Abstract: A method is for testing the structural integrity of a metal joint such as a weld. The method includes applying stress to the metal joint, and measuring a resistance of a circuit including the metal joint during application of the stress to the metal joint. A structural integrity of the metal joint is determined by comparing the measured resistance with a baseline resistance.

Abstract: A method is for testing the structural integrity of a metal joint such as a weld. The method includes applying stress to the metal joint, and measuring a resistance of a circuit including the metal joint during application of the stress to the metal joint. A structural integrity of the metal joint is determined by comparing the measured resistance with a baseline resistance.

Abstract: A method is provided for detecting mura defects in a master panel during fabrication, the master panel containing multiple flat screen displays. The method includes preparing a combined image from image data of the master panel; enhancing the quality of the combined image, including removing artifacts from the combined image; filtering the enhanced quality combined image to detect local mura defects, the local mura defects including at least one structured pattern of defined geometric shapes; applying different candidate patterns to the filtered combined image; selecting one of the candidate patterns as a defect detection pattern, the defect detection pattern being closest to the structured pattern of defined geometric shapes of the detected local mura defects; and displaying at least a portion of the defect detection pattern on a display, together with the quality-enhanced combined image.

Abstract: An illumination system and a method for operating an illumination system is disclosed. The illumination system includes a generator spatial light modulator, first and second optical systems and a controller. The generator spatial light modulator is positioned to receive an incident light beam and adapted to generate first and second coherent light beams, each beam being characterized by a phase and a first light beam optical axis in a plane containing the first and second coherent light beams. The first optical system images light leaving the generator spatial light modulator on a modulator spatial light modulator that alters the phase of one of the first and second coherent light beams to generate a relative phase difference. The second optical system that images light leaving the modulator spatial light modulator onto a sample to be illuminated. The controller causes the relative phase difference to cycle through a plurality of different phase-difference values.

Abstract: A method is provided for detecting mura defects in a master panel during fabrication, the master panel containing multiple flat screen displays. The method includes preparing a combined image from image data of the master panel; enhancing the quality of the combined image, including removing artifacts from the combined image; filtering the enhanced quality combined image to detect local mura defects, the local mura defects including at least one structured pattern of defined geometric shapes; applying different candidate patterns to the filtered combined image; selecting one of the candidate patterns as a defect detection pattern, the defect detection pattern being closest to the structured pattern of defined geometric shapes of the detected local mura defects; and displaying at least a portion of the defect detection pattern on a display, together with the quality-enhanced combined image.

Abstract: An illumination system and method for operating the same is disclosed. The illumination system includes a spatial light modulator (SLM), first and second optical systems, a controller and a mask. The SLM is positioned to receive an incident light beam. The first optical system images light leaving the SLM onto the mask that blocks part of the light. The second optical system images light leaving the mask onto a sample to be illuminated. The controller causes the SLM to display an SLM pattern that generates an illumination beam and a spurious light beam from the incident light beam, the illumination beam passing through the mask, wherein the mask includes a fixed part having a plurality of openings and a moveable part that moves in relation to the fixed part and that includes an opening.

Abstract: An illumination system and method for operating the same is disclosed. The illumination system includes a spatial light modulator (SLM), first and second optical systems, a controller and a mask. The SLM is positioned to receive an incident light beam. The first optical system images light leaving the SLM onto the mask that blocks part of the light. The second optical system images light leaving the mask onto a sample to be illuminated. The controller causes the SLM to display an SLM pattern that generates an illumination beam and a spurious light beam from the incident light beam, the illumination beam passing through the mask, wherein the mask includes a fixed part having a plurality of openings and a moveable part that moves in relation to the fixed part and that includes an opening.

Abstract: An apparatus and method for measuring the mobility of molecules in a sample are disclosed. Molecules in a sample are tagged with a dye having active and inactive states that are generated by exposing dye to light of an activation wavelength and an inactivation wavelength, respectively, the activation wavelength being different from the inactivation wavelength. The sample is illuminated in a microscope with a light pattern that includes a first region in which the dye is activated and a second adjacent region in which the first dye is inactivated. After the sample is so illuminated, an image of the activated first molecules is recorded when the first molecules are illuminated with light of an excitation wavelength. Molecules having the first dye in the inactive state are distinguishable from molecules having the first dye in the active state in the microscope when illuminated with light of the excitation wavelength.

Abstract: A microscope having a first illumination spatial light modulator (SLM) that receives light of a first wavelength from an illumination source and processes that light in a manner that transfers light into an objective lens through a dichroic reflector that passes light of the first wavelength is disclosed. The microscope includes an imaging system that receives light from the objective lens and forms an image on a camera, and a controller having a graphical user input that displays the image to a user and controls the first illumination SLM to alter the processing of the light in response to commands from the user. The illumination SLM is controlled to provide functions that would normally be carried out by one or more lenses or prisms in the illumination optical train of a conventional microscope and/or correct for alignment errors in the illumination source.

Abstract: An apparatus and method for measuring the mobility of molecules in a sample are disclosed. Molecules in a sample are tagged with a dye having active and inactive states that are generated by exposing dye to light of an activation wavelength and an inactivation wavelength, respectively, the activation wavelength being different from the inactivation wavelength. The sample is illuminated in a microscope with a light pattern that includes a first region in which the dye is activated and a second adjacent region in which the first dye is inactivated. After the sample is so illuminated, an image of the activated first molecules is recorded when the first molecules are illuminated with light of an excitation wavelength. Molecules having the first dye in the inactive state are distinguishable from molecules having the first dye in the active state in the microscope when illuminated with light of the excitation wavelength.