Patents by Inventor Manabu Okuda

Manabu Okuda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11927435
    Abstract: A three-dimensional measurement device performs three-dimensional measurement of a measured object using a phase shift method. The three-dimensional measurement device includes: an irradiator that irradiates the measured object with a predetermined light pattern having a light intensity distribution in a fringe shape; a control device that shifts a phase of the light pattern radiated from the irradiator in N different ways, where N is a natural number of not less than 3; and an imaging device that takes an image of the measured object irradiated with the light pattern. The control device executes three-dimensional measurement of the measured object by the phase shift method based on N different image data taken under the light pattern having the phase shifted in the N different ways.
    Type: Grant
    Filed: November 24, 2021
    Date of Patent: March 12, 2024
    Assignee: CKD CORPORATION
    Inventors: Manabu Okuda, Tsuyoshi Ohyama, Norihiko Sakaida
  • Publication number: 20220082374
    Abstract: A three-dimensional measurement device performs three-dimensional measurement of a measured object using a phase shift method. The three-dimensional measurement device includes: an irradiator that irradiates the measured object with a predetermined light pattern having a light intensity distribution in a fringe shape; a control device that shifts a phase of the light pattern radiated from the irradiator in N different ways, where N is a natural number of not less than 3; and an imaging device that takes an image of the measured object irradiated with the light pattern. The control device executes three-dimensional measurement of the measured object by the phase shift method based on N different image data taken under the light pattern having the phase shifted in the N different ways.
    Type: Application
    Filed: November 24, 2021
    Publication date: March 17, 2022
    Applicant: CKD CORPORATION
    Inventors: Manabu Okuda, Tsuyoshi Ohyama, Norihiko Sakaida
  • Patent number: 11184984
    Abstract: A solder printing inspection device that is placed on an upstream side of a component mounting machine that mounts an electronic component on solder that is printed on a substrate by a solder printing machine, and that inspects the solder on the substrate on which a thermosetting adhesive is applied, the solder printing inspection device including: an irradiator that irradiates the solder with light; an imaging device that takes an image of the irradiated solder; a processor that: generates actual solder position information of a solder group that the electronic component is mounted on based on the image, wherein the solder group includes two or more solders; generates, based on design data or manufacturing data, ideal solder inspection reference information indicating a reference inspection position and/or a reference inspection range of the solder included in the solder group; outputs mounting position adjustment information to the component mounting machine.
    Type: Grant
    Filed: July 31, 2019
    Date of Patent: November 23, 2021
    Assignee: CKD CORPORATION
    Inventors: Manabu Okuda, Tsuyoshi Ohyama, Norihiko Sakaida
  • Patent number: 10679332
    Abstract: A solder printing inspection device that inspects a printing state of solder paste printed on a substrate having a through hole into which a lead terminal of an insertion component is inserted, the solder printing inspection device including: a non-printing face side illuminator that irradiates an inspection range on a non-printing face side with a predetermined light, wherein the non-printing face side is opposite to a printing face side, out of a surface and a rear face of the substrate; a non-printing face side camera that takes an image of the inspection range on the non-printing face side of the substrate irradiated with the predetermined light; and a controller that executes inspection with regard to the solder paste in the inspection range, based on image data with regard to the inspection range on the non-printing face side of the substrate taken by the non-printing face side camera.
    Type: Grant
    Filed: December 6, 2018
    Date of Patent: June 9, 2020
    Assignee: CKD CORPORATION
    Inventors: Manabu Okuda, Nobuyuki Umemura
  • Patent number: 10508903
    Abstract: A three-dimensional measurement device includes: a projector including: a light source that emits a predetermined light; a grid that converts the light from the light source into a predetermined striped pattern; and a driver that moves the grid, and the projector projecting the striped pattern onto a measurement object; an imaging device that takes an image of the measurement object on which the striped pattern is projected; and a controller that: controls the projector and the imaging device to obtain a plurality of image data having different light intensity distributions; executes three-dimensional measurement of the measurement object by phase shifting based on the image data having different light intensity distributions; and obtains each of the image data among the image data having different light intensity distributions.
    Type: Grant
    Filed: June 21, 2018
    Date of Patent: December 17, 2019
    Assignee: CKD CORPORATION
    Inventors: Nobuyuki Umemura, Tsuyoshi Ohyama, Norihiko Sakaida, Manabu Okuda
  • Publication number: 20190357361
    Abstract: A solder printing inspection device that is placed on an upstream side of a component mounting machine that mounts an electronic component on solder that is printed on a substrate by a solder printing machine, and that inspects the solder on the substrate on which a thermosetting adhesive is applied, the solder printing inspection device including: an irradiator that irradiates the solder with light; an imaging device that takes an image of the irradiated solder; a processor that: generates actual solder position information of a solder group that the electronic component is mounted on based on the image, wherein the solder group includes two or more solders; generates, based on design data or manufacturing data, ideal solder inspection reference information indicating a reference inspection position and/or a reference inspection range of the solder included in the solder group; outputs mounting position adjustment information to the component mounting machine.
    Type: Application
    Filed: July 31, 2019
    Publication date: November 21, 2019
    Applicant: CKD Corporation
    Inventors: Manabu Okuda, Tsuyoshi Ohyama, Norihiko Sakaida
  • Publication number: 20190114764
    Abstract: A solder printing inspection device that inspects a printing state of solder paste printed on a substrate having a through hole into which a lead terminal of an insertion component is inserted, the solder printing inspection device including: a non-printing face side illuminator that irradiates an inspection range on a non-printing face side with a predetermined light, wherein the non-printing face side is opposite to a printing face side, out of a surface and a rear face of the substrate; a non-printing face side camera that takes an image of the inspection range on the non-printing face side of the substrate irradiated with the predetermined light; and a controller that executes inspection with regard to the solder paste in the inspection range, based on image data with regard to the inspection range on the non-printing face side of the substrate taken by the non-printing face side camera.
    Type: Application
    Filed: December 6, 2018
    Publication date: April 18, 2019
    Applicant: CKD Corporation
    Inventors: Manabu Okuda, Nobuyuki Umemura
  • Publication number: 20180313645
    Abstract: A three-dimensional measurement device includes: a projector including: a light source that emits a predetermined light; a grid that converts the light from the light source into a predetermined striped pattern; and a driver that moves the grid, and the projector projecting the striped pattern onto a measurement object; an imaging device that takes an image of the measurement object on which the striped pattern is projected; and a controller that: controls the projector and the imaging device to obtain a plurality of image data having different light intensity distributions; executes three-dimensional measurement of the measurement object by phase shifting based on the image data having different light intensity distributions; and obtains each of the image data among the image data having different light intensity distributions.
    Type: Application
    Filed: June 21, 2018
    Publication date: November 1, 2018
    Applicant: CKD Corporation
    Inventors: Nobuyuki Umemura, Tsuyoshi Ohyama, Norihiko Sakaida, Manabu Okuda
  • Patent number: 9511455
    Abstract: A substrate inspection device and a component mounting device are provided. The solder inspection device and the component mounting device respectively have substrate support devices that support a rear face of a printed circuit board. The substrate support device includes backup pins that support the rear surface of the printed circuit board, a location determiner that determines locations of the backup pins, and a backup pin locator that places the backup pins at the locations of the backup pins determined by the location determiner. The location determiner determines positions for supporting areas of the rear face of the printed circuit board where an electrode is covered by a resist film and where neither electronic component nor solder is present, as the locations of the backup pins.
    Type: Grant
    Filed: February 17, 2015
    Date of Patent: December 6, 2016
    Assignee: CKD Corporation
    Inventors: Manabu Okuda, Tsuyoshi Ohyama, Norihiko Sakaida
  • Patent number: 9465385
    Abstract: In a monitoring system, when there is an evaluation that a product is defective, in a solder print inspecting device that is subject to monitoring, that information is sent to a mobile terminal possessed by an operator. The operator who views the notification performs, through the mobile terminal, a checking task for evaluating whether or not the evaluation result regarding the printed substrate that has been evaluated as a defective product is correct. Depending on the evaluation result, an operating instruction is sent to the solder print inspecting device, which has temporarily stopped the printed substrate. If correction information instructing that the defective-product evaluation be corrected to a non-defective-product evaluation is sent from a mobile terminal to the solder print inspecting device, the solder print inspecting device corrects the defective-product evaluation to a non-defective-product evaluation, and releases the temporary stop of the printed substrate.
    Type: Grant
    Filed: December 17, 2013
    Date of Patent: October 11, 2016
    Assignee: CKD Corporation
    Inventors: Yosuke Kamioka, Manabu Okuda, Shingo Suzuki
  • Publication number: 20150231744
    Abstract: A substrate inspection device and a component mounting device are provided. The solder inspection device and the component mounting device respectively have substrate support devices that support a rear face of a printed circuit board. The substrate support device includes backup pins that support the rear surface of the printed circuit board, a location determiner that determines locations of the backup pins, and a backup pin locator that places the backup pins at the locations of the backup pins determined by the location determiner. The location determiner determines positions for supporting areas of the rear face of the printed circuit board where an electrode is covered by a resist film and where neither electronic component nor solder is present, as the locations of the backup pins.
    Type: Application
    Filed: February 17, 2015
    Publication date: August 20, 2015
    Inventors: Manabu Okuda, Tsuyoshi Ohyama, Norihiko Sakaida
  • Publication number: 20140200700
    Abstract: In a monitoring system, when there is an evaluation that a product is defective, in a solder print inspecting device that is subject to monitoring, that information is sent to a mobile terminal possessed by an operator. The operator who views the notification performs, through the mobile terminal, a checking task for evaluating whether or not the evaluation result regarding the printed substrate that has been evaluated as a defective product is correct. Depending on the evaluation result, an operating instruction is sent to the solder print inspecting device, which has temporarily stopped the printed substrate. If correction information instructing that the defective-product evaluation be corrected to a non-defective-product evaluation is sent from a mobile terminal to the solder print inspecting device, the solder print inspecting device corrects the defective-product evaluation to a non-defective-product evaluation, and releases the temporary stop of the printed substrate.
    Type: Application
    Filed: December 17, 2013
    Publication date: July 17, 2014
    Applicant: CKD CORPORATION
    Inventors: Yosuke Kamioka, Manabu Okuda, Shingo Suzuki
  • Patent number: 6075605
    Abstract: A shape measuring device includes a light source for generating slit light beam and a polygon mirror for scanning the light beam and illuminating an object to be measured. The device further includes space-coding light beam controlling means, phase-shifting light beam controlling means, and a CCD camera which picks up an optical image of an object to be measured obtained by illumination of the light beam. The space-coding light beam controlling means controls light beam whose distribution of integrated illumination has a stripe patter in accordance with a predetermined code and the phase-shifting light beam controlling means controls light beam whose distribution of integrated illumination has a sine-wave like pattern. The distribution of integrated illumination intensity is possessed by the light beam illuminating within a time period for picking up one frame.
    Type: Grant
    Filed: September 8, 1998
    Date of Patent: June 13, 2000
    Assignees: CKD Corporation, Kabushiki Kaisha Nextar
    Inventors: Ikuo Futamura, Manabu Okuda, Susumu Shibata