Abstract: A probe for a circuit board tester as well as to an adapter and a circuit board tester. The probe comprises a needle and a sleeve, the needle being shiftingly guided in the sleeve and the needle protruding at least 10 mm from the sleeve, more particularly more than 20 mm. In one embodiment, the needle is conically tapered to a contact tip at least in a portion protruding from the sleeve. With the probe in accordance with the invention, adapters for circuit boards can be produced comprising contacts in high-density, the probes simultaneously acting resiliently.

Abstract: A circuit board tester includes a contact array, contact fingers arranged for travelling in a plane parallel to the contact array, two contact fingers forming a probe pair as a component of a test current circuit, a controller for positioning the contact fingers on circuit board test points of a circuit board to be tested, the circuit boards being insertable into the tester simultaneously during a test procedure being tested, and two sets of contact fingers, one set being arranged for testing the front side and the other set for testing the rear side of a circuit board to be tested.

Abstract: The test needle has, for contacting a circuit board test point, a contact portion configured conically tapered to a free contact tip. The contact portion has a length of at least 15 mm and at the contact tip a diameter smaller than 0.2 mm. An end section of the contact portion apposite the contact tip comprises a diameter at least 0.1 mm larger than the contact tip. With the test needle in accordance with the invention, extremely dense structures on circuit boards can be strobed. The test needle in accordance with the invention is stiffer than known test needles for strobing comparable structures. This simplifies their handling and the configuration of a pattern adapter incorporating these test needles.

Abstract: A circuit board tester includes a contact array, contact fingers arranged for travelling in a plane parallel to the contact array, two contact fingers forming a probe pair as a component of a test current circuit, a controller for positioning the contact fingers on circuit board test points of a circuit board to be tested, the circuit boards being insertable into the tester simultaneously during a test procedure being tested, and two sets of contact fingers, one set being arranged for testing the front side and the other set for testing the rear side of a circuit board to be tested.

Abstract: The test needle comprises, for contacting a circuit board test point, a contact portion configured conically tapered to a free contact tip. The contact portion has a length of at least 15 mm and at the contact tip a diameter smaller than 0.2 mm. An end section of the contact portion opposite the contact tip comprises a diameter at least 0.1 mm larger than the contact tip. With the test needle in accordance with the invention extremely dense structures on circuit boards can be strobed. The test needle in accordance with the invention is stiffer than known test needles for strobing comparable structures. This simplifies their handling and the configuration of a pattern adapter incorporating these test needles.

Abstract: A probe for a circuit board tester as well as to an adapter and a circuit board tester. The probe comprises a needle and a sleeve, the needle being shiflingly guided in the sleeve and the needle protruding at least 10 mm from the sleeve, more particularly more than 20 mm. In one embodiment, the needle is conically tapered to a contact tip at least in a portion protruding from the sleeve. With the probe in accordance with the invention, adapters for circuit boards can be produced comprising contacts in high-density, the probes simultaneously acting resiliently.

Abstract: The invention relates to a printed circuit board tester, more particularly for testing large-area non-componented circuit boards, comprising a grid pattern provided with contact points arranged in a predetermined pattern, several contact points in each case being electrically connected to a straight-line scanning channel and an adapter and/or a translator being mounted of said grid pattern, an electronic analyzer electrically connected to said contact points via said scanning channels, a circuit board to be tested to which said adapter and/or said translator may be applied such that said adapter and/or translator produces an electrical contact of said circuit board test points on said circuit board to said contact points of said grid pattern, and a means for electrically connecting at least two scanning channels.

Abstract: The invention relates to a finger tester probe including a probe element for electrically contacting a contact point of a circuit board under test, an actuator including a permanently premagnetized core and a solenoid element. The solenoid element is shiftingly arranged on the permanently premagnetized core and is mechanically connected to the probe element. Upon being energized, the solenoid element is moved together with the probe element. Since in accordance with the invention a movable part of the actuator is not mechanically connected to a fixed part of the actuator, the test probe which is attached to the movable part is able to bring the probe element into contact with a contact point of a circuit board under test at high speed.

Abstract: A circuit board test apparatus comprises a plurality of circuit board test points. The test apparatus is provided with an electronic analyzer comprising a plurality of test connections, each circuit board test point being in contact with a test connection via an electrical connection. The electronic analyzer is electrically connected to a grid pattern, an adapter and/or a translator being mounted on the grid pattern. The adapter and/or translator, on which a circuit board to be tested is to be placed, produces an electrical contact from circuit board test points on the circuit board to contact points of the grid pattern. At least two contact points of the grid pattern are electrically connected to each other.

Abstract: A circuit board test apparatus comprising a plurality of circuit board test points is provided with an electronic analyzer comprising a plurality of test connections, each circuit board test point of the board under test being in contact with a test connection via an electrical connection. At least two of the electrical connections are electrically connected so that at least two circuit board test points of the board under test are in connection with a sole test connection.

Abstract: An electric circuit board tester comprises a contact board (1) configured as a circuit board and contact elements on a testing side, for example its upper side, which can be connected to test points on the circuit board to be tested. The other side of the contact board has contact points (4) electrically connected to the contact elements via conductors (3). Electronic units (8) are releasably secured to the side of the contact board (1) comprising the contact points, such that a physical connection to the contact board (1) and an electrical connection between the electronic units (8) and the contact points (4) are simultaneously achieved.

Abstract: An automated circuit board tester comprises an unstacker (1) arranged upstream of a testing device and which by means of a circuit board picker (40) arranged above a chute (30) picks a top-most circuit board from a stack of circuit boards (55) located in the chute (30). The chute (30) comprises a lifting device including at least two sets of vertically travelling supporting elements (38, 101), each of which is able to carry a stack of circuit boards (55). The chute (30) is open at least on one side so that a set of supporting elements (38, 101) can be loaded while a stack of circuit boards (55) located on the other set of supporting elements (38, 101) is unstacked by the circuit board picker (40).

Abstract: A testing device for a printed circuit includes a plate which is at least partly constituted by semiconducting material, and sensing elements for the transmission of testing signals between the testing device and the printed circuit. The sensing elements may be in the form of projections or coils integral with the plate or in the form of pins receivable in recesses of the plate. The printed circuit has pads for the transfer of testing signals between the circuit and the testing device, and the sensing elements are so densely packed that at least two sensing elements cooperate with each pad.

Abstract: A multispindle machine for drilling, milling or the like of workpieces has several spindles mounted on at least one crossbeam rail (4), and the workpieces and spindles can be displaced relative to one another along X and/or Y coordinates. To minimize machining time, each crossbeam rail mounts at least two spindles (3) which are displaceably independently of one another in the long direction or X coordinate of the crossbeam rail (4).

Abstract: Circuit boards, chips and analogous components having a large number of electric contacts are contacted with an adapter wherein the rear ends of elongated flexible resilient test probes are affixed to a plate-like support and the front ends of the probes extend or can extend beyond the holes of a front plate which is maintained at a fixed distance from the support. Intermediate portions of the probes extend with play through openings in a plate-like flexing member which is movable by a fluid-operated motor in a first direction in parallelism with the front plate to flex the probes preparatory to placing of the front plate and a component to be tested next to each other so that the contacts of the component engage or are adjacent the front ends of the probes. The flexing member thereupon permits the probes to dissipate or to tend to dissipate at least some of the stored energy and urge their front ends against the adjacent contacts.

Abstract: The electrical connecting apparatus tests for electrical faults in an electrical and/or electronic device having a circuit board, wire support or the like equipped with a plurality of blade-terminal strips and/or sleeve-terminal strips has at least one supporting device which has test contacts for testing the blades or sleeves of the blade-terminal strips and/or sleeve-terminal strips of the device being tested and restoring springs which may include a plurality of coil springs. The electrical contact between the socket and/or terminal strip of the device being tested and the test contacts is made by at least partially overcoming the spring forces of the restoring springs.

Abstract: A contact device for evaluating electrical or electronic test articles has a plate arrangement having a plurality of parallel plates in which contact needles are inserted with slide-bearing play. Each contact needle is juxtaposed with a spring-loaded electrically conductive countercontact element. The contact needles are each constituted of a straight pin and a tubular sleeve projecting beyond the rear end of the pin and affixed thereto. A rear plate can serve as an abutment for the sleeves and the countercontact elements have tapered ends engaging in the hollows formed by the respective sleeves and electrically contacts the sleeves at the inner edges of the open ends of these sleeves.

Abstract: A testing arrangement for a printed circuit board includes a carrier for a multiplicity of contact pins which engage the ends of the printed conductors on the printed circuit board. The carrier is positioned above a base which receives a multiplicity of leads connected with a device for testing the printed circuit board. The leads, which are to be connected with respective ones of the contact pins, engage sockets mounted in the base. The connections between the contact pins and the leads are established via a sheet which is located intermediate the base and the carrier and is provided with contacts in the form of thin foils. The contacts face and engage respective ones of the contact pins. The contacts are connected with plugs which are mounted on the intermediate sheet and are inserted into the sockets in the base.