Patents by Inventor Marc Andreas MÖRIG

Marc Andreas MÖRIG has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11103198
    Abstract: A production method for test X-ray includes preparation (S10) of first CT data (B) of an inspection object, second CT data (BM) for metal portions of the inspection object, and third CT data (TM) for metal portions of a target object, transformation (S20) of the first, second, and third CT data (B, BM, TM) from the image space (BR) into corresponding first sinogram data (SB), second sinogram data (SBM), and third sinogram data (STM) in the radon space (RR), calculation (S30, S40) of the artifact sinogram data (SA), back-transformation (S50) of the artifact sinogram data (SA) from the radon space (RR) into the image space (BR) in CT artifact data (A) for the artifacts that are to be inserted, and insertion of the CT artifact data (A) into the first CT data (B).
    Type: Grant
    Filed: February 5, 2018
    Date of Patent: August 31, 2021
    Assignee: SMITHS DETECTION GERMANY GMBH
    Inventors: Markus Durzinsky, Marc Andreas Mörig, Sebastian König
  • Publication number: 20200000417
    Abstract: A production method for test X-ray includes preparation (S10) of first CT data (B) of an inspection object, second CT data (BM) for metal portions of the inspection object, and third CT data (TM) for metal portions of a target object, transformation (S20) of the first, second, and third CT data (B, BM, TM) from the image space (BR) into corresponding first sinogram data (SB), second sinogram data (SBM), and third sinogram data (STM) in the radon space (RR), calculation (S30, S40) of the artifact sinogram data (SA), back-transformation (S50) of the artifact sinogram data (SA) from the radon space (RR) into the image space (BR) in CT artifact data (A) for the artifacts that are to be inserted, and insertion of the CT artifact data (A) into the first CT data (B).
    Type: Application
    Filed: February 5, 2018
    Publication date: January 2, 2020
    Inventors: Markus DURZINSKY, Marc Andreas MÖRIG, Sebastian KÖNIG