Patents by Inventor Manabu Takahama

Manabu Takahama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6677171
    Abstract: A collective substrate of active-matrix substrates is divided into a first block and a second block. In cells of the first block and the second block, from a corresponding signal input pad group, an inspection scanning signal is inputted via a scanning-line short ring connecting line to scanning lines, an inspection display signal is inputted via a signal-line short ring connecting line to signal lines, and an auxiliary capacity wire signal is inputted via an auxiliary capacity wire main wire connecting line to auxiliary capacity wires. This arrangement makes it possible to perform an electrical inspection with high accuracy and efficiency on a large-format active-matrix substrate, and to manufacture an inspection probe frame in a simple manner at low cost.
    Type: Grant
    Filed: November 14, 2000
    Date of Patent: January 13, 2004
    Assignee: Sharp Kabushiki Kaisha
    Inventors: Hisashi Nagata, Mikio Katayama, Toshihiro Yamashita, Manabu Takahama
  • Patent number: 6172410
    Abstract: A collective substrate of active-matrix substrates is divided into a first block and a second block. In cells of the first block and the second block, from a corresponding signal input pad group, an inspection scanning signal is inputted via a scanning-line short ring connecting line to scanning lines, an inspection display signal is inputted via a signal-line short ring connecting line to signal lines, and an auxiliary capacity wire signal is inputted via an auxiliary capacity wire main wire connecting line to auxiliary capacity wires. This arrangement makes it possible to perform an electrical inspection with high accuracy and efficiency on a large-format active-matrix substrate, and to manufacture an inspection probe frame in a simple manner at low cost.
    Type: Grant
    Filed: July 6, 1999
    Date of Patent: January 9, 2001
    Assignee: Sharp Kabushiki Kaisha
    Inventors: Hisashi Nagata, Mikio Katayama, Toshihiro Yamashita, Manabu Takahama
  • Patent number: 5471070
    Abstract: A thin-film transistor circuit for a logic gate circuit includes: an amorphous silicon layer; a driver transistor having a source region, a drain region, and a channel region, the source, drain, and channel regions being formed in the amorphous silicon layer; and a load device formed in the amorphous silicon layer and made of n.sup.- amorphous silicon, the load device being connected to the driver transistor.
    Type: Grant
    Filed: February 13, 1995
    Date of Patent: November 28, 1995
    Assignee: Sharp Kabushiki Kaisha
    Inventors: Yoshinori Shimada, Naofumi Kondo, Takehisa Sakurai, Yoshiharu Kataoka, Manabu Takahama, Mikio Katayama
  • Patent number: 5335102
    Abstract: An active matrix display device comprising: scanning branch lines each branching from the scanning line; and switching elements each formed on an end portion of the scanning branch line, wherein the distance between the scanning line side of the switching element and the scanning line is so provided as to enable the scanning branch line to be cut off by irradiation with light energy. Alternatively, an active matrix display device comprising: a conductive layer disposed under the signal line and the pixel electrode with an insulating film interposed therebetween; and a conductive piece formed between the pixel electrode and the insulating film.
    Type: Grant
    Filed: February 19, 1991
    Date of Patent: August 2, 1994
    Assignee: Sharp Kabushiki Kaisha
    Inventors: Yuzuru Kanemori, Mikio Katayama, Kiyoshi Nakazawa, Hiroaki Kato, Kozo Yano, Naofumi Kondo, Hiroshi Fujiki, Toshiaki Fujihara, Hidenori Negoto, Manabu Takahama