Patents by Inventor Manuel Engesser

Manuel Engesser has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9110090
    Abstract: A piezoresistive micromechanical sensor component includes a substrate, a seismic mass, at least one piezoresistive bar, and a measuring device. The seismic mass is suspended from the substrate such that it can be deflected. The at least one piezoresistive bar is provided between the substrate and the seismic mass and is subject to a change in resistance when the seismic mass is deflected. The at least one piezoresistive bar has a lateral and/or upper and/or lower conductor track which at least partially covers the piezoresistive bar and extends into the region of the substrate. The measuring device is electrically connected to the substrate and to the conductor track and is configured to measure the change in resistance over a circuit path which runs from the substrate through the piezoresistive bar and from the piezoresistive bar through the lateral and/or upper and/or lower conductor track.
    Type: Grant
    Filed: January 19, 2011
    Date of Patent: August 18, 2015
    Assignee: Robert Bosch GmbH
    Inventors: Reinhard Neul, Christian Rettig, Achim Trautmann, Daniel Christoph Meisel, Alexander Buhmann, Manuel Engesser, Ando Feyh
  • Publication number: 20130098154
    Abstract: A piezoresistive micromechanical sensor component includes a substrate, a seismic mass, at least one piezoresistive bar, and a measuring device. The seismic mass is suspended from the substrate such that it can be deflected. The at least one piezoresistive bar is provided between the substrate and the seismic mass and is subject to a change in resistance when the seismic mass is deflected. The at least one piezoresistive bar has a lateral and/or upper and/or lower conductor track which at least partially covers the piezoresistive bar and extends into the region of the substrate. The measuring device is electrically connected to the substrate and to the conductor track and is configured to measure the change in resistance over a circuit path which runs from the substrate through the piezoresistive bar and from the piezoresistive bar through the lateral and/or upper and/or lower conductor track.
    Type: Application
    Filed: January 19, 2011
    Publication date: April 25, 2013
    Applicant: Robert Bosch GmbH
    Inventors: Reinhard Neul, Christian Rettig, Achim Trautmann, Daniel Christoph Meisel, Alexander Buhmann, Manuel Engesser, Ando Feyh