Patents by Inventor Marc NEUHOFF

Marc NEUHOFF has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for monitoring and/or calibrating a device designed for the three-dimensional X-ray optical inspection of seedlings in different growth phases
    Patent number: 12203878
    Abstract: A method for monitoring and/or calibrating a device designed for three-dimensional X-ray optical inspection of seedlings in different growth phases may optically or X-ray optically measure natural seedlings in three dimensions at predetermined times during their growth phase. The method may create a control program for a device which is designed for the three-dimensional printing of artificial seedlings as reference samples which are replicas of the natural seedlings in each case using the recorded measured values. The method may also produce artificial seedlings with a plastic using the device in accordance with the created control program. The artificial seedlings thus produced may be measured three-dimensionally by X-ray optics and the measured values thus acquired may be recorded in a control chart or an already created control chart is adapted, with which control chart monitoring and/or calibration of the device designed for the three-dimensional X-ray optical inspection of seedlings is performed.
    Type: Grant
    Filed: July 21, 2022
    Date of Patent: January 21, 2025
    Assignees: Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung e.V., Strube D&S GmbH
    Inventors: Felix Porsch, Antje Wolff, Andreas Gelz, Yvonne Götz, Marc Neuhoff
  • METHOD FOR MONITORING AND/OR CALIBRATING A DEVICE DESIGNED FOR THE THREE-DIMENSIONAL X-RAY OPTICAL INSPECTION OF SEEDLINGS IN DIFFERENT GROWTH PHASES
    Publication number: 20230023519
    Abstract: A method for monitoring and/or calibrating a device designed for three-dimensional X-ray optical inspection of seedlings in different growth phases may optically or X-ray optically measure natural seedlings in three dimensions at predetermined times during their growth phase. The method may create a control program for a device which is designed for the three-dimensional printing of artificial seedlings as reference samples which are replicas of the natural seedlings in each case using the recorded measured values. The method may also produce artificial seedlings with a plastic using the device in accordance with the created control program. The artificial seedlings thus produced may be measured three-dimensionally by X-ray optics and the measured values thus acquired may be recorded in a control chart or an already created control chart is adapted, with which control chart monitoring and/or calibration of the device designed for the three-dimensional X-ray optical inspection of seedlings is performed.
    Type: Application
    Filed: July 21, 2022
    Publication date: January 26, 2023
    Inventors: Felix PORSCH, Antje WOLFF, Andreas GELZ, Yvonne GÖTZ, Marc NEUHOFF