated with decrease in tear.

Abstract: According to one embodiment, a video processing apparatus includes a histogram generator, a determination module and a sharpening processor. The histogram generator generates a histogram based on a luminance level of pixels of a video signal. The determination module determines whether the video signal is a captured video based on the histogram. The sharpening processor sharpens the video signal based on an imaging model function in which a blur due to imaging is not considered, if the video signal is not the captured video.

Abstract: In a foreign matter inspection apparatus comprising: irradiating unit for irradiating inspection light to an inspection area of an article to be inspected; intensity detecting unit for detecting intensity of either reflected light or scattered light, which is generated from the inspection area by irradiating thereto the inspection light; position detecting unit for detecting a position of either the reflected light or the scattered light within the inspection area; and deciding unit for deciding whether or not a foreign matter is present within the inspection area; the foreign matter inspection apparatus is comprised of: display unit capable of displaying thereon both a threshold image in which the threshold value is indicated over an entire area of the inspection area, and a detection sensitivity image indicated by being converted from the threshold image.