Abstract: Methods, systems, and devices for temperature-dependent refresh operations are described. A memory system may adjust refresh operations based on a temperature of the memory system to reduce a refresh current and improve reliability of the refresh operations. For example, the memory system may include a temperature sensor configured to provide temperature information associated with a memory device. Based on the temperature information, the memory system may, in response to a refresh command, activate a set of access lines (e.g., word lines) to refresh memory cells coupled with the access lines, where a count of the set of access lines (e.g., how many access lines are included in the set) may be based on the temperature information. In some examples, the count of the set may be determined based on comparing the temperature information to one or more temperature thresholds.

Abstract: Methods, systems, and devices implementing self-timing read termination are described. A memory system may perform a read operation in which the memory system generates a first signal and a second signal to couple a first sense component and a second sense component with a global access line, respectively. The first sense component may be coupled with one or more memory cells via an access line, and the second sense component may be configured to determine one or more logic values of the one or more memory cells based on the coupling with the global access line. The memory system may support a self-timed termination of the first signal to decouple the first sense component from the global access line. The memory system may generate a third signal to terminate the first signal based on determining the one or more logic values.

Abstract: Methods, systems, and devices for power-efficient access line operation for memory are described. A memory device may drive a voltage pulse on a first word line included in a set of word lines that is coupled with a master word line. The memory device may then a voltage pulse on a second word line included in the set of word lines coupled with the master word line. In between driving the voltage pulse on the first word line and driving the voltage pulse on the second word line, the memory device may maintain a voltage on the master word line below a threshold level.

Abstract: Methods, systems, and devices for temperature-dependent refresh operations are described. A memory system may adjust refresh operations based on a temperature of the memory system to reduce a refresh current and improve reliability of the refresh operations. For example, the memory system may include a temperature sensor configured to provide temperature information associated with a memory device. Based on the temperature information, the memory system may, in response to a refresh command, activate a set of access lines (e.g., word lines) to refresh memory cells coupled with the access lines, where a count of the set of access lines (e.g., how many access lines are included in the set) may be based on the temperature information. In some examples, the count of the set may be determined based on comparing the temperature information to one or more temperature thresholds.

Abstract: Methods, systems, and devices for power-efficient access line operation for memory are described. A memory device may drive a voltage pulse on a first word line included in a set of word lines that is coupled with a master word line. The memory device may then a voltage pulse on a second word line included in the set of word lines coupled with the master word line. In between driving the voltage pulse on the first word line and driving the voltage pulse on the second word line, the memory device may maintain a voltage on the master word line below a threshold level.