Patents by Inventor Mani Balakrishnan

Mani Balakrishnan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11699993
    Abstract: Methods, systems, and devices for signal sampling with offset calibration are described. For example, sampling circuitry may include an input pair of transistors where input signals may be provided to gate nodes of the transistors, and an output signal may be generated based on a comparison of voltages of drain nodes of the transistors. In some examples, source nodes of the transistors may be coupled with each other, such as via a resistance, and each source node may be configured to be coupled with a ground node. In some examples, a conductive path between the source nodes may be coupled with one or more switching components configurable for further coupling of the source nodes with the ground node. In some examples, enabling such switching components may add an electrical characteristic (e.g., capacitance) to the conductive path between the source nodes, which may be configurable to mitigate sampling circuitry imbalances.
    Type: Grant
    Filed: August 5, 2021
    Date of Patent: July 11, 2023
    Assignee: Micron Technology, Inc.
    Inventors: Martin Brox, Thomas Hein, Mani Balakrishnan
  • Publication number: 20220085800
    Abstract: Methods, systems, and devices for signal sampling with offset calibration are described. For example, sampling circuitry may include an input pair of transistors where input signals may be provided to gate nodes of the transistors, and an output signal may be generated based on a comparison of voltages of drain nodes of the transistors. In some examples, source nodes of the transistors may be coupled with each other, such as via a resistance, and each source node may be configured to be coupled with a ground node. In some examples, a conductive path between the source nodes may be coupled with one or more switching components configurable for further coupling of the source nodes with the ground node. In some examples, enabling such switching components may add an electrical characteristic (e.g., capacitance) to the conductive path between the source nodes, which may be configurable to mitigate sampling circuitry imbalances.
    Type: Application
    Filed: August 5, 2021
    Publication date: March 17, 2022
    Inventors: Martin Brox, Thomas Hein, Mani Balakrishnan
  • Patent number: 11251796
    Abstract: A phase-locked loop (PLL) circuit is configured to adjust a value of a bias voltage based on a comparison between a reference clock signal and a feedback clock signal, and an oscillator circuit is configured to provide the feedback clock signal and phase-shifted clock signals based on a value of the bias voltage. A frequency detector of the frequency detector is configured to cause an adjustment to the value of the bias voltage in response to detection of a frequency deviation between the reference clock signal and the feedback clock signal. To avoid a metastable state, the frequency detector is configured to apply an asynchronous delay to one of the reference clock signal or the feedback clock signal prior to detection of the frequency deviation.
    Type: Grant
    Filed: November 16, 2020
    Date of Patent: February 15, 2022
    Assignee: Micron Technology, Inc.
    Inventors: Yasuhiro Takai, Maksim Kuzmenka, Mani Balakrishnan, Martin Brox
  • Publication number: 20210075428
    Abstract: A phase-locked loop (PLL) circuit is configured to adjust a value of a bias voltage based on a comparison between a reference clock signal and a feedback clock signal, and an oscillator circuit is configured to provide the feedback clock signal and phase-shifted clock signals based on a value of the bias voltage. A frequency detector of the frequency detector is configured to cause an adjustment to the value of the bias voltage in response to detection of a frequency deviation between the reference clock signal and the feedback clock signal, To avoid a metastable state, the frequency detector is configured to apply an asynchronous delay to one of the reference clock signal or the feedback clock signal prior to detection of the frequency deviation.
    Type: Application
    Filed: November 16, 2020
    Publication date: March 11, 2021
    Applicant: MICRON TECHNOLOGY, INC.
    Inventors: Yasuhiro Takai, Maksim Kuzmenka, Mani Balakrishnan, Martin Brox
  • Publication number: 20210058090
    Abstract: Disclosed herein is an apparatus that includes a phase frequency detector configured to compare a phase difference between first and second clock signals to generate a phase detection signal, and a slew rate controller configured to lower a slew rate of the first clock signal when a selection signal is in a first state.
    Type: Application
    Filed: August 22, 2019
    Publication date: February 25, 2021
    Applicant: Micron Technology, Inc.
    Inventors: Yasuhiro Takai, Martin Brox, Mani Balakrishnan, Maksim Kuzmenka
  • Patent number: 10931287
    Abstract: Disclosed herein is an apparatus that includes a phase frequency detector configured to compare a phase difference between first and second clock signals to generate a phase detection signal, and a slew rate controller configured to lower a slew rate of the first clock signal when a selection signal is in a first state.
    Type: Grant
    Filed: August 22, 2019
    Date of Patent: February 23, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Yasuhiro Takai, Martin Brox, Mani Balakrishnan, Maksim Kuzmenka
  • Patent number: 10840918
    Abstract: A phase-locked loop (PLL) circuit is configured to adjust a value of a bias voltage based on a comparison between a reference clock signal and a feedback clock signal, and an oscillator circuit is configured to provide the feedback clock signal and phase-shifted clock signals based on a value of the bias voltage. A frequency detector of the frequency detector is configured to cause an adjustment to the value of the bias voltage in response to detection of a frequency deviation between the reference clock signal and the feedback clock signal. To avoid a metastable state, the frequency detector is configured to apply an asynchronous delay to one of the reference clock signal or the feedback clock signal prior to detection of the frequency deviation.
    Type: Grant
    Filed: March 28, 2019
    Date of Patent: November 17, 2020
    Assignee: Micron Technology, Inc.
    Inventors: Yasuhiro Takai, Maksim Kuzmenka, Mani Balakrishnan, Martin Brox
  • Publication number: 20200313678
    Abstract: A phase-locked loop (PLL) circuit is configured to adjust a value of a bias voltage based on a comparison between a reference clock signal and a feedback clock signal, and an oscillator circuit is configured to provide the feedback clock signal and phase-shifted clock signals based on a value of the bias voltage. A frequency detector of the frequency detector is configured to cause an adjustment to the value of the bias voltage in response to detection of a frequency deviation between the reference clock signal and the feedback clock signal. To avoid a metastable state, the frequency detector is configured to apply an asynchronous delay to one of the reference clock signal or the feedback clock signal prior to detection of the frequency deviation.
    Type: Application
    Filed: March 28, 2019
    Publication date: October 1, 2020
    Applicant: MICRON TECHNOLOGY, INC.
    Inventors: Yasuhiro Takai, Maksim Kuzmenka, Mani Balakrishnan, Martin Brox