Patents by Inventor Manfred Ruckszio

Manfred Ruckszio has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of and measuring arrangement for contactless on-line measurement
    Patent number: 5358333
    Abstract: With an infrared radiator, the surface temperature of which is kept constant during measurement, a measuring area on a material surface is thermally irradiated with oblique incidence of the rays. The temperature of the reflected thermal radiation is measured by an infrared thermometer, which is arranged above the measuring area in such a way that the reflected radiation falls into the area of coverage of the infrared thermometer. The entire measuring area of the material surface which lies in the field of coverage of the infrared thermometer must be thermally irradiated. The measured temperature variation of the reflected radiation in dependence on the surface condition of the material is stored in a comparison device. A set value for the desired surface condition is fed to this comparison device.
    Type: Grant
    Filed: June 4, 1993
    Date of Patent: October 25, 1994
    Assignee: Hoechst Aktiengesellschaft
    Inventors: Hugo Schmidt, Manfred Ruckszio, Raimund Haas
  • Method of and measuring arrangement for contactless on-line measurement
    Patent number: 5352038
    Abstract: With an infrared radiator, the surface temperature of which is kept constant during measurement, a measuring area on a roughened material surface is thermally irradiated with oblique incidence of the rays. The temperature of the reflected thermal radiation is measured by an infrared thermometer, which is arranged above the measuring area in such a way that the reflected radiation falls into the area of coverage of the infrared thermometer. The entire measuring area of the material surface which lies in the field of coverage of the infrared thermometer must be thermally irradiated. The measured temperature variation of the reflected radiation in dependence on the known surface roughness of the material is stored in a comparison device. This comparison device is fed a set value for the desired surface roughness.
    Type: Grant
    Filed: January 24, 1994
    Date of Patent: October 4, 1994
    Assignee: Hoechst Aktiengesellschaft
    Inventors: Hugo Schmidt, Manfred Ruckszio, Raimund Haas, Walter Mackert