Abstract: A semiconductor test head apparatus using a field programmable gate array (FPGA) is disclosed. A semiconductor test head apparatus using a field programmable gate array, includes a pattern generator for generating a predetermined memory test pattern, a driver/comparator unit comprising a first transceiver which performs a driver function capable of recording a memory test pattern generated from the pattern generator in a device under test and a comparator function capable of comparing a level of a signal read by the device under test with a predetermined high-level reference value, and a second transceiver which performs the driver function and a comparator function capable of comparing a level of a signal read by the device under test with a predetermined low-level reference value, and a connection unit for electrically connecting the first transceiver in parallel to the second transceiver, and connecting the first transceiver and the second transceiver to the device under test.

Abstract: A semiconductor test head apparatus using a field programmable gate array (FPGA) is disclosed. A semiconductor test head apparatus using a field programmable gate array, includes a pattern generator for generating a predetermined memory test pattern, a driver/comparator unit comprising a first transceiver which performs a driver function capable of recording a memory test pattern generated from the pattern generator in a device under test and a comparator function capable of comparing a level of a signal read by the device under test with a predetermined high-level reference value, and a second transceiver which performs the driver function and a comparator function capable of comparing a level of a signal read by the device under test with a predetermined low-level reference value, and a connection unit for electrically connecting the first transceiver in parallel to the second transceiver, and connecting the first transceiver and the second transceiver to the device under test.