Abstract: This application is directed to communicating vehicle data via a vehicle data feed server that is communicatively coupled to a plurality of vehicles. A plurality of credentials and associated access levels are stored in a database of the vehicle data feed server. The vehicle data feed server receives a plurality of real-time vehicle data flows from the vehicles. These real-time vehicle data flows are optionally associated with the credentials based on the associated access levels. Upon receiving from a user of a client device a user credential and a vehicle data request, the vehicle data feed server determines whether the user is authorized to access vehicle data that is associated with the user credential and includes a subset of the real-time vehicle data flows. The subset of the real-time vehicle data flows is forwarded to the client device when the user is authorized to access the vehicle data.

Abstract: The systems determine the parasitic capacitance of a signal path. That parasitic capacitance is then used to determine a leakage characteristic of the signal path, such as leakage current or leakage resistance. The capability of ATE channels to force current accurately, and to measure time intervals at prescribed voltages, can be used to multiply the accuracy of the force current function. Using these resources, small leakage currents—for example, on the order of 10 nA or less—can be measured.

Abstract: An example method measures a leakage characteristic of a signal path. The example method includes forcing a current onto the signal path; determining a parasitic capacitance of the signal path based on a rate of change of a voltage on the signal path resulting from the current; forcing a voltage onto the signal path for a period of time; and following the period of time, determining the leakage characteristic based on the parasitic capacitance and a rate of change in voltage on the signal path from the forced voltage.

Abstract: Example automatic test equipment (ATE) includes: a per-pin measurement unit (PPMU); logic configured to execute a state machine to control the PPMU; memory that is part of, or separate from, the logic; and a control system to command the logic; where, in response to a command from the control system, the state machine is configured to obtain, at a known interval or ATE event, data that is based on an output of a measurement by the PPMU and to store the data in the memory, or to output data to the PPMU from the memory at a known interval or synchronous to an event.

Abstract: An example process for determining electrical path lengths includes: injecting current into a transmission line having a known capacitance per unit of length; determining a rate of change in voltage on the transmission line in response to the current; determining a capacitance of the transmission line based on the change in voltage; and determining an electrical path length of the transmission line based on the determined capacitance of the transmission line and the known capacitance per unit of length.

Abstract: An example process for determining electrical path lengths includes: injecting current into a transmission line having a known capacitance per unit of length; determining a rate of change in voltage on the transmission line in response to the current; determining a capacitance of the transmission line based on the change in voltage; and determining an electrical path length of the transmission line based on the determined capacitance of the transmission line and the known capacitance per unit of length.

Abstract: Example automatic test equipment (ATE) includes: a per-pin measurement unit (PPMU); logic configured to execute a state machine to control the PPMU; memory that is part of, or separate from, the logic; and a control system to command the logic; where, in response to a command from the control system, the state machine is configured to obtain, at a known interval or ATE event, data that is based on an output of a measurement by the PPMU and to store the data in the memory, or to output data to the PPMU from the memory at a known interval or synchronous to an event.

Abstract: A system for measuring the time interval of a signal. The second signal has a frequency higher than a frequency of the first signal. According to one embodiment, the system includes an electronic circuit for determining an approximation of the time based on a period of the second signal and for determining an adjustment to the approximation based on the second signal and a third signal corresponding to the second signal and aligned with the first signal. The length of the adjustment is less than the period of the second signal.

Abstract: A system for measuring a time between a first periodic signal and a second periodic signal. The second signal has a frequency higher than a frequency of the first signal. According to one embodiment, the system includes an electronic circuit for determining an approximation of the time based on a period of the second signal and for determining an adjustment to the approximation based on the second signal and a third signal corresponding to the second signal and aligned with the first signal. The length of the adjustment is less than the period of the second signal.