Patents by Inventor Marc Coq

Marc Coq has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11105863
    Abstract: A method and system for re-using the electrical energy of an electronic component under test. The method and system includes combining a first direct current voltage output of an electronic component under test with a second direct current voltage of a device. The combined first direct current voltage and second direct current voltage are regulated to create a power. The power functions a system application. At least one metric of the electronic component under test is monitored.
    Type: Grant
    Filed: January 9, 2019
    Date of Patent: August 31, 2021
    Assignee: International Business Machines Corporation
    Inventors: Marc Coq, Randhir S. Malik
  • Publication number: 20190146041
    Abstract: A method and system for re-using the electrical energy of an electronic component under test. The method and system includes combining a first direct current voltage output of an electronic component under test with a second direct current voltage of a device. The combined first direct current voltage and second direct current voltage are regulated to create a power. The power functions a system application. At least one metric of the electronic component under test is monitored.
    Type: Application
    Filed: January 9, 2019
    Publication date: May 16, 2019
    Inventors: Marc Coq, Randhir S. Malik
  • Patent number: 10241156
    Abstract: A method and system for re-using the electrical energy of an electronic component under test. The method and system includes combining a first direct current voltage output of an electronic component under test with a second direct current voltage of a device. The combined first direct current voltage and second direct current voltage are regulated to create a power. The power functions a system application. At least one metric of the electronic component under test is monitored.
    Type: Grant
    Filed: July 17, 2015
    Date of Patent: March 26, 2019
    Assignee: International Business Machines Corporation
    Inventors: Marc Coq, Randhir S. Malik
  • Publication number: 20170016964
    Abstract: A method and system for re-using the electrical energy of an electronic component under test. The method and system includes combining a first direct current voltage output of an electronic component under test with a second direct current voltage of a device. The combined first direct current voltage and second direct current voltage are regulated to create a power. The power functions a system application. At least one metric of the electronic component under test is monitored.
    Type: Application
    Filed: July 17, 2015
    Publication date: January 19, 2017
    Inventors: Marc Coq, Randhir S. Malik
  • Patent number: 9529058
    Abstract: Low-impedance pins are electrically connected to a set of corresponding nodes of a multi-phase VRM. The multi-phase VRM is activated. A failure condition is induced in a phase of the multi-phase VRM by modifying operating parameters of the phase of the multi-phase VRM using the set of low-impedance pins. The output signal of the multi-phase VRM is monitored in response to the induced failure condition.
    Type: Grant
    Filed: April 18, 2014
    Date of Patent: December 27, 2016
    Assignee: International Business Machines Corporation
    Inventors: Yakup Bulur, Marc Coq, Richard J. Fishbune, Eric B. Swenson
  • Publication number: 20150301124
    Abstract: Low-impedance pins are electrically connected to a set of corresponding nodes of a multi-phase VRM. The multi-phase VRM is activated. A failure condition is induced in a phase of the multi-phase VRM by modifying operating parameters of the phase of the multi-phase VRM using the set of low-impedance pins. The output signal of the multi-phase VRM is monitored in response to the induced failure condition.
    Type: Application
    Filed: April 18, 2014
    Publication date: October 22, 2015
    Applicant: International Business Machines Corporation
    Inventors: Yakup Bulur, Marc Coq, Richard J. Fishbune, Eric B. Swenson
  • Patent number: 9164142
    Abstract: An approach is provided in which a system under test is subjected to thermal cycling that include transferring the system under test between two different environments that generate two different ambient temperatures. In turn, a test system tests the electronic assembly in response to the electronic assembly being subjected to the thermal cycles.
    Type: Grant
    Filed: November 7, 2012
    Date of Patent: October 20, 2015
    Assignee: International Business Machines Corporation
    Inventors: Marc Coq, Richard J. Fishbune
  • Publication number: 20140125365
    Abstract: An approach is provided in which a system under test is subjected to thermal cycling that include transferring the system under test between two different environments that generate two different ambient temperatures. In turn, a test system tests the electronic assembly in response to the electronic assembly being subjected to the thermal cycles.
    Type: Application
    Filed: November 7, 2012
    Publication date: May 8, 2014
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Marc Coq, Richard J. Fishbune