Patents by Inventor Marc-Andre Daigneault

Marc-Andre Daigneault has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240330548
    Abstract: Emulating a circuit design includes receiving a circuit design. The circuit design is mapped onto integrated circuit (IC) devices. Further, the circuit design that is mapped onto the IC devices is instrumented by inserting a first change detection circuit and a first synchronization circuit. The first synchronization circuit is connected to the first change detection circuit and stops emulation on one of the IC devices based on an output of the first change detection circuit and completion of a first one or more emulation cycles. Further, the IC devices are provided for emulation.
    Type: Application
    Filed: March 28, 2023
    Publication date: October 3, 2024
    Inventors: Etienne LEPERCQ, Mikhail BERSHTEYN, Marc-Andre DAIGNEAULT
  • Patent number: 10467368
    Abstract: A computer-implemented method generates a plurality of clusters based on components included in a design under test (DUT); classifies a subset of clusters of the plurality of clusters as tangled clusters; modifies at least two tangled clusters of the subset of clusters based on overlap between the at least two tangled clusters; determines, for each tangled cluster in the subset of clusters, a gate count based on the interconnectivity of the tangled cluster; and partitions the DUT among a plurality of field-programmable gate arrays (FPGAs) based on the gate count determined for each tangled cluster from the subset of clusters.
    Type: Grant
    Filed: November 8, 2017
    Date of Patent: November 5, 2019
    Assignee: Synopsys, Inc.
    Inventors: Etienne Lepercq, Jiahua Zhu, Jiong Cao, Marc-Andre Daigneault
  • Publication number: 20180150582
    Abstract: A computer-implemented method generates a plurality of clusters based on components included in a design under test (DUT); classifies a subset of clusters of the plurality of clusters as tangled clusters; modifies at least two tangled clusters of the subset of clusters based on overlap between the at least two tangled clusters; determines, for each tangled cluster in the subset of clusters, a gate count based on the interconnectivity of the tangled cluster; and partitions the DUT among a plurality of field-programmable gate arrays (FPGAs) based on the gate count determined for each tangled cluster from the subset of clusters.
    Type: Application
    Filed: November 8, 2017
    Publication date: May 31, 2018
    Inventors: Etienne Lepercq, Jiahua Zhu, Jiong Cao, Marc-Andre Daigneault