Patents by Inventor Marc Lany
Marc Lany has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 12209858Abstract: The invention relates to a rotatable inspection device (10) for inspection of the integrity of an axisymmetric portion (210) of parts (200), for example a threaded tube (200). The rotatable inspection device (10) includes a measuring unit (20) configured to be rotated about the symmetry axis of the axisymmetric portion (210). The measuring unit (20) comprises: i) a radially movable measuring structure (22) comprising a defect detection sensor (30), wherein said measuring structure (22) is configured to urge the defect detection sensor (30) against said portion (210) to be inspected; ii) an electronic device (43) for processing and transmitting the signal measured by the defect detection sensor (30) along said portion (210), and iii) a measuring unit support (50) supporting the radially movable measuring structure (22). The electronic device (43) is configured to wirelessly transmit the processed signal to a remote monitoring unit (300).Type: GrantFiled: May 20, 2020Date of Patent: January 28, 2025Assignee: Sensima Inspection SàrlInventors: Marc Lany, Alain Berthoud, Julien Hubleur, Bernard Revaz, Gilles Santi, Frédéric Monnier
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Publication number: 20250010375Abstract: The present invention relates to a method for manufacturing, monitoring and classifying an AM metal part. The AM part is manufactured by a powder-bed additive manufacturing machine comprising a build plate (BP), a recoater (RC) and at least one electromagnetic sensor (ECS) mounted on the recoater.Type: ApplicationFiled: July 8, 2024Publication date: January 9, 2025Applicant: Amiquam SAInventors: Bernard Revaz, Jonatan Wicht, Alain Berthoud, Marc Lany, Gilles Santi, Marvin A. Spurek, Adriaan B. Spierings
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Patent number: 12097662Abstract: The invention concerns a method for additive manufacturing a component by repetitively superposing and solidifying material layers according to a 3D model of the component. The method comprises the steps of scan, by means of an eddy current sensing unit (20), of a new solidified cross section (15) obtained by selectively solidifying a material layer so as to provide an integrity data (VMM) of a sensed portion (23). A difference between the sensed integrity data (VMM) and an expected integrity data (VEE) is then executed for detecting a manufacturing anomaly within this portion. The expected integrity data (VEE) is determined based on collected integrity data of a solid basic structure likely matching or being identical to a geometrical structure (41) obtained from the 3D model (40) of a portion corresponding to said sensed portion (23), said solid basic structure being manufactured or simulated according to another 3D model.Type: GrantFiled: November 8, 2018Date of Patent: September 24, 2024Assignee: SENSIMA INSPECTION SÅRLInventors: Marc Lany, Frédéric Monnier, Bernard Revaz, Gilles Santi, Adrian Spierings, Philipp Stoll, Alexandre Staub
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Publication number: 20240094427Abstract: The invention concerns a shoe scanning system for a full-body scanners canning an individual before access to a restricted access area. The system comprises a detection unit (10) comprising: a detector for sensing a metal and/or unauthorized object located above a surface (111) onto which the individual can walk; a communication unit for transmitting a message to an indication unit for providing instructions to the individual and/or to an assistant; and a processing unit connected to the detector by a data link for receiving data and controlling the communication unit for sending a detection signal when the detector indicates a presence of a metal and/or unauthorized object. The detector comprises a short-range sensing element (122) and a long-range sensing element (123) for detecting a metal and/or unauthorized object up to a maximal distance (1231) greater than the maximal distance of the short-range sensing element.Type: ApplicationFiled: November 30, 2023Publication date: March 21, 2024Applicant: Sedect SAInventors: Frédéric Monnier, Marc Lany, Luis Filipe Soldado Granadeiro Rosado, Gilles Santi, Bernard Revaz, Alain Berthoud
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Publication number: 20240082924Abstract: A method of monitoring metal pieces including generating, on a computing device, a 3D digital model of a metal piece to be produced by additive manufacturing; and identifying regions of interest in the model where defects are more likely to occur during manufacturing The regions of interest are identified using software to check the model according to specific design rules. N NDT sensors are either: selectively activated among a total of M NDT sensors, or mounted on a sensor supporting structure at specific locations along an axis. The N NDT sensors are selectively activated or mounted as a function of the regions of interest identified in the model to retrieve data on the properties of the quality of metal parts of the metal piece only for the corresponding regions of interest of the metal piece during its additive manufacturing. Also, a system is configured to carry out the method.Type: ApplicationFiled: January 11, 2021Publication date: March 14, 2024Inventors: Bernard Revaz, Marc Lany, Gilles Santi, Adriaan B Spierings, Marvin A Spurek
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Patent number: 11630230Abstract: The invention concerns a system (1) and a method for scanning a person (2) before access to a restricted access area (3), comprising a processing unit (14) and a metal detector (10, 70) for detecting metal in the shoes (20) or in a waist portion of the person walking on a surface (15). The processing unit controls an indication unit (12, 13) for: letting the person walk towards the restricted area if a first scan indicates the probability of the presence of metal lower than a first threshold; in case of a probability higher than the first threshold, prompting the person to carry out a second scan close to a mark (11) on the carpet; and prompting the user to remove his shoes or object if the first scan indicates a probability higher than a second threshold, or if the second scan indicates a probability higher than a third threshold.Type: GrantFiled: November 22, 2017Date of Patent: April 18, 2023Assignee: Sedect SAInventors: Frédéric Monnier, Marc Lany, Luis Filipe Soldado Granadeiro Rosado, Gilles Santi, Bernard Revaz, Alain Berthoud
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Publication number: 20230083004Abstract: Disclosed herein is a method for monitoring a health status of one or of a plurality of bridges (10) under normal traffic condition.Type: ApplicationFiled: February 4, 2021Publication date: March 16, 2023Inventors: Marc LANY, Frédéric MONNIER, Gilles SANTI, Bernard REVAZ
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Patent number: 11454735Abstract: The invention concerns a method and a system (1) for detecting a threat in a shoe (21, 22) worn by an individual (2) accessing a restricted access area (50) through a security access point (51). The method comprises obtaining a first response provided by a first metal detector (11) by sensing a pair of shoes worn by the individual. The first response is compared with a signature signal representing a shoe comprising a threat or an object representing a threat so to indicate a critical pair of shoes. In such case, the method further comprises prompting the individual to place the critical pair of shoes at a predefined position to obtain a second response provided by the first or by a second metal detector (12, 13) by sensing one shoe of said critical pair of shoes. A potential threat is detected by comparing the second response with the signature signal.Type: GrantFiled: November 21, 2018Date of Patent: September 27, 2022Assignee: Sedect SAInventors: Frédéric Monnier, Marc Lany, Luis Filipe Soldado Granadeiro Rosado, Gilles Santi, Bernard Revaz, Alain Berthoud
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Publication number: 20220228849Abstract: The invention relates to a rotatable inspection device (10) for inspection of the integrity of an axisymmetric portion (210) of parts (200), for example a threaded tube (200). The rotatable inspection device (10) includes a measuring unit (20) configured to be rotated about the symmetry axis of the axisymmetric portion (210). The measuring unit (20) comprises: i) a radially movable measuring structure (22) comprising a defect detection sensor (30), wherein said measuring structure (22) is configured to urge the defect detection sensor (30) against said portion (210) to be inspected; ii) an electronic device (43) for processing and transmitting the signal measured by the defect detection sensor (30) along said portion (210), and iii) a measuring unit support (50) supporting the radially movable measuring structure (22). The electronic device (43) is configured to wirelessly transmit the processed signal to a remote monitoring unit (300).Type: ApplicationFiled: May 20, 2020Publication date: July 21, 2022Inventors: Marc LANY, Alain BERTHOUD, Julien HUBLEUR, Bernard REVAZ, Gilles SANTI, Frédéric MONNIER
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Publication number: 20210154745Abstract: The invention concerns a method for additive manufacturing a component by repetitively superposing and solidifying material layers according to a 3D model of the component. The method comprises the steps of scan, by means of an eddy current sensing unit (20), of a new solidified cross section (15) obtained by selectively solidifying a material layer so as to provide an integrity data (VMM) of a sensed portion (23). A difference between the sensed integrity data (VMM) and an expected integrity data (VEE) is then executed for detecting a manufacturing anomaly within this portion. The expected integrity data (VEE) is determined based on collected integrity data of a solid basic structure likely matching or being identical to a geometrical structure (41) obtained from the 3D model (40) of a portion corresponding to said sensed portion (23), said solid basic structure being manufactured or simulated according to another 3D model.Type: ApplicationFiled: November 8, 2018Publication date: May 27, 2021Inventors: Marc LANY, Frédéric MONNIER, Bernard REVAZ, Gilles SANTI, Adrian SPIERINGS, Philipp STOLL, Alexandre STAUB
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Publication number: 20200348435Abstract: The invention concerns a method and a system (1) for detecting a threat in a shoe (21, 22) worn by an individual (2) accessing a restricted access area (50) through a security access point (51). The method comprises obtaining a first response provided by a first metal detector (11) by sensing a pair of shoes worn by the individual. The first response is compared with a signature signal representing a shoe comprising a threat or an object representing a threat so to indicate a critical pair of shoes. In such case, the method further comprises prompting the individual to place the critical pair of shoes at a predefined position to obtain a second response provided by the first or by a second metal detector (12, 13) by sensing one shoe of said critical pair of shoes. A potential threat is detected by comparing the second response with the signature signal.Type: ApplicationFiled: November 21, 2018Publication date: November 5, 2020Inventors: Frédéric MONNIER, Marc LANY, Luis Filipe SOLDADO GRANADEIRO ROSADO, Gilles SANTI, Bernard REVAZ, Alain BERTHOUD
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Publication number: 20200103546Abstract: The invention concerns a shoe scanning system for a full-body scanners canning an individual before access to a restricted access area. The system comprises a detection unit (10) comprising: a detector for sensing a metal and/or unauthorized object located above a surface (111) onto which the individual can walk; a communication unit for transmitting a message to an indication unit for providing instructions to the individual and/or to an assistant; and a processing unit connected to the detector by a data link for receiving data and controlling the communication unit for sending a detection signal when the detector indicates a presence of a metal and/or unauthorized object. The detector comprises a short-range sensing element (122) and a long-range sensing element (123) for detecting a metal and/or unauthorized object up to a maximal distance (1231) greater than the maximal distance of the short-range sensing element.Type: ApplicationFiled: June 8, 2018Publication date: April 2, 2020Inventors: Frédéric Monnier, Marc LANY, Luis Filipe SOLDADO GRANADEIRQ ROSADO, Giiles SANTI, Bernard REVAZ, Alan BERTHOUD
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Publication number: 20190353817Abstract: The invention concerns a system (1) and a method for scanning a person (2) before access to a restricted access area (3) comprising a processing unit (14) and a metal detector (10, 70) for detecting metal in the shoes (20) or in a waist portion of the person walking on a surface (15). The processing unit controls an indication unit (12, 13) for: letting the person walk towards the restricted area if a first scan indicates the probability of the presence of metal lower than a first threshold; in case of a probability higher than the first threshold, prompting the person to carry out a second scan close to a mark (11) on the carpet; and prompting the 10 user to remove his shoes or object if the first scan indicates a probability higher than a second threshold, or if the second scan indicates a probability higher than a third threshold.Type: ApplicationFiled: November 22, 2017Publication date: November 21, 2019Inventors: Frédéric MONNIER, Marc LANY, Luis Filpe SOLDADO GRANADEIRO ROSADO, Gilles SANTI, Bernard REVAZ, Alain BERTHOUD
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Patent number: 9006853Abstract: A photodetector disclosed herein comprises an avalanche transistor having a reference junction structure in which temperature characteristics of a current amplification factor are about the same as those of an avalanche photodiode and which is reverse-biased, and a current injection junction structure which injects a reference current to the reference junction structure and which is forward-biased. Voltages to be applied to the avalanche photodiode and the reference junction structure are controlled so that the amplification factor of the reference current amplified in the reference junction structure is retained at a predetermined value, whereby the temperature characteristics of the photodetector utilizing an avalanche effect can be stabilized.Type: GrantFiled: March 22, 2011Date of Patent: April 14, 2015Assignee: Toyota Jidosha Kabushiki KaishaInventors: Kota Ito, Mineki Soga, Cristiano Niclass, Radivoje S. Popovic, Marc Lany, Toshiki Kindo
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Publication number: 20120248295Abstract: A photodetector disclosed herein comprises an avalanche transistor having a reference junction structure in which temperature characteristics of a current amplification factor are about the same as those of an avalanche photodiode and which is reverse-biased, and a current injection junction structure which injects a reference current to the reference junction structure and which is forward-biased. Voltages to be applied to the avalanche photodiode and the reference junction structure are controlled so that the amplification factor of the reference current amplified in the reference junction structure is retained at a predetermined value, whereby the temperature characteristics of the photodetector utilizing an avalanche effect can be stabilized.Type: ApplicationFiled: March 22, 2011Publication date: October 4, 2012Applicant: TOYOTA JIDOSHA KABUSHIKI KAISHAInventors: Kota Ito, Mineki Soga, Cristiano Niclass, Radivoje S. Popovic, Marc Lany, Toshiki Kindo
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Patent number: 8067953Abstract: A semiconductor device for measuring ultra low currents down to the level of single electrons or low voltages comprises a first and a second voltage supply terminal, an input terminal for receiving an electrical current or being supplied with a voltage to be measured, a bipolar transistor having a base, an emitter and a collector, wherein a first PN junction is formed between the base and the collector and a second PN junction is formed between the base and the emitter, wherein the emitter is coupled to the input terminal and the base is coupled to the second voltage supply terminal, and wherein the first PN junction is designed for reverse biased operation as an avalanche diode, and a quenching and recharging circuit having a first terminal coupled to the first voltage supply terminal and a second terminal coupled to the collector of the bipolar transistors, the quenching and recharging circuit permitting operation of the first PN junction reverse biased above the breakdown voltage of the first PN junction.Type: GrantFiled: December 17, 2007Date of Patent: November 29, 2011Assignee: Ecole Polytechnique Federale De LausanneInventors: Marc Lany, Radivoje Popovic
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Publication number: 20100013458Abstract: A semiconductor device for measuring ultra low currents down to the level of single electrons or low voltages comprises a first and a second voltage supply terminal, an input terminal for receiving an electrical current or being supplied with a voltage to be measured, a bipolar transistor having a base, an emitter and a collector, wherein a first PN junction is formed between the base and the collector and a second PN junction is formed between the base and the emitter, wherein the emitter is coupled to the input terminal and the base is coupled to the second voltage supply terminal, and wherein the first PN junction is designed for reverse biased operation as an avalanche diode, and a quenching and recharging circuit having a first terminal coupled to the first voltage supply terminal and a second terminal coupled to the collector of the bipolar transistors, the quenching and recharging circuit permitting operation of the first PN junction reverse biased above the breakdown voltage of the first PN junction.Type: ApplicationFiled: December 17, 2007Publication date: January 21, 2010Inventors: Marc Lany, Radivoje Popovic