Patents by Inventor Marc Kirch

Marc Kirch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9063336
    Abstract: An optical element for use in an illumination optical unit of an EUV microlithography projection exposure apparatus includes a plurality of reflective facet elements. Each reflective facet element has at least one reflective surface. In this case, at least one facet element is arranged in a manner rotatable about a rotation axis. The rotation axis intersects the at least one reflective surface of the facet element. With such an optical element, it is possible to alter the direction and/or the intensity of at least part of the illumination radiation within the illumination optical unit in a simple manner.
    Type: Grant
    Filed: June 1, 2012
    Date of Patent: June 23, 2015
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Marc Kirch, Martin Endres, Damian Fiolka, Joachim Hartjes
  • Patent number: 8587767
    Abstract: Illumination optics for EUV microlithography guide an illumination light bundle from a radiation source to an object field with an extension ratio between a longer field dimension and a shorter field dimension, where the ratio is considerably greater than 1.
    Type: Grant
    Filed: October 29, 2010
    Date of Patent: November 19, 2013
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Damian Fiolka, Berndt Warm, Christian Steigerwald, Martin Endres, Ralf Stuetzle, Jens Ossmann, Ralf Scharnweber, Markus Hauf, Udo Dinger, Severin Waldis, Marc Kirch, Joachim Hartjes
  • Patent number: 8395754
    Abstract: An illumination optical unit for EUV microlithography includes a first optical element having a plurality of first reflective facet elements and a second optical element having a plurality of second reflective facet elements. Each first reflective facet element from the plurality of the first reflective facet elements has a respective maximum number of different positions which defines a set—associated with the first facet element—consisting of second reflective facet elements in that the set consists of all second facet elements onto which the first facet element directs radiation in its different positions during the operation of the illumination optical unit. The plurality of second reflective facet element forms a plurality of disjoint groups, wherein each of the groups and each of the sets contain at least two second facet elements, and there are no two second facet elements of a set which belong to the same group.
    Type: Grant
    Filed: November 18, 2010
    Date of Patent: March 12, 2013
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Martin Endres, Sebastian Doern, Stig Bieling, Marc Kirch
  • Publication number: 20120293785
    Abstract: An optical element for use in an illumination optical unit of an EUV microlithography projection exposure apparatus includes a plurality of reflective facet elements. Each reflective facet element has at least one reflective surface. In this case, at least one facet element is arranged in a manner rotatable about a rotation axis. The rotation axis intersects the at least one reflective surface of the facet element. With such an optical element, it is possible to alter the direction and/or the intensity of at least part of the illumination radiation within the illumination optical unit in a simple manner.
    Type: Application
    Filed: June 1, 2012
    Publication date: November 22, 2012
    Applicant: CARL ZEISS SMT GMBH
    Inventors: Marc Kirch, Martin Endres, Damian Fiolka, Joachim Hartjes
  • Publication number: 20110141445
    Abstract: An illumination optical unit for EUV microlithography includes a first optical element having a plurality of first reflective facet elements and a second optical element having a plurality of second reflective facet elements. Each first reflective facet element from the plurality of the first reflective facet elements has a respective maximum number of different positions which defines a set—associated with the first facet element—consisting of second reflective facet elements in that the set consists of all second facet elements onto which the first facet element directs radiation in its different positions during the operation of the illumination optical unit. The plurality of second reflective facet element forms a plurality of disjoint groups, wherein each of the groups and each of the sets contain at least two second facet elements, and there are no two second facet elements of a set which belong to the same group.
    Type: Application
    Filed: November 18, 2010
    Publication date: June 16, 2011
    Applicant: Carl Zeiss SMT GmbH
    Inventors: Martin Endres, Sebastian Doern, Stig Bieling, Marc Kirch
  • Publication number: 20110063598
    Abstract: An illumination optics for EUV microlithography guides an illumination light bundle from a radiation source to an object field with an extension ratio between a longer field dimension and a shorter field dimension, where the ratio is considerably greater than 1. A field facet mirror has a plurality of field facets that set defined illumination conditions in the object field. A following optics downstream of the field facet mirror transmits the illumination light into the object field. The following optics includes a pupil facet mirror with a plurality of pupil facets. The field facets are in each case individually allocated to the pupil facets so that portions of the illumination light bundle impinging upon in each case one of the field facets are guided on to the object field via the associated pupil facet.
    Type: Application
    Filed: October 29, 2010
    Publication date: March 17, 2011
    Applicant: CARL ZEISS SMT GMBH
    Inventors: Damian Fiolka, Berndt Warm, Christian Steigerwald, Martin Endres, Ralf Stuetzle, Jens Ossmann, Ralf Scharnweber, Markus Hauf, Udo Dinger, Severin Waldis, Marc Kirch, Joachim Hartjes