Abstract: An electronic field enhancement element includes: a metal layer; a dielectric layer provided on the metal layer; and a plurality of fine metal structures provided on the dielectric layer. A refractive index n of the dielectric layer satisfies n?=n+i? and is in a range of 1?n<1.46, wherein a complex refractive index of the dielectric layer is n?, an imaginary unit is i, and an extinction coefficient is ?.

Abstract: A press brake system that utilizes a punch holder adapted to be used with punch chips of various radii to achieve the desired bend on a part. The system maintains a common shut height enabling the press brake operator to be able to put different radius tip punches next to each other in a single press brake tooling setup.

Abstract: An electronic field enhancement element includes: a metal layer; a dielectric layer provided on the metal layer; and a plurality of fine metal structures provided on the dielectric layer. A refractive index n of the dielectric layer satisfies n?=n+i? and is in a range of 1?n<1.46, wherein a complex refractive index of the dielectric layer is n?, an imaginary unit is i, and an extinction coefficient is ?.

Abstract: An electronic field enhancement element includes: a metal layer; a dielectric layer provided on the metal layer; and a plurality of fine metal structures provided on the dielectric layer. A refractive index n of the dielectric layer satisfies n?=n+i? and is in a range of 1?n<1.46, wherein a complex refractive index of the dielectric layer is n?, an imaginary unit is i, and an extinction coefficient is ?.

Abstract: An analysis device includes an optical element which includes a metal layer, a light transmitting layer on the metal layer, and a plurality of metal particles on the light transmitting layer arranged at a first interval P1 in a first direction and arranged at a second interval P2 in a second direction intersecting the first direction, P1<P2?Q+P1, a light source which irradiates incident light of linearly polarized light in the first direction onto the optical element, and a detector which detects light emitted from the optical element. Where Q represents the interval between diffraction gratings.

Abstract: An analysis device includes an optical element which includes a metal layer, a light transmitting layer on the metal layer, and a plurality of metal particles on the light transmitting layer arranged at a first interval P1 in a first direction and arranged at a second interval P2 in a second direction intersecting the first direction, P1<P2?Q+P1, a light source which irradiates incident light of linearly polarized light in the first direction onto the optical element, and a detector which detects light emitted from the optical element. Where Q represents the interval between diffraction gratings.

Abstract: An analysis apparatus includes an electric field enhancing element including a metallic layer, a transmissive layer on the metallic layer and transmitting excitation light, and metallic particles on the transmissive layer with first and second pitches in first and second directions; a light source irradiating the element with first direction linearly polarized light, second direction linearly polarized light, and/or circularly polarized light as the excitation light; and a detector detecting light from the element. The pitches are selected relative to the pitch of a diffraction grating. The thickness of the transmissive layer is selected relative to the wavelength of the excitation light.

Abstract: There is provided a sample analysis element capable of uniting a propagating surface plasmon resonance with a localized surface plasmon resonance while increasing the surface density of the hot spots. The sample analysis element is provided with a plurality of metal nanobody lines. Each of the metal nanobody lines includes a plurality of metal nanobodies arranged in a line on a dielectric surface at a first pitch smaller than a wavelength of incident light, and the plurality of metal nanobody lines is arranged in parallel to each other at a second pitch larger than the first pitch.

Abstract: A sample analysis device capable of realizing the enhancement of a near-field light while increasing a hotspot areal density is provided. In a sample analysis device, multiple nanostructures are arranged on the surface of a base body. A dielectric body is covered with a metal film in each nanostructure. The nanostructures form multiple nanostructure lines. In each nanostructure line, the nanostructures are arranged at a first pitch SP which is smaller than the wavelength of an excitation light and the nanostructure lines are arranged in parallel with one another at a second pitch LP which is greater than the first pitch SP.

Abstract: An electronic field enhancement element includes: a metal layer; a dielectric layer provided on the metal layer; and a plurality of fine metal structures provided on the dielectric layer. A refractive index n of the dielectric layer satisfies n?=n+i? and is in a range of 1?n<1.46, wherein a complex refractive index of the dielectric layer is n?, an imaginary unit is i, and an extinction coefficient is ?.

Abstract: An analysis apparatus includes an electric field enhancing element including a metallic layer, a transmissive layer on the metallic layer and transmitting excitation light, and metallic particles on the transmissive layer with first and second pitches in first and second directions; a light source irradiating the element with first direction linearly polarized light, second direction linearly polarized light, and/or circularly polarized light as the excitation light; and a detector detecting light from the element. The pitches are selected relative to the pitch of a diffraction grating. The thickness of the transmissive layer is selected relative to the wavelength of the excitation light.

Abstract: An analysis apparatus includes an electric field enhancing element including a metallic layer, a light-transmissive layer, and a plurality of metallic particles arranged in a first direction and a second direction intersecting with the first direction; a light source irradiating the electric field enhancing element with at least one of linearly polarized light polarized in the first direction, linearly polarized light polarized in the second direction, and circularly polarized light; and a detector, in which localized surface plasmon and propagating surface plasmon are electromagnetically interacted, and when a thickness of the light-transmissive layer is G [nm], an effective reflective index of the light-transmissive layer is neff, and a wavelength of the excitation light is ?i [nm], a relationship of the following expression (1) is satisfied. 20 [nm]<G·(neff/1.

Abstract: An optical device includes a first protrusion group in which protrusions protruding from a conductor surface of a substrate are arranged in a first direction with a first period, a dielectric layer that covers the conductor surface and the first protrusion group, and a second protrusion group in which metal nanoparticles are arranged on the dielectric layer in the first direction with a second period different from the first period. When one of the first period and the second period is defined as Px1, the other of the first period and the second period is defined as Px2, and the wavelength of irradiation light is defined as ?, ?>Px1>Px2 and 0<Px1?Px2<Px1/2 are satisfied.

Abstract: A sample analysis device capable of realizing the enhancement of a near-field light while increasing a hotspot areal density is provided. In a sample analysis device, multiple nanostructures are arranged on the surface of a base body. A dielectric body is covered with a metal film in each nanostructure. The nanostructures form multiple nanostructure lines. In each nanostructure line, the nanostructures are arranged at a first pitch SP which is smaller than the wavelength of an excitation light and the nanostructure lines are arranged in parallel with one another at a second pitch LP which is greater than the first pitch SP.

Abstract: There is provided a sample analysis element capable of achieving enhancement of the near-field light while increasing the surface density of the hot spots. The sample analysis element is provided with a base body. Nanostructures are dispersed on a surface of the base body at a first pitch SP smaller than a wavelength of incident light. In each of the nanostructures, a dielectric body is covered with a metal film. The nanostructures form a plurality of nanostructure groups. The nanostructure groups are arranged in one direction at a second pitch LP larger than the first pitch SP.

Abstract: There is provided a sample analysis element capable of uniting a propagating surface plasmon resonance with a localized surface plasmon resonance while increasing the surface density of the hot spots. The sample analysis element is provided with a plurality of metal nanobody lines. Each of the metal nanobody lines includes a plurality of metal nanobodies arranged in a line on a dielectric surface at a first pitch smaller than a wavelength of incident light, and the plurality of metal nanobody lines is arranged in parallel to each other at a second pitch larger than the first pitch.

Abstract: An analysis device is provided with an optical element having a structure in which the end portions of the upper surface and the lower surface of second metal layers are capable of having contact with a measurement object, and hotspots are exposed on the element surfaces. Therefore, it is easy for the substance that is the analysis object to be located at the hotspot. Further, since a first metal layer is disposed in the vicinity of the second metal layers, a resonance effect of a localized surface plasmon and a propagating surface plasmon can be generated. Therefore, the enhancement degree of light based on the plasmon is extremely high, and it is possible to analyze the substance with extremely high sensitivity.

Abstract: A plurality of metallic nano-body groups that includes metallic nano-bodies which are a size smaller than the wavelength of incident light and are dispersed on a dielectric surface is arranged in one direction at a pitch that resonates with the incident light. A long piece extends on the dielectric surface between adjacent metallic nano-body groups. The long piece is formed of a material having no free electron that performs resonance oscillation with the incident light. Localized surface plasmon resonance occurs in the metallic nano-body by the action of the incident light. Propagating surface plasmon resonance occurs by the action of the pitch. The propagating surface plasmon resonance is combined with the localized surface plasmon resonance. A so-called hybrid mode is established. The long piece is helpful in the establishment of the pitch.

Abstract: An analysis device includes an optical element which includes a metal layer, a light transmitting layer provided on the metal layer to transmit light, and a plurality of metal particles arranged at a first interval P1 in a first direction and arranged at a second interval P2 in a second direction intersecting the first direction on the light transmitting layer, P1<P2, a light source which irradiates incident light incident on the optical element, and a detector which detects light emitted from the optical element. Linearly polarized light in the same direction as the first direction and linearly polarized light in the same direction as the second direction are irradiated onto the optical element.

Abstract: An analysis device includes an optical element which includes a metal layer, a light transmitting layer on the metal layer, and a plurality of metal particles on the light transmitting layer arranged at a first interval P1 in a first direction and arranged at a second interval P2 in a second direction intersecting the first direction, P1<P2?Q+P1, a light source which irradiates incident light of linearly polarized light in the first direction onto the optical element, and a detector which detects light emitted from the optical element. Where Q represents the interval between diffraction gratings.