Abstract: A handheld work apparatus includes a motor, a transmission shaft, a tool, a guide tube, a housing, and a first anti-vibration element. The motor via the transmission shaft drives the tool. The transmission shaft is received in the guide tube. The motor is disposed in the housing. The tool is disposed on a front longitudinal end of the guide tube. The housing is disposed on the rear longitudinal end of the guide tube. The housing at least partially encompasses the guide tube, wherein the guide tube projects from the housing. The first anti-vibration element is disposed such that it acts in a vibration-decoupling manner between the housing and the guide tube. The first anti-vibration element is disposed on that side of the motor facing the tool. The handheld work apparatus includes a second anti-vibration element connecting the motor to the housing in an at least indirectly vibration-decoupled manner.

Abstract: An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface. The DUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example, the DUT interface is configured for establishing an electronic signal path between the test head and a DUT board or load board, which holds the DUT or which provides a connection to the DUT. The automated test equipment is configured to allow for a variation of a distance between at least two blocks of spring-loaded pins.

Abstract: An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface. The DUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example, the DUT interface is configured for establishing an electronic signal path between the test head and a DUT board or load board, which holds the DUT or which provides a connection to the DUT. The automated test equipment is configured to allow for a variation of a distance between at least two blocks of spring-loaded pins.

Abstract: An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface. The DUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example, the DUT interface is configured for establishing an electronic signal path between the test head and a DUT board or load board, which holds the DUT or which provides a connection to the DUT. The automated test equipment is configured to allow for a variation of a distance between at least two blocks of spring-loaded pins.

Abstract: An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface. The DUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example, the DUT interface is configured for establishing an electronic signal path between the test head and a DUT board or load board, which holds the DUT or which provides a connection to the DUT. The automated test equipment is configured to allow for a variation of a distance between at least two blocks of spring-loaded pins.

Abstract: An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface. The DUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example, the DUT interface is configured for establishing an electronic signal path between the test head and a DUT board or load board, which holds the DUT or which provides a connection to the DUT. The automated test equipment is configured to allow for a variation of a distance between at least two blocks of spring-loaded pins.

Abstract: An automated test equipment for testing one or more DUTs comprises a test head and a DUT interface. The DUT interface comprises a plurality of blocks of spring-loaded pins, for example groups or fields of spring-loaded pins. For example, the DUT interface is configured for establishing an electronic signal path between the test head and a DUT board or load board, which holds the DUT or which provides a connection to the DUT. The automated test equipment is configured to allow for a variation of a distance between at least two blocks of spring-loaded pins.

Abstract: A printed circuit board has first terminals for contacting terminals of a socket, second terminals for contacting terminals of a test fixture of an automatic test equipment, which are adapted for contacting the terminals of the socket of a device under test, transmission lines for connecting the first terminals and the terminals, and an extracting circuit electrically coupled to one of the transmission lines and configured to extract the signal being exchanged between the device under test and the automatic test equipment. The extracting circuit has a resistor or an electrical resistor network, wherein a loss added on the signal being exchanged between the device under test and the automatic test equipment over the one transmission line due to the presence of the printed circuit board is smaller than 6 dB.

Abstract: Embodiments of the invention relate to an apparatus and a method for testing a plurality of devices under test. The apparatus for testing a plurality of devices under test comprises a common device output line and a driver unit configured to provide a stimulus to the DUTs. The driver unit is configured such that the stimulus reaches different DUTs at different times, thereby creating stimuli time shifts at the DUTs. The apparatus further comprises a receiver unit electrically coupled to the common device output line and a plurality of DUTs connections, electrically coupled to the common device output line, so that DUT terminals of the plurality of DUTs are electrically coupleable via the common device output line to the receiver unit.

Abstract: A printed circuit board has first terminals for contacting terminals of a socket, second terminals for contacting terminals of a test fixture of an automatic test equipment, which are adapted for contacting the terminals of the socket of a device under test, transmission lines for connecting the first terminals and the terminals, and an extracting circuit electrically coupled to one of the transmission lines and configured to extract the signal being exchanged between the device under test and the automatic test equipment. The extracting circuit has a resistor or an electrical resistor network, wherein a loss added on the signal being exchanged between the device under test and the automatic test equipment over the one transmission line due to the presence of the printed circuit board is smaller than 6 dB.

Abstract: Embodiments of the invention relate to an apparatus and a method for testing a plurality of devices under test. The apparatus for testing a plurality of devices under test comprises a common device output line and a driver unit configured to provide a stimulus to the DUTs. The driver unit is configured such that the stimulus reaches different DUTs at different times, thereby creating stimuli time shifts at the DUTs. The apparatus further comprises a receiver unit electrically coupled to the common device output line and a plurality of DUTs connections, electrically coupled to the common device output line, so that DUT terminals of the plurality of DUTs are electrically coupleable via the common device output line to the receiver unit.

Abstract: A coupling unit is adapted to be coupled between a first and a second unit to be tested. Said coupling unit comprises a first signal path that is adapted to provide a signal connection between at least one terminal of the first unit to be tested and at least one terminal of the second unit to be tested. The first signal path comprises a signal conditioning facility adapted for receiving a first signal from the first unit to be tested, for conditioning said first signal in accordance with predefined parameters, and for providing the conditioned first signal to the second unit to be tested.

Abstract: A coupling unit is adapted to be coupled between a first and a second unit to be tested. Said coupling unit comprises a first signal path that is adapted to provide a signal connection between at least one terminal of the first unit to be tested and at least one terminal of the second unit to be tested. The first signal path comprises a signal conditioning facility adapted for receiving a first signal from the first unit to be tested, for conditioning said first signal in accordance with predefined parameters, and for providing the conditioned first signal to the second unit to be tested.

Abstract: A connector for connecting electric cables, in particular in automatic test equipment, includes a housing provided with a cable contact side having a plurality of cable receptions each adapted for electrically connecting to an electrical cable, a pin contact side having a plurality of pin contact zones each adapted for electrically contacting to a spring loaded contact pin, and a plurality of jackets surrounding each a signal conductor electrically insulated from the jacket, where each signal conductor electrically connects one of the pin contact zones to one of the electrical cables.

Abstract: A connector for connecting electric cables, in particular in automatic test equipment, includes a housing provided with a cable contact side having a plurality of cable receptions each adapted for electrically connecting to an electrical cable, a pin contact side having a plurality of pin contact zones each adapted for electrically contacting to a spring loaded contact pin, and a plurality of jackets surrounding each a signal conductor electrically insulated from the jacket, where each signal conductor electrically connects one of the pin contact zones to one of the electrical cables.

Abstract: A coupling unit is adapted to be coupled between a first and a second unit to be tested. Said coupling unit comprises a first signal path that is adapted to provide a signal connection between at least one terminal of the first unit to be tested and at least one terminal of the second unit to be tested. The first signal path comprises a signal conditioning facility adapted for receiving a first signal from the first unit to be tested, for conditioning said first signal in accordance with predefined parameters, and for providing the conditioned first signal to the second unit to be tested.