Abstract: Test system for an intelligent electronic device in an electric sub-station. Examples of a test switch unit are described. Each test switch unit may be utilized for opening of the trip circuit, the shorting of the CT and subsequently isolation of the VT circuits, respectively. Once the trip circuits have been opened, and the CT/VT circuits have been shorted and isolated, respectively, the IED may be tested by providing the appropriate test signals.

Abstract: Test system for an intelligent electronic device in an electric sub-station. Examples of a test switch unit are described. Each test switch unit may be utilized for opening of the trip circuit, the shorting of the CT and subsequently isolation of the VT circuits, respectively. Once the trip circuits have been opened, and the CT/VT circuits have been shorted and isolated, respectively, the IED may be tested by providing the appropriate test signals.

Abstract: A relay base for connection to a plug-in relay is disclosed. The relay base comprises a plurality of connection units. Each connection unit comprises an electrically conductive socket member having a first end configured to receive a pin of the relay, an electrically conductive flexible connector having a first end that is electrically connected to a second end of the socket member, and an electrically conductive insert having a first end that is electrically connected to a second end of the flexible connector. A second end of the insert is configured as an electrical connectivity receptacle (e.g., a screw type terminal comprising a thread for receiving a screw). The configuration of the second end of the insert allows for facilitated making and breaking an electrical connection between the relay and an external wiring.

Abstract: Test system for an intelligent electronic device in an electric sub-station. Examples of a test switch unit are described. Each test switch unit may be utilized for opening of the trip circuit, the shorting of the CT and subsequently isolation of the VT circuits, respectively. Once the trip circuits have been opened, and the CT/VT circuits have been shorted and isolated, respectively, the IED may be tested by providing the appropriate test signals.

Abstract: Test system for an intelligent electronic device in an electric sub-station. Examples of a test switch unit are described. Each test switch unit may be utilized for opening of the trip circuit, the shorting of the CT and subsequently isolation of the VT circuits, respectively. Once the trip circuits have been opened, and the CT/VT circuits have been shorted and isolated, respectively, the IED may be tested by providing the appropriate test signals.